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Exposure system for large scale glass substrate LE0200SD Hitachi High-Technologies Europe
XY step proximity exposure system for 8th generation A XY step proximity high productivity exposure system designed for 8th generation color filter substrate....
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X-ray inspection machine for circuit boards 130 kV, 10 W | XT V130 Nikon Metrology
XT V 130 electronics X-ray inspection Compact, versatile and easy-to-use electronics QA system With the advent of many newer type of electronic components, surface inspection...
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Patterned wafer macro defect inspection machine AMI-3000 MarkII/3500 Nikon Engineering
AMI-3000 MarkII/3500 series makes both high throughput and exceptional detection sensitivity very achievable. Both models offer improved macro inspection accuracy, as well as greater inspection quantization and clarity, allowing more efficient process management. Nikon's diffracted light detection system detects pattern...
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The phoenix pcba|inspector is a high-resolution 2D microfocus X-ray inspection system designed for inspecting solder joints (e.g....
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JEOL wafer and mask review tools improve yield management with unique capabilities that help rapidly detect minute imperfections...
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Laser diode test system 2520 Keithley Instruments
The Model 2520 Pulsed Laser Diode Test System is an integrated, synchronized system for testing laser diodes early in the manufacturing...
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Workstation for electronic device visual inspection VWS-200 SEIKO Precision Inc.
The vision work station provided with a CCD camera for imaging recognition realizes a flexible low-cost system to be used in the inspection processes for cellular, PDA and various products. ◇ Applications ■ Camera lens module...
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Inspection stereomicroscope for PCBs Lynx VS8 VISION ENGINEERING
Lynx VS8 is an advanced stereo zoom microscope for specialist Printed Circuit Board inspection and is ideal for all electronics applications including fine pitch, surface mount, TAB and BGA technology Lynx VS8 is an advanced stereo zoom microscope for specialist Printed Circuit Board inspection and is ideal for all electronics applications...
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LCD driver test system ST6731 YOKOGAWA Europe
The high-speed technologies used in high-end test systems are implemented in this FPD driver test system.The ST6731 tests LCD drivers for 3DTV and drivers for smart phones with high-speed interfaces to handle increasing arrays of functions, at a reasonable price. Features Equipped with a Newly Developed High-speed Digital Pin Card The ST6731 achieves a data rate of 2.52 Gbps and can generate up to...
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Measuring device for semiconductor industry CORNING
The continued demand for higher-density chips with smaller critical dimensions leads to tighter substrate form tolerances both on the global scale and on the individual die-site scale. Corning Tropel has optimized our patented grazing-incidence interferometry technology for the...
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Laser diode test system 200 - 500 mA, 2 - 4 A | LTS-9110 ILX Lightwave
The LTS-9110 Laser Diode Test System combines the LPA-9080, SPA-9000, a leading edge control computer, and your choice of laser diode fixture and optical power/wavelength measurement head all into one complete package. You choose the instrument: the LPA-9082 for applications requiring up to 500mA laser drive current or the LPA-9084 if you...
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Patterned wafer defect inspection machine 29xx/28xx Series KLA - TENCOR
The 2900 Series broadband defect inspection platform provides significant advancements in optical defect inspection, enabling capture of previously undetectable wafer defects on challenging...
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Prototyping module 96 I/O | 7064M EADS North America Defense Test and Services, Inc.
Message-Based Interface Supports IEEE-488.2 Instrument Protocol Multiple Slot Widths with Local Bus Support 96 Buffered Digital I/O Control Lines On-Board 68000 CPU Bus Directly Accessible to User VXIplug&play Install Disk Included (WIN, Windows 95 or Windows NT) Custom VXIbus Circuit Design Made Easy The 7064M...
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BGA video inspection system MOBILE SCOPE Ersa GmbH
The ERSA mobile scope is a compact and handy, portable video microscope to inspect solder joints in electronic production environments. The device has been designed for optical inspection and digital image recording including measurements of solder joints on Ball Grid Array (BGA), µBGA, CSP and Flip-Chip...
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Wafer inspection machine 2 - 5 mm MICRO-EPSILON
The wafer edge inspection system measures the surface of the wafer with high precision using three image processing cameras. Defects larger than...
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Wafer inspection machine ø 300 mm | Proforma 300 MTI Instruments
Based on MTI Instruments' proprietary capacitance technology, the Proforma 300 can be used on all wafer materials including: * Silicon * Gallium-Arsenide * Indium Phosphide * Germanium ...without recalibrating or electrically grounding the wafer. Fast,...
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Measuring device for semiconductor industry IMS 7fR CAMECA
High Performance SIMS Instrument for the Analysis of Radioactive Samples The IMS 7fR is a shielded magnetic sector SIMS instrument specifically developed for the analysis of highly radioactive materials. Derived from the IMS 7f, it offers all necessary protections against radiation and alpha...
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Printed circuit board assembly inspection machine max. 2 350 mm²/s | VP6000 CKD
Solder Printing Inspection Machine VP6000 This is an in-line type solder printing inspection machine, pursuing High Speed, High Accuracy and Simple Operation. The...
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Wafer inspection machine ScanCheck I+ LPKF Laser & Electronics
The LPKF ScanCheck I+ Stencil Inspection System compares solder paste stencils manufactured by any method with the CAM data. The stencil supplier...
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Printed circuit board assembly inspection machine HawkEye® DEK Printing Machines Ltd
HawkEye is an automatic print verification technology that operates at the line beat rate. The system can be configured to assess 100% of printed boards and gives...
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Automated solar cell test machine Spi-Cell Sorter™ Spire Solar
High-Throughput Automated Solar Cell Tester The Spi-Cell Sorter™ sorts photovoltaic cells according to their electrical performance, tested under simulated sunlight. A pulsed xenon lamp with an optical filter provides...
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Wafer inspection machine B30™, E30™ Rudolph Technologies
Rudolph's macro defect inspection systems provide optimum resolution and throughput for maximum detectability and productivity for next-generation...
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In line wafer inspection unit LaserTrac™ Axsys Technologies
General Dynamics has deep domain experience in developing precision micro inspection imaging systems used in some of the most demanding applications such as processing semiconductor wafers, read-write heads and hard disks. With over 30 year experience in the field of distance-measuring...
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Printed circuit board assembly inspection machine DE-H/S series Hitachi Via Europe
Maskless. Beam-overlapping method. Applicable...
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PWB hole analyzer HS, HA/HT Series Hitachi Via Mechanics
HS Series HA/HT Series Accuracy remained and...
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UV exposure unit for PCB manufacturing DE-H/S Series Hitachi Via Mechanics
Maskless. Beam-overlapping method. Applicable...
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Wafer inspection machine Model WBI OAI
Silicon is transparent for infrared light. Our IR light wafer bonding inspection device (WBI) illuminates the silicon substrate from the back-side and captures the light that permeates the substrate. Therefore, it becomes possible to inspect phenomena between...
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BGA video inspection system Optilia Instruments
Optilia Digital BGA Inspection System, Standard, ESD-protected Product No. OP-019 155 The standard...
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Automated optical inspection (AOI) machine for PCBs SI - AOI Sinergo
Due to continuous R & D and the specific experience, developed over 20years, Sinergo has made special machines for optical...
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Inspection stereomicroscope for PCBs SZM7045TR SMT MAX
High quality stereo trinocular microscope with Boom Stand. Great for working on PCB boards with fine pitch IC's and other applications. ●Crystal sharp pictures. A necessary tool for SMT/SMD circuit boards inspection and other...
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Inspection stereomicroscope for PCBs TG2U Beijing Torch SMT Co., Ltd.
TG2U lithography is used in the LSI, sensor, surface wave component, magnetic bubble, microwave, CCD and so on. Lithography TG2U Technical parameter： 1．Template size: a．100×100×2-3mm； b．75×75×2-3mm： 2． silicon size：Φ50-Φ75mm， real line width 3-4цm； 3． comparative displacement between template...
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Stator test system ST 510 Brockhaus
Non-destructive testing of the magnetic properties of stators Quality control of unwound stators in seconds, irrespective of size Fully automatic measuring station, safety light barrier Time-consuming manual preparation of samples is no longer necessary Integration into production line, 100 % testing possible Interactive recording of measuring data which can be saved in external programmes Identification...
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Wafer inspection and sorting machine CS 1250 Datacon
Sort to Tape Reel at up to 16’500 UPH - The high speed die sorter CS 1250 processes WLP and other flipped devices into tape and reel. Pick, flip and...
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SoC device test system Chroma Ate Europe
* 50 /100 MHz * 512 digital I/O pins * 16/32 MW vector memory * 16/32 MW pattern instruction memory * Multi-site testing up to 32 sites * Per-pin test architecture * Up to 8 16-bit ADDA channels option...
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Desktop AOI system for efficient inspection of...
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Wafer inspection machine max. 1 mm | F60 series Filmetrics Inc.
Automated Thickess Mapping for Production Environments The Filmetrics F60-t family maps film thickness and index just like our F50 products, but it also includes a number of features...
