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The TE250 Laboratory Ring Pulverizer is the most rugged system of its type. It is used to pulverize a variety of samples to analytical fineness, suitable for analysis by XRF, XRD or optical emission.
A full 1HP motor with direct drive counter weight is used to provide capability for continuous grinding, 24 hours a day, 7 days a week. A simple "scissors" type clamping mechanism is used for reliable, safe operation, grind after grind. Many container types are available in sizes ranging from 10cc sample size up to 250cc sample size.
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SPECTRO MIDEX is a Benchtop XRF system that provides quick, non-destructive determination of the elemental composition for Jewelry and Dental alloys. The analyzer is also well suited for forensic science applications. It uses state-of-the-art XRF technology and proprietary beam collimation techniques to ensure the easiest, most accurate measurement results possible within a typical 2-3-minute response time.
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On-line XRF Conveyor Analyzer Con-X
APPLICATION
On-line XRF conveyor analyzer Con-X is used to identify and measure the concentration of the elements and minerals in ores and materials on a conveyor belt.
The analyzer detects elements from Al (Z=13) to U (Z=92)
FEATURES
- On-line non-destructive analysis of material composition directly above a conveyor belt,
- High precision and stability of the results in a severe environment: dust, low/high temperature and humidity,
- Atomic constant library and software for concentration calculation by the combination of the methods of fundamental parameters and empirical coefficients,
- Independence of the measurement results from lump size, relative humidity and distance in the allowable range (6-25 cm),
- Few modifications for light and heavy element analysis,
- Simple and convenient operation and service,
- Empty belt exclusion algorithm.
FAST PAY-BACK
- Economy of raw material,
- Recycling of used material,
- Time economy due to the express analysis.
For additional information, please contact us: XRF@bruker-baltic.lv
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APPLICATION
Coating Thickness Analyzer is a tool for precise and accurate XRF measurement of various metallic and non-metallic coatings thickness (anticorrosive, insulating, antioxidizing, waterproof, pipe coating, etc.). Base/coating components are elements from Mg to U. System is applicable for control and monitoring of industrial processes.
FEATURES
- Automatic choice of coating thickness evaluation method for optimization of relative error of measurements,
- Remote control of analyzer electronics and software by ETHERNET interface from Workstation Device and communications with OPC server,
very simple and convenient operation and service,
- Possibility to install the measurement block under and above the measured material,
- built-in industrial computer.
For additional information, please contact us: XRF@bruker-baltic.lv
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Advantages :
This patented design for the automatic mill and press brings new possibilities to the field of automatic pressed pellet sample preparation.
It still has the traditional advantages over manual preparation namely: improved repeatability, higher frequency, better working environment (less dust and noise), less risk of sample cross contamination, better work conditions for the laboratory staff (no need to carry, empty and clean heavy grinding vessels).
Technological innovations : higher grinding efficiency, shorter grinding times, higher fineness (100% < 20 microns), better cleaning of the bowl, complete boric acid sample encapsulation (resistance without the necessity of having a steel ring and a binding agent).
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Solid, high-quality pellets are an important precondition for reliable and meaningful XRF analysis. With the PP 40, RETSCH offers a pellet press which presses a wide range of materials such as slag, ores, minerals and cement to strong pellets with a smooth surface.
The PP 40 features an individual pressure force regulation in the range of 50 to 400 kN. Besides controlling the pressure force, it also determines build-up, maintenance and release of force during pressing. This reduces the inner tensions of the sample and ensures that even difficult materials are pressed perfectly.
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There are many reasons why the Tracer family has become the preferred instrument for leading conservation scientists around the world. It combines the power and flexibility you would expect from a bench-top instrument with the convenience of a handheld – thanks to some pioneering, user-oriented innovations. These include the same vacuum technology that we originally developed in partnership with NASA for the space shuttle program. The instrument also comes with powerful laptop-based analytical software, live-time spectral display, and customizable filters and secondary targets, designed to optimize your analysis no matter what the application.
The benefits at a glance
- The capabilities of a bench-top instrument, with the convenience of a handheld
- Powerful laptop-based analytical software
- Customizable filters and secondary targets to optimize analysis
- Live-time spectral display
- Vacuum technology developed in partnership with NASA for the space shuttle program
- Standard package includes 360o tripod
- Proprietary X-FLASH® SDD technology (Tracer III-SD and IV-SD only)
- Unmatched training and support
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Years of development and attention to customer needs have made Thermo Scientific Niton alloy analyzers the first choice in XRF technology, bringing lab-quality elemental analysis wherever it is needed in a field-hardened package. Now, in addition to superior positive grade identification and composition analysis of alloy/metal coatings and substrates, the Niton® XL3t offers the benefit of our coating thickness/coating weight measurement technology - providing an "out-of-the-box" nondestructive solution for gauging the effectiveness of coating and plating systems.
Fast and easy-to-use, the Niton XL3t 800 not only performs at line and plating bath solution analysis, but provides more accurate measurements than non-XRF technologies such as eddy current, magnetic induction, and Beta backscatter. You get precise, nondestructive multilayer coating thickness results in seconds. Testing at the plating line both increases productivity and improves process efficiency - no more over-coating or under-coating. What's more, the Niton XL3t is your answer to measuring large or irregularly shaped samples, as well as small-diameter wiring or tubing. Cutting samples for benchtop analysis are a thing of the past.
Typical applications are:
-Galvanized zinc over steel
-Zinc or zinc alloy over steel
-Hard chrome over steel
-Electroless nickel over steel
-Chrome/nickel/copper over steel, Zamak™ or plastic
-DACROMET™ coating over steel
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Technology you can trust – at a price you can afford
In the business-critical area of handheld XRF technology, Bruker aims not only to be the best, but also to deliver the best value. Our S1 SORTER is the ideal solution for businesses looking to compete in tough economic times. It delivers performance equal to any system using a SiPIN detector, but at around 30% less than equivalents on the market.
A tough performer
The S1 SORTER hides state-of-the-art technology beneath a very tough shell. The standard calibration covers steel, nickel, cobalt and copper alloys while the optional FP calibration will analyze most exotic alloys and precious metal samples. The S1 SORTER is designed to be used out in the field, in temperatures ranging from -10C to +50C. The splash-proof case is made of industrial-strength plastic, and the holster means you can keep your hands free while working anywhere in the warehouse or yard.
Clarity and usability
We believe the best technology should be intuitive and instinctive to use. Every element of the S1 SORTER has been designed with this in mind. The bright display makes it easy to read in any lighting conditions. The touch screen means you can operate the whole machine with one finger, whether inputting a password or pulling the trigger. The operating system is Microsoft Windows – so well known that it’s almost universal. Data transfer options include Microsoft ActivSync via USB cable or wireless Bluetooth connection, as well as using an SD card. Built-in memory also makes it possible to store thousands of spectra and millions of results safely.
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The Thermo Scientific Niton XL2 x-ray fluorescence (XRF) analyzer is purpose-built for your most demanding needs. When speed, accuracy, and reliability count, our superior combination of hardware, software, and direct industry experience helps meet your specific analytical requirements. With the mid-range Niton XL2, you don't sacrifice performance to get a lighweight, rugged handheld XRF analyzer perfectly matched for most testing applications. It's the value choice for tighter test equipment budgets.
Niton XL2 XRF analyzers provide you with many distinct advantages:
-Very easy to use – even by non-technical personnel
-Rugged design for real-world industrial applications
-Truly nondestructive test
-From turn on to trigger pull to results in seconds
-Confident analysis with technology from the industry leader
Over 20,000 Thermo Scientific Niton XRF analyzers can be found at work in more than 75 countries on 6 continents.
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ARL OPTIM'X XRF spectrometer
Flexibility, simplicity, reliability, and accuracy are traits of the ARL OPTIM'X: compact, optimized for specific applications, its features are:
* Unique WDXRF platform with sequential and/or simultaneous capabilities
* Fast analysis of solids, liquids and loose powders with superior spectral resolution
* Wider XRF elemental coverage thanks to the instrument's innovative goniometer - the SmartGonio™ - which can now be configured to cover all elements from fluorine (F) to uranium (U) in sequential mode
* No water cooling or gas supply (depending on configuration) required
* Closely coupled optics for increased intensity (50% higher than conventional geometry)
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Feature:
WDX200 is a Wave Length Dispersive X-Ray Fluorescence Spectrometer widely used in Cement, Steel, and Mine production Quality control. It is optional for testing 10 elements from Na-U, it is said a Cement testing tool since the excellent performance for light elements as Na, Al, K, Ca, Mg, Fe, Si, P.
Specification:
The highest vacuum: < 5 Pa.
Stability: ¡¾ 0.003 KPa
Voltage & tube current stability: better than 0.05 % in12-hour
Measurable elements: 10 arbitrary elements from Na to U.
AC110/220V power supply: 1KVA AC purified stabilized voltage power supply
Analysis accuracy: (24 hours, per cent) ¡Â0.05 £¥.
Test time of single sample: ¡Â3 £ 5 minutes £¨including the time of changing the sample and pumping the vacuum£©
Temperature control accuracy of constant temperature chamber: setting value ¡¾0.1¨¬C.
Configuration
X-ray tube: 200W thin Be end window X-ray tube made by Varian company. Rh anode (optional). 400W(optional).
High voltage supply: 200W (50KV4mA)
Detector: gas proportional detector plus sealed proportional detector; 10 paths of 1024-channel independent pulse height analyzer
Vacuum system: independent pumping station is easy for maintenance.
Analysis software:
Empirical coefficient and theoretical a-coefficient method
TCP / IP protocol (Socket based S/ C) and OPC protocol (OPC server) enable data sharing with DCS or QCS system. RS-232 serial communication protocol
All-spectrum detection technique, all-round self-diagnosis measures
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The S4 PIONEER - the most compact wavelength dispersive X-ray fluorescence spectrometer (WDXRF) is dedicated to serve all applications with need for high performance and high sample throughput: Whenever reliable trace analysis, high analyzing speed for accurate process control or robustness for industrial use is demanded - the S4 PIONEER is the right choice for industry as well as for research and development.
Accuracy and Precision: The S4 PIONEER with advanced excitation technology provides highest sensitivity esp. for light elements and traces due to optimized beam geometry. Improved analytical performance for light elements is guaranteed with the very thin Beryllium tube window in combination with optimized excitation parameters. Up to 10 primary beam filters, up to 4 collimators, up to 8 crystals, there is no limitation in analytical flexibility; there is no compromise in analytical performance: Real high end wavelength dispersive X-ray fluorescence spectrometry (WDXRF).
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X-ray fluorescence spectrometers, XRF analysers
