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FISCHERSCOPE X-RAY XDLM and XDAL series
The XDLM spectrometers with micro focus tube and proportional counter tube are ideally suited for the inspection of parts where small structures are measured. Typical applications are measurements on pc-boards, plug contacts and electronic components. XDLM spectrometers are equipped with four exchangeable apertures and a programmable XY(Z) measuring stage. This makes them ideally suited for testing mass-produced parts.
The XDAL spectrometers with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentration and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
The XDAL and XDLM spectrometers have an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things.
Using the FISCHER fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free.
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FISCHERSCOPE X-RAY XUL series
The models of the XUL series are compact x-ray fluorescence spectrometers for coating thickness measurements and material analyses. They are well suited for the electroplating industries to measure small parts with different shapes, such as screws, bolts or nuts, for contacts and other electronic components. Also the metal content of electroplating baths can be analyzed quickly and easily.
The XULM model with its micro focus x-ray tube is designed for measurements on very small parts, plug contacts and wires. It is particularly well suited for the jewelry and watch industries but also for manual measurements on pc-boards.
The x-ray source and the detector are located underneath the measurement chamber. This allows for simple and precise positioning of the specimens. An integrated high-resolution video camera supports the precise positioning.
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The FISCHERSCOPE®-X-RAY XDV®-SDD is a universally applicable energy dispersive x-ray spectrometer. It is particularly well suited for the non-destructive analysis of very thin coatings, for small concentrations trace analysis and for automated measurements.
Typical areas of application are:
- Analysis of thin or very thin coatings,e.g., gold/palladium coatings of ≤0.1 μm
- Trace analysis on pc boards according to RoHS and WEEE requirements
- Gold and precious metals analysis
- Measurement of functional coatings in the electronics and semiconductor industries
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the XDV-SDD features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high analysis accuracy and good detection sensitivity. Due to large apertures (collimators) and a very fast pulse processor, it is ideally suited for capturing high count rates.
The XDV-SDD x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously.
With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
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Oxford Instruments’ launches a powerful, new, easy-to-use EDXRF spectrometer – designed for operation by anyone!
The innovative, high performance X-Supreme8000, is a compact, energy-dispersive
X-ray fluorescence (EDXRF) spectrometer for quality assurance and process control requirements across a diverse range of industries.
Customized applications include:
• Minerals and mining
• Petrochemicals – fuels/lubricating oils
• Wood pressure treatments
• Cement
• Food and cosmetics
• Plastics and polymers
• Education
Meeting the ever increasing requirement for minimal or no sample preparation and unattended operation, the highly flexible X-Supreme8000, with its unique Oxford Instruments’ Silicon Drift Detector (SDD) and powerful X-ray tube technologies, can perform multi-element analysis on a wide range of sample types. These include: solids, liquids, powders, pastes and films at concentrations from high percentage down to ppm levels of detection, covering elements Na11 to U92 in the periodic table.
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The SPECTRO XEPOS can be delivered with pre-installed application packages. The application packages are a combination of hardware and analytical methods; installed in the factory and individually tuned.
The range of applications includes, among others: The analysis of waste, soils, sewage sludge, additives in oil, cement, slag, refractories and electronic components and parts in compliance with RoHS, making the SPECTRO XEPOS a true multi-talent.
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The sensitivity, precision and speed of an analytical instrument are of particular importance for industrial process control applications. The SPECTRO iQ already set standards in this respect. The new SPECTRO iQ II maintains this course with further improved technologies and a consequent alignment towards simplicity and dependability of operation.
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Analysis using X-rays
Energy Dispersive X-ray fluorescence spectrometer (EDX) is the instrument to perform qualitative and quantitative element analysis in the range from 6C/11Na to 92U and is the ideal tools for non-destructive applications. EDX is used in many different applications areas in the chemical, electronic and food industries as well as refineries. It can be used with solid, powder and liquid samples. This is achieved by applying X-ray to the sample and then analysing the re-emitted element characteristic fluorescent X-ray. Security functions effectively prevent exposure to X-rays at all times.
Easy handling and improved detection limits
With a simple push of a button, elements ranging from sodium to uranium can be analysed quickly and easily. In addition, the software enables measuring conditions to be adapted to the sample characteristic. For precise analysis of lighter elements the systems can be operated optionally under vacuum or under a helium atmosphere. The built-in five-filter assembly (zirconium, aluminium, titanium, nickel and molybdenum) effectively reduces interferences and increases the signal quality. This way, the limits are markedly improved for detection of e.g. lead, cadmium, chlorine or chromium.
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Features:
EDX 2800 is specially designed for RoHS substance detection (Cd, Pb, Cr, Hg, Br) and full elements analysis, jewelry analysis and plating thickness measurement.
Specifications:
Content ration range: 0.01%---99.99%
Measurement time: 60---300 seconds
Accuracy: 1ppm for RoHS directive test. (for samples whose contents are more than 96%)
Energy revolution: 165+-5eV
Measurement substance: solid, powder and liquid
Test Range: 75 elements from sulfur to uranium
Detect source: Electro-refrigeration SI-PIN semiconductor detector
Power supply: AC 110/220V+-5V
Relative humidity: ¡Ü 70£¥
Weight: 130lb
Configuration:
Single sample chamber: 24*16*4In
Signal-to-Noise Enhancer (SNE) provides powerful assurance for measurement accuracy
Electro-refrigeration SI-PIN semiconductor detector is more convenient than liquid nitrogen refrigeration.
Switch collimators and filters automatically for different samples
High voltage power supply: Tube voltage (Max): 50kV; Tube current (Max): 1mA
X-ray tube: Tungsten target material
X-ray Optical System: Bottom Optical system
CCD Camera: 1.4 million pixels CCD camera
Applicable software: RoHS analysis software
(applicable to Windows 2000 and Windows XP operation systems)
Collimator: ¦µ8, ¦µ6, ¦µ4, ¦µ3, ¦µ2, ¦µ1, ¦µ0.5, ¦µ0.1mm
Safety
The instrument has double shield covers and the outer cover has lead sheet which can prevent Xray from leaking
The shield cover of the instrument has interlocks with high voltage of X-tube. When the cover is open, the X-ray tube is shut down automatically to prevent X ray from leaking.
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Features:
EDX 600 is specially designed for Jewelry analysis, such as Au Ag Cu. It can also measure plating thickness.
Specifications:
Content ration range: 0.1%---99.99%
Measurement time: 60---300 seconds
Accuracy: 0.1% ( for samples whose contents are more than 96%)
Precision of plating thickness: 10-50nm
Measurement substance: solid, powder and liquid
Metals Range: Au Ag Cu
Weight: 70lb
Detect source: proportional counter
Power: 50W
Relative humidity: ¡Ü70£¥
Configurations:
Single sample chamber: 12X12X8In
Adopt closed proportional counter as detector
Preamplifier and main amplifier circuits
High voltage power supply: Tube voltage (Max): 50kV; Tube current (Max): 1mA
X-ray tube: Tungsten target material
X-ray Optical System: Bottom Optical system
CCD Camera: 1.4 million pixels CCD camera
Applicable software: Precious metal analysis software
Collimator: ¦µ3mm
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Features:
EDX 3600B is the most powerful EDX XRF for testing precious metals such as precious metal (Au, Ag Pt, Pd, etc), steel, alloy, mining and cement analysis, and also for plating thickness analysis and full element analysis and RoHS testing.
Specification:
Metals Range: from sodium (Na) to Uranium (U)
Content ration range: 0.1%---99.99%
Accuracy: 0.05% (for samples whose contents are more than 96%)
Rohs testing: can reach 1ppm for harzardous substances (Cd/ Pb/ Cr/ Hg/ Br/) restricted in RoHS directive.
Plating thickness measurement: plating thickness can be as thin as 10nm and multi-layer can be of more than 5 layers.
Precision of plating thickness: 10nm
Measurement substance: solid, powder and liquid
Measurement time: 60---300 seconds
Detect source: X-ray tube
Working voltage: AC 110/ 220 V
Voltage generator: 5-50 kV
Tube current: (50-1000) µA
Relative humidity: ≤70％
Power: 200W
Configuration:
3-D super-large sample chamber: 160X160mmX180mm
Amplifier circuits
Si PIN semiconductor detector
X-ray tube: Tungsten target material
High and low voltage power supplies
Automatic filter switching system
Automatic collimator switching system
Triple safety protection mode
Arbitrary optional analysis and identification models
CCD Camera: 1.4 million pixels CCD camera
Unique light path enhancement system
Applicable software: Precious metal analysis software, full element analysis software and plating thickness software, RoHS software.
Collimator:Φ8, 6, 4, 3, 2, 1, 0.5, 0.1(mm)
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S2 PICOFOX - The world's most compact TXRF analyzer
S2 PICOFOX TXRF spectrometer
S2 PICOFOX is the world's first and only portable benchtop instrument for fast quantitative and semi-quantitative multi-element microanalysis of liquids, solids, and contaminations using the principle of total reflection X-ray fluorescence spectroscopy.
Reaching detection limits in the ppb and ppm range the S2 PICOFOX is optimally suited for trace element analysis. The advantages are evident in case of small sample amounts, liquid samples with high matrix content and frequently changing sample types.
Due to its complete independence of any cooling medium, the analyzer can be used not only in the laboratory but also for on-site analyses in the field.
For many applications the S2 PICOFOX will be an important enhancement to an existing AAS or ICP-OES system.
Advantages:
- Simultaneous multi-element trace analysis incl. halogenides
- Analysis of smallest sample amounts in the nanogram or microgram range
- Simple quantification using an internal standard
- Suitable for various sample types and applications
- Portable system for fast in-field analyses
- No matrix or memory effects
- Low operating cost
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With the unique X-ray Guide Tube the bench top XGT-5000 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution – from 1.2 mm down to 10 µm. There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure. Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.
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Liquid nitrogen free energy dispersive X-ray fluorescence spectrometer :
- For RoHS compliance screening
- High resolution liquid nitrogen free Si (Li) semiconductor detector
- For regular X-ray fluorescence analysis of metals, rocks, soil, food, and plating thickness
- Speedy high sensitivity analysis
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In-line analysis for the photovoltaic industry
The FISCHERSCOPE® X-RAY Conti 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. They fulfill DIN ISO 3497 and ASTM B 568.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The Conti 5000 series measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The Conti 5000 series measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
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XAN spectrometers for Gold, jewelry and precious metals analysis
The new FISCHERSCOPE X-RAY spectrometers from the proven XAN series are best suited for the gold- and jewelry industry as well as for pawn shops and precious metals recycling. They are optimized for fast, non-destructive analysis of jewelry, precious metals in general, yellow and white gold, platinum and silver, rhodium, coins and all jewelry alloys and coatings.
Measured results are displayed in karat, per mill or weight-%, and easily printed out as customized reports.
They are accurate, safe and easy to use, robust and maintenance free. In addition, they meet the requirements of DIN ISO 3497 and ASTM B 568.
Long-term stability and outstanding precision – better than 1‰ for gold – are benefits of these instruments. In addition, the necessity for re-calibration is significantly reduced thus saving time, effort and cost of ownership.
Excellent ergonomics, easy operation and fast calculation of the measurement best describe the XAN spectrometers. Usage is safe and easy – for experienced staff as well as for employees with little training. There is no need for a special laboratory room.
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Lab-X3500 is a compact, reliable, affordable and easy to use XRF analyser. For those in the Petroleum sector the Lab-X3500 conforms to ASTM D4294, ISO20847, ISO8754 and IP336. In addition Oxford Instruments’ offers the
Lab-X3500S/Cl model using air path thereby avoiding the requirement for helium purge. For wood treatment, liquids and powders are measured with equal ease for Copper Chrome Arsenic (CCA), Copper and many others.
Our customers in the cement, minerals, mining and plastics industries all appreciate and benefit from XRF analysis delivered by such a small, compact package providing 24/7 peace of mind and ease of use by production staff.
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Government regulations, increased public awareness, and legal action have driven the need for lead paint testing. From the world's pioneer in handheld XRF instruments, Thermo Scientific Niton analyzers are still leading the way with unparalleled performance for residential lead paint inspection...fast, easy to use, reliable. Beyond lead paint testing, Niton® analyzers can measure dust wipes, soil samples, and air filters, helping lead professionals meet and exceed public health initiatives. What's more, they address the safe work practices required in many commercial/industrial structures as well as demonstrated proficiency in the ELPAT Program. For measuring lead paint levels, handheld Thermo Scientific Niton XRF analyzers are simply superior.
-Every Niton XRF analyzer contains an environmentally sealed housing for real world use – dust, dirt, and moisture don't impact reliability
-Every Niton XRF analyzer is capable of providing the fastest paint testing results at the highest statistical confidence in the industry.
-Every Niton XRF analyzer offers factory-trained service worldwide in more than 75 countries
-Every Niton XRF analyzer supplies at least 8 hours of battery life, with a free spare — we know your day doesn't always end after 8 hours; your Niton XRF analyzer won't quit either
-Every Niton XRF analyzer offers complete data encryption: your data is never vulnerable to accidental or malicious tampering
-Every Niton XRF analyzer provides fast, secure data downloads, with the spectral fingerprinting that today's juries have come to expect legally defensible data
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With increasing frequency, users are looking to photographically document their sample along with the analytical results, especially when looking to comply with the CPSIA or RoHS guidelines. Handheld Niton® XL3t XRF analyzers feature an optional, integrated CCD camera that helps you accurately position the instrument on a specific location of a sample. Images and analysis data are stored together for easy reference, data management, and data integrity.
When you need to isolate and analyze samples, or areas of a sample smaller than the standard 8 mm diameter x-ray spot size, the Niton XL3t offers you an optional small-spot capability. With a couple of taps on the integrated, color touch-screen display, you can select a 3 mm diameter spot size, complete with a bull's-eye superimposed on the image.
-Always immediately available
-Never lost
Together, this first ever integrated CCD camera and small-spot sample area imaging system mean benefits to you:
-Simple isolation and analysis of small parts or areas
-Ideal for positioning, analyzing, and documenting results
-Image and analysis data stored together for easy reference, data management, and data integrity
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S1 TURBO SD
So what makes the S1 TURBOSD such an important innovation in this field? The key is the XFlash® Silicon Drift Detector, which offers count rates and resolution far superior to traditional SiPIN detector technology. This makes for even faster analysis – one second for grade identification, two to three seconds for assay. That’s about five times faster than previous generations.
Not only that, but the improved resolution and count rate means lower detection limits for all elements analyzed. Combine that with an extensive grade library and you have one of the most powerful handheld analyzers currently available on the market.
The benefits at a glance
- The first ever SDD-based handheld analyzer
- Superior count rates and resolution
- Five times faster than previous generations
- Lower detection limits
- Grade library covers low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
- Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only)
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Oxford Instruments has launched the new robust X-ray Fluorescence (XRF) analyzer The New X-MET5000, for highly accurate and reliable elemental analysis.
Engineered for high performance and reliability, this brand new analyzer combines Oxford Instruments’ patented PentaFET® detector technology offering guaranteed fast analysis and lower detection limits for all elements of interest.
Purpose-built for the most demanding quality control applications: scrap metal recycling, analysis of metals for PMI, screening for lead in toys and consumer products for RoHS compliance testing. The X-MET5000 also serves the needs of the mining community for ore exploration, as well as the measurement of heavy metals in soils for environmental monitoring.
The X-MET5000’s major strength is the Light Element Treatment (LET) mode, enabling fast and accurate analysis of heavy elements, even when the sample contains light elements like Aluminum and Silicon. This has not previously been possible when using only fundamental parameter calibrations.
This rugged and reliable tool is IP54 (NEMA 3) approved for superior dust and splash protection. The X-MET5000 is perfect for the harshest environments. The battery’s operating time of one working day enables extended productivity.
The powerful user programmable software delivers highly accurate results for reliable Go/No-Go decisions. The X-MET5000 will identify material type and automatically choose the best analysis method.
An optional bench-top stand enables hands-free operation for multi-tasking without the loss in confidence in measurement results.
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SPECTRO xSORT handheld XRF spectrometer is a light (1.7 Kg, 3.7 lbs.) and super-fast metal analyzer measures all of the elements, non-destructively, in a metal alloy The SPECTRO xSORT has been designed for the metal processing, recycling, precious metals recycling as well as the petro-chemical industries, where regular control of pipelines and plant infrastructure is a must.
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Volatile base metal prices, combined with globalized trade in scrap metal, alloy stock, and finished products have increased the costs of alloy mix-ups to suppliers, distributors, and industrial consumers. Now available with groundbreaking GOLDD technology, the Thermo Scientific Niton XL3t Series x-ray fluorescence (XRF) alloy analyzers, meets your demand for faster, more accurate results.
When it comes to metal analysis/alloy analysis, you can choose from a range of configurations of our Niton® XRF alloy analyzers as well as an assortment of optional features and accessories to match any of your analytical needs:
-Scrap metal recycling/scrap metal sorting
-Quality assurance/quality control
-Positive material identification
-Flow accelerated corrosion
-Coating thickness measurement
-Other metal analysis applications
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Specifications:
Model: EDX-Pocket Series Handheld X-ray Fluorescence Spectrometer
Detector: 13mm2 electric-cooling Si-PIN detector
Excitation source: 40KV/50uA-Ag anode end window integrated mini X-ray tube
Measurement time: 10-200s (handheld or sitting)
Forms of objects: solid, liquid or powder
Measurable elements: S-U
Ability of simultaneous analysis: up to 24 elements
Detection limit: 0.001%～0.01%
Correction mode: Ag plate
Safety: administrator mode with in-built password at which data can be saved at any time
Data storage: stored in computer for printing out. Massive storage card is supplied
Batter rundown time: 4 hours
Weight: 1.47 Kg(with PDA and battery); 1.2 Kg (without PDA and battery)
Ambient temperature: －10℃－＋50℃
Ambient humidity: up to and including 90%
Configuration:
PDA Si-PIN semiconductor detector
Amplifier circuit
X-ray tube and high and low power supplies
Professional minerals analyzing software in PDA version
Support to Handheld Spectrometer(optional)
Backup battery and adapter (AC and DC)
Sample cup and manual press
Protective case
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X-MET5100 – Light Years Ahead!
Oxford Instruments launches a revolutionary hand-held XRF analyzer with Silicon Drift Detector
The new X-MET5100 X-ray fluorescence (XRF) analyzer takes hand-held analytical performance to a completely new level.
X-MET5100 combines Oxford Instruments’ groundbreaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This cutting edge technology delivers fast, highly accurate measurement and enables light elements such as Mg, Al and Si to be measured without the need for complex vacuum pump or helium tank attachments - a truly huge step forward for hand-held X-ray fluorescence analysis.
PMI inspectors, scrap sorters and in particular the aerospace industry finally have the robust, XRF Light Element mobile testing tool they have been waiting for. The X-MET5100 assures laboratory quality analysis of Aluminum and Titanium alloys, as well as Copper, Nickel and Steel with Light Element capability and sensitivity that is unequalled.
The powerful combination of the SDD, 45 kV X-ray tube and traceable Empirical Calibration means that X-MET5100 can accurately analyze and identify metal alloys in just 1 second. Restricted elements, lead in toys, contaminants in soil and small concentrations in ores can be accurately measured at speeds previously not possible. Trace element results, down to ppm level, can be achieved in just seconds. The unparalleled speed and accuracy of the X-MET5100 ensure high throughput for real-time results that can be trusted.
X-MET5100 is IP54 (NEMA 3) approved for dust and water splash protection and are built to withstand the harshest analytical conditions.
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The Thermo Scientific Niton XL3 handheld x-ray fluorescence (XRF) analyzer combines purpose-built, proprietary electronics with an ergonomic design and easy to use software, transforming XRF analysis. It is the only handheld XRF analyzer platform to offer you a choice of excitation sources – either a 50 kV miniaturized x-ray tube in the Niton XL3t for the ultimate performance and flexibility, or the patented Infiniton™ in the Niton XL3p which never requires source replacement. From the integrated tilting color touch-screen display to the customizable menus for ease of use, both lightweight Niton XL3 XRF analyzers provide you with heavyweight performance and a set of features engineered to improve your productivity and profitability.
With over 20,000 handheld XRF analyzers installed since 1994, and an active customer base of over 18,000 instruments, learn why most customers in the recycling and mining segments are achieving a return on investment measured in several months, while many report that they've paid for the cost of the instrument in weeks, and some in as little as one day. Similarly, if you're in the petrochemical industry, you can reduce risk through alloy verification, while if you manufacture toys and other child-accessible products you can use them to drive toy screening compliance with global regulations.
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Tracer III-V/III-SDThere are many reasons why the Tracer family has become the preferred instrument for leading conservation scientists around the world. It combines the power and flexibility you would expect from a bench-top instrument with the convenience of a handheld - thanks to some pioneering, user-oriented innovations. These include the same vacuum technology that we originally developed in partnership with NASA for the space shuttle program. The instrument also comes with powerful laptop-based analytical software, live-time spectral display, and customizable filters and secondary targets, designed to optimize your analysis no matter what the application.
These analyzers allow complete user control of the excitation conditions - current, voltage and user selected filter for optimization of measurement conditions for investigation of your objects. The Tracer III-SD incorporates the proprietary X-Flash® Silicon Drift Detector (SDD) which provides high speed data acquisition, better resolution than the traditional SiPIN detector and light element sensitivity. When the Tracer III-SD is operated with the optional vacuum system the ultimate light element sensitivity can be achieved.
In addition to the basic instrument the system is supplied with: 1) powerful lap-top based analytical software which provides live spectral display and complete peak identification; 2) a tripod mount which allows precise three dimensional positioning of the analyzer and 3) unmatched application training and support.
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Volatile base metal prices, combined with globalized trade in scrap metal, alloy stock, and finished products have increased the costs of alloy mix-ups to suppliers, distributors, and industrial consumers. Now available with groundbreaking GOLDD technology, the Thermo Scientific Niton XL3t Series x-ray fluorescence (XRF) alloy analyzers, meets your demand for faster, more accurate results.
When it comes to metal analysis/alloy analysis, you can choose from a range of configurations of our Niton® XRF alloy analyzers as well as an assortment of optional features and accessories to match any of your analytical needs.
Scrap metal recycling/scrap metal sorting
Quality assurance/quality control
Positive material identification
Flow accelerated corrosion
Coating thickness measurement
Other metal analysis applications
Now, in addition to our Niton XL3t 800 alloy analyzer, already known for its superior positive grade identification and alloy analysis, we offer the Niton XL3t 900 GOLDD. It is the definitive tool for your analysis requirements, delivering improvements with:
Light element detection (Mg, Al, Si, P, S) without helium or vacuum purge
Overall sensitivity
Shorter measurement times
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Handheld Thermo Scientific XRF analyzers represent the state-of-the-art in elemental analysis for mining and exploration applications. The ideal tool for the most demanding jobs is the handheld Thermo Scientific XL3t 500 Series XRF analyzer, now available with groundbreaking GOLDD technology. With a standard analytical range from S through U, and optional lower detection limits achievable with the new Niton XL3t 500 GOLDD - plus light element analysis (Mg, Al, Si, P, S) without helium or vacuum purging - you can identify element concentrations at unprecedented low levels. This means you get results even at or below the averages naturally found in the earth's crust, detecting even the most subtle geochemical anomalies.
With remarkable speed and performance, as well as our trademark point-and-shoot simplicity, our Niton XL3t Series analyzers offer improved value to you through better precision and lower detection limits compared to previously available handheld XRF instruments. They are the ideal tools for measuring elemental concentrations in:
Ores
Soils
Sediments, cuttings and cores
Mill heads and tails
Concentrates
Filter media
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Verification and screening for toxic metal in consumer goods are imperative to protect our children from lead poisoning and to reduce the risk associated with distributing lead-containing products.
When it comes to screening toys for lead, or screening other child-accessible products, Thermo Scientific Niton XL3t analyzers, now available with groundbreaking GOLDD technology, are the only handheld x-ray fluorescence (XRF) analyzers that can distinguish between lead on the surface of an object from lead in the substrate. Quick. Accurate. Precise. Niton® XL3t 700 Series XRF analyzers can provide the solution when you need to screen consumer goods for toxic metals…all eight regulated elements in toys designed for children under the age of 12.
Lead (Pb)
Barium (Ba)
Antimony (Sb)
Selenium (Se)
Cadmium (Cd)
Mercury (Hg)
Arsenic (As)
Chromium (Cr)
The Niton analyzer is the same instrument that was chosen and is trusted by the Consumer Product Safety Commission (CPSC) and numerous leading manufacturers and retailers in the consumer goods industry. You benefit in a variety of ways from these remarkable tools:
Multi-use – Toy screening as well as screening fashion jewelry, furniture, and apparel for lead, in compliance with the CPSIA
Handheld – The lead toy test can occur in-situ on the toy, in the factory, product integrity lab, on the dock, or in the warehouse
Fast – Screening takes seconds to minutes, not days. Decision to ship product can happen immediately
Non-invasive – The analyzed product is not defaced or affected in any way
TestAll™ Technology – Automatically selects the correct analytical mode for consumer goods analysis
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As environmental consciousness grows and tools for performing environmental analysis become more popular, requirements for identification and remediation of environmental contamination in residential, commercial, and industrial settings are increasing globally.
-Site characterization and conceptual site modeling
-Risk assessment
-On-site clearance screening
-Soil stabilization
-Remediation quality control
How can you improve project turnaround times while holding sampling and analysis costs under control? Handheld Thermo Scientific Niton XL3t 600 Series x-ray fluorescence (XRF) analyzers, now available with GOLDD technology, are the ideal tools for these demanding jobs.
With a standard analytical range from S through U, and optional lower detection limits achievable with the Niton® XL3t 600 GOLDD - light element analysis (Mg, Al, Si, P, S) without helium or vacuum purging - you can identify elemental concentrations from the most subtle anomalies at unprecedented low levels to high levels of contaminated soil, on-site, in real time. You benefit in a variety of ways from these remarkable instruments:
-Immediate sample results on-site - soil analyses, lead dust wipes, air filter analysis
-Real-time delineation of contamination boundaries
-Legally defensible data
-Overall improvement in jobsite productivity
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X-ray fluorescence spectrometers, XRF analysers
