FEM microscopes, X-ray microscopes, Electron microscopes

157 Industrial products | 41 Companies
 
 
Hitachi High-Technologies Europe
Tabletop scanning electron microscope (SEM)  TM3000 Hitachi High-Technologies Europe

The next generation TM3000 Tabletop microscope builds on the success of its predecessor, the TM-1000, and offers significantly improved performance, including magnification up to 30,000x and better resolution, in a unit that occupies 20% less space and has an energy saving design. The new TM3000 is a tabletop variable ...

Transmission electron microscope (TEM) for biomedical applications  120 kV | HT7700 Hitachi High-Technologies Europe

The new HT7700 120 kV transmission electron microscope is designed for bio-medical research and R&D for pharmaceutical, advanced materials and nanotechnology. The revolutionary HT7700 is optimized for high contrast imaging at low electron doses and is set to make life much easier for microscopists with 100% integration of all functions into the graphical user interface. The HT7700 features a unique, ...

Analytical field emission scanning electron microscope (FE-SEM)  SU70 Hitachi High-Technologies Europe

The SU70 large chamber analytical field emission scanning electron microscope features a unique dual mode objective lens coupled with high probe current from a new Schottky emission electron gun allowing incredibly fast, stable analysis.The dual electron-optical modes: High Resolution ...

Jeol
Analytical field emission scanning electron microscope (FE-SEM)  JSM-6701F Jeol

The JSM-6701F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures. Featuring a conical FE gun and a semi-in-lens ...

Analytical field emission scanning electron microscope (FE-SEM)  JSM-7500F Jeol

The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest ...

Analytical field emission scanning electron microscope (FE-SEM)  JSM-7001F Jeol

The JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large, 5-axis, fully ...

Carl Zeiss MicroImaging
3D laser scanning microscope  LSM 7 LIVE Carl Zeiss MicroImaging

Visions get moving: the improved LSM 7 LIVE featuring 64-bit soft-
ware, multilocation timeseries & improved homogeneity of images.
The LSM 7 LIVE gives scientists ...

Laser scanning microscope  LSM 7 MP Carl Zeiss MicroImaging

The LSM 7 MP Laser Scanning Microscope is a system specially designed for multiphoton microscopy. It creates highly resolved microscopical images ...

Laser scanning microscope  355 nm | LSM 780 Carl Zeiss MicroImaging

The more demanding the applications, the greater your need for improved detection performance. With the GaAsP spectral detector ...

Carl Zeiss Nano Technology Systems
Analytical field emission scanning electron microscope (FE-SEM)  MERLIN Carl Zeiss Nano Technology Systems

MERLIN™
Analytical Power for the Sub-Nanometer World

-Nano Analytics
-Total Information
-Ease of Use
-Future Assured

MERLIN™ - analysis and high resolution in one
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical ...

Focused ion beam system  AURIGA Carl Zeiss Nano Technology Systems

AURIGA®
Information Beyond Resolution

- Unique Imaging
- Advanced Analytics
- Precise Processing
- Future Assured

Does working with your sample cover more than just ...

Field emission scanning electron microscope (FE-SEM)  SUPRA Carl Zeiss Nano Technology Systems

The answer to modern nano science challenges is the unique GEMINI® field emission SEM column, a sophisticated solution recognised by microscopists worldwide as the leader. The new SUPRA™ series, based on the 3rd generation GEMINI® ...

Bruker Optics
Raman microscope  RamanScopeIII Bruker Optics

Today, with the culmination of more than 20 years experience, Bruker Optics offers state-of-the-art infrared and Raman microscopes. RamanScopeIII is based on a next generation, 'hybrid' platform ...

Raman microscope  SENTERRA Bruker Optics

SENTERRA Dispersive Raman Microscope



The SENTERRA is a high performance Raman ...

Panasonic Factory Automation Company
Atomic force profilometer  max. 200 mm | UA3P series Panasonic Factory Automation Company

The Panasonic UA3P profilometer series is designed to measure aspherical lenses & molds, semiconductor wafers, and any other precision component requiring nanometer level accuracy ranging up to 200mm x 200mm. Different machine ...

Atomic force profilometer  UA3P-L Panasonic Factory Automation Company

Panasonic UA3P-L Profilometer

The newly introduced UA3P-L measures the vertical wall surfaces of objects and the interior surface of micron-level holes. Applications requiring High Aspect Ratio Metrology ...

Navitar
Fluorescence lifetime imaging microscope Navitar

Fluorescent Imaging
Navitar's Video ZFL Scope is a macro/micro fluorescence ...

Thermo Scientific - Scientific Instruments
Raman microscope  DXR Raman Thermo Scientific - Scientific Instruments

DXR Raman Microscope
The Thermo Scientific DXR Raman microscope provides Point and shoot Raman microscopy with exceptional sensitivity and spatial resolution for working ...

X-ray microanalysis system  NORAN System 7 Thermo Scientific - Scientific Instruments

Thermo Scientific NORAN System 7 X-ray Microanalysis System gets microscopists to the final answer in the least amount of time and with complete confidence ...

Physik Instrumente
Piezo microscope nano-focus system sub-nm precision, sub-msec response  max. 460 µm | PIFOC® series Physik Instrumente

High-Precision Positioner / Scanner for Microscope Objectives
P-725.2CL with QuickLock option P-721.12Q for W0.8 x 1/36" threads and objective (QuickLock adapter and objective not included)


Travel Ranges to 460 µm
Significantly Faster Response and Higher Lifetime than Motorized Z-Stages
Scans and Positions Objectives with Sub-nm Resolution
Direct ...

RENISHAW
Raman microscope RENISHAW

inVia Raman microscopes are high-sensitivity systems with integrated ...

Park Systems Inc.
Atomic force microscope (AFM)  XE-70 Park Systems Inc.

Affordable, Research-Grade AFM with Flexible Sample Handling

An economic extension of the XE-100, the XE-70 is Park Systems' new AFM solution for ...

Atomic force microscope (AFM) for metrology applications Park Systems Inc.

The XE-200 is an AFM with increased capacity that supports 200 mm wafer investigation. In addition to the precise scan performance provided by True Non-Contact mode, the XE-200 offers ...

Atomic force microscope (AFM)  XE-NSOM Park Systems Inc.

Built on the award-winning XE-100 AFM platform, the XE-NSOM is designed to provide the most stable measurement conditions for both topography and NSOM measurements. Its dedicated optical modules, allowing access ...

Phenom-World
Scanning electron microscope (SEM) (3D, Ra, Rz)  3D, Ra, Rz Phenom-World

With the 3D Roughness Reconstruction application, the Phenom
G2 pro desktop scanning electron microscope (SEM) is able to generate 3D images and submicrometer roughness measurements.

This fully automated application for the Phenom G2 pro desktop SEM will help to communicate imaging results and will extract and visualize data normally hidden within a sample.

3D
3D imaging ...

Scanning electron microscope (SEM) for fiber analysis  0.04 - 100 nm | Fibermetric Phenom-World

Better, Faster Fiber Analysis

Now, direct observation and measurement of micro and
nano fibers is faster, better and easier than ever before, with
the improved Fibermetric application.

In combination with the Phenom™ G2 pro desktop scanning electron microscope, the Fibermetric application allows you to produce accurate size information from micro and ...

Scanning electron microscope (SEM)  20 - 17 000X | G2 pure Phenom-World



The Phenom G2 pure is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom G2 pure is equipped with the basic components for meeting imaging needs.
The Phenom G2 pure provides high-quality images while using basic features, ...

HORIBA Jobin Yvon
Raman microscope  XploRA™ HORIBA Jobin Yvon

The XploRA™ is a new concept in Raman microscopy, bringing Raman chemical identification directly to your microscope. The XploRA can be coupled to ...

Raman microscope  LabRAM HR HORIBA Jobin Yvon

The LabRAM HR systems provide high spectroscopic resolution and a unique wavelength ...

X-ray microscope  XGT-7000 HORIBA Jobin Yvon

The XGT-7000 represents a completely new generation of XRF microscope, and leads the way to a new era of science. It offers a seamless merger between optical observation and elemental analysis functions, revolutionizing the world of micro-analysis ...

LEICA MICROSYSTEMS
Fluorescence lifetime imaging microscope  TCS SMD FLIM LEICA MICROSYSTEMS

Fluorescence Lifetime Imaging Leica TCS SMD FLIM

The Leica TCS SMD FLIM system is part of the Leica TCS SMD Series. It integrates hardware and software ...

Ion beam milling system for sample preparation LEICA MICROSYSTEMS

Ion milling system Leica EM RES101


The Leica EM RES101 is a fully computer-controlled ion milling system with the ...

Microscope for material analysis  DM2500 M LEICA MICROSYSTEMS

Materials Analysis Microscope Leica DM2500 M

Designed for materials analysis and quality control. Its unique concept improves the workflow and allows the user to concentrate entirely ...

recherche-cat www di En 2012-05-21-23