|
|
Renishaw manufactures a wide range of optical spectroscopy products, including: Raman microscopes, compact process monitoring Raman spectrometers, Raman analysers for scanning electron microscopes, lasers for spectroscopy, and state-of-the-art cooled CCD detectors.
The Renishaw Raman systems exploit the Raman effect to identify and characterise the chemistry and structure of materials in a non-contacting, non-destructive manner.
|
|
|
|
|
|
The Voyage™ is a Confocal Raman Microscope System that is designed to deliver true confocality and true flexibility. Its robust opto-mechanical design provides one design to fit multiple microscopes, including Olympus BX51 research microscope or Nikon Eclipse 80i advanced research microscope. In addition, the innovative design of detachable confocal subassembly provides the retrofit for users to turn their own microscopes into confocal Raman microscope. Its optimized optical design for confocal concept, combined with B&W Tek core technologies of patented CleanLaze® laser and patent pending spectrometer with highest resolution, delivers the smallest spot size in the market, spectral resolution of 3 cm-1, and near-excitation cut-on at 100 cm-1. This compact confocal Raman Microscope System is available with 532 nm or 785 nm laser excitation.
Highlights
- Optimized True Confocal Design
- Spectral Resolution 3cm-1
- 100cm-1 of the Raleigh Line
- Detector Cooled to -20ºC
- One design fits multiple microscopes
- Retrofit for users with microscopes
- Adjustable Slit
|
|
Today, with the culmination of more than 20 years experience, Bruker Optics offers state-of-the-art infrared and Raman microscopes. RamanScopeIII is based on a next generation, 'hybrid' platform that can accommodate multiple wavelengths of Raman excitation. The new RamanScopeIII system can be coupled to Bruker Optics' multi-range fully digital FT-Raman module, the RAM II, as well as the standalone MultiRAM FT-Raman spectrometer.
Optical Microscopy
The RamanScopeIII is based on the Olympus BX series optical microscope, all the necessary tools for sample visualization and contrast enhancements such as the Koehler brightfield and darkfield illumination, polarized light, Nomarski differential interference contrast (DIC) and fluorescence are available.
|
|
Raman microscopy is an information rich way to characterize your samples in life sciences, geology, nanotechnology, semiconductor, forensic science and any other application where accurate chemical identification is needed.
DeltaNu presents a high performance Raman microscope at an affordable price. The ExamineR™ combines the quality of Olympus microscopy with the performance of DeltaNu's Raman spectroscopy. This combination creates a Raman microscope with outstanding imaging and spectral characteristics.
DeltaNu is the price/performance leader in Raman microscopy. Our ExamineR system comes with your choice of wavelength modules - 532nm, 785nm, or 1064nm. Our patent pending design puts the Raman module on top of the microscope and changing wavelengths is as simple as switching modules - no more tedious laser, filter, grating, and fiber optic changes like other microscopes. And, with the Raman module on top, the ExamineR's footprint is the smallest in the industry.
|
|
|
|
|
|
DualScope DS 45-40 is a compact, very stable, and reasonably priced AFM scanner with a fixed laser and a scan area of 40 µm x 40 µm x 2,7 µm. the working distance corresponds to that of a conventional 45 mm microscope objective. The instrument works in AC mode which is optimal for most applications. The focal plane of the optics built into the scanner is permanently app. 100 µm (standby distance) below the cantilever. Thus, focussing before the scanning is not necessary. When the cantilever is in the standby distance before the scan and between scans, it is possible to move the sample without risk, and at the same time, the scanner provides a sharp optical image of the sample surface as well as of the cantilever tip. Hereby, it is possible to find an interesting location on the sample quickly and without problems.
The scanner works with standard AC mode (Non-contact mode) cantilevers, which must have a highly reflecting back side. The cantilevers are held by a magnetic mechanism and are thus very easy to change. The routine of parking the scanner, changing the cantilever, adjusting the frequency, and starting again on the first scan line will take only app. 5 to 6 minutes.
To make possible this simple cantilever change, we deliver our cantilever pre-mounted on a metal holder. If special cantilevers are to be used, naturally, we can deliver the tools for easy mounting of the cantilevers on our metal holders.
|
|
|
|
|
|
The scanners of the DualScope DS 95 series are available in a number of different variants. The DS 95-50 scanner has a standard scan range of 50 µm x 50 µm x 5 µm, and the DS 95-200 scanner has a standard scan range of 200 µm x 200 µm x 15 µm. The DS 95-50 scanner can also be delivered with a larger Z scan range of 15 µm. The AFM scanners work in AC and DC mode (contact and non-contact mode) as well as support the measurement of the lateral torsion of the cantilever (Lateral Force mode). Irrespective of the scan range, all scanners have atomic resolution in the Z direction.
In the DS95 scanners, the laser unit is moved with the scanner during scanning, i.e. the laser point will not move at the back of the cantilever during scanning. Thus disturbances in the reflection layer on the cantilever do not influence the AFM image.
All scanners have a built-in linearization sensor in order to eliminate the influence of hysteresis in the Z piezo. Thereby, large differences in the height of the sample surface will be measured correctly, even if the scanner has only been calibrated with small differences in height, and vice versa. To allow measurements also in liquids, the scanner is equipped with a rubber membrane at the bottom, protecting the electronics from moisture entering the housing. So these scanners can also work in liquids such as water or alcohol.
The built-in optics in these scanners is similar to that of a 95 mm microscope objective. In contradistinction to the DualScope DS 45-40 model, the focal plane is independent of the cantilever position and lies app. 1 mm below the scanner front. Thus it is especially easy to find a certain position on the sample surface.
|
|
EVO® MA and LS Series SEM
Driven by applications
The EVO® series SEM has evolved to provide users in Materials Analysis and Life Science with microscopes designed to match their needs. Both microscopes series share some key features.
Key features
- Class leading x-ray geometry
- Class leading secondary electron imaging in variable pressure
- High brightness LaB6 source option
- Clean pumping technology with fast pumpdown
- High repeatability stage with large stage movements
The EVO® MA 10, EVO® MA 15 and EVO® MA 25 microscopes provide, as standard, the capability to use variable pressure (VP) operation.
The EVO® LS 10, EVO® LS 15 and EVO® LS 25 microscopes are environmental SEMs providing, as standard, the capability to prevent dehydration artefacts in the microscopy of life science specimens.
The EVO® MA and LS series ensures the perfect solution to every application requirement.
|
|
World's first Personal Electron Microscope
FEI™ is the company that helps you see beyond the limits of conventional optical and electron microscopes. Phenom is the easiest-to-use SEM ever made, breaking through the performance barriers of optical microscopes while defining a new standard for usability by non-experts. Now engineers, researchers, educators, and students - with very little training - can make high-resolution, sub-micron images themselves; where they want, how they want, and most importantly, when they want.
Phenom is a high resolution desktop imaging tool that simplifies and accelerates your imaging workflow. Never before could you have this level of resolution, magnification and speed at such a price point. With magnifications of 20x to 24,000x and an ultimate resolution of 30 nm, it's ideal for routine inspection and detailed imaging of materials. And, Phenom is extremely easy to operate too, meaning everyone can use it.
|
|
New HIROX Tabletop Mini-SEM:
Desktop Scanning Electron Microscope with integrated EDS BRUKER-AXS!
Easy to use, fast, performant and easy maintenance, the HIROX Mini-SEM combines the simplicity of an optical microscope with the strength of a Scanning Electron Microscope!
From 20x to 30 000X
* Visualization
* Measurements
* Control
* Output
... in just a few seconds!
|
|
|
|
|
|
The NeoScope benchtop SEM economically complements both optical microscopes and
traditional SEMs. The NeoScope makes it easy to obtain high magnification images with high resolution and large depth of field using a microscope that is as simple to operate as a digital camera, but has the powerful electron optics of an SEM.
Whether used by trained electron microscopists as a simple screening instrument, or by lab technicians as a higher resolution alternative to the light microscope, the NeoScope will help accelerate the pace of research in the life sciences, forensics, and failure analysis of manufacturing materials.
Basic operation of the NeoScope is simple with auto focus, auto contrast and auto brightness controls. No special sample preparation, such as coating or drying, is required. The NeoScope operates in both low and high vacuum modes and has three settings for accelerating voltage suitable for a variety of applications, all of which can be programmed in special pre-stored recipe files.
|
|
|
The Hitachi Tabletop Microscope is the perfect imaging platform for any Light Microscope lab needing higher resolution and deeper focus depth. Requiring no electron microscopical technical skills or sample preparation techniques, the TM-1000 can be used by anyone able to use a digital camera. It's that easy!
|
|
|
|
|
|
JEOL has played a leading role in the development and evolution of scanning electron microscopy since the early 1960s. Over the past five decades, the SEM has become an indispensable tool in both advanced research and routine analysis for science and industry. JEOL has installed more than 8000 SEMs worldwide.
SEMs are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology has been developed to help researchers to see the structures they make. More and more failure analysis, pathology, forensic, metallurgical and environmental labs are replacing traditional optical microscopes with SEMs.
As the range of applications for the SEM grows -- and as new discoveries require higher resolutions and greater versatility -- JEOL keeps pace with new technology that enables the SEM user to produce unprecedented images of the microscopic and nanometric world.
Our SEM product line is comprised of four categories differentiated by resolution and configuration:
Conventional Tungsten High Vacuum SEMs: ideal for failure analysis, inspection, and characterization.
Conventional Tungsten Low Vacuum SEMs: for imaging and X-ray analysis of wet, nonconductive, unprepared samples.
Conventional Thermal Field Emission SEMs: field emission source provides higher resolution; high stability and high current in a small spot size and generates high x-ray fluxes for chemical analysis at high resolution conditions.
Semi-in-Lens Cold Cathode Field Emission SEMs: highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.
|
|
|
As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.
|
|
The in-situ combination of STM, SEM and SAM for high resolution structural and chemical analysis creates a superior research tool. Atomic resolution STM is ideally complemented by the abilities of the SEM to image large surface areas, help to identify areas of interest, and finally assist the precise positioning of the STM tip to the desired spot on the surface.
The MULTISCAN LAB employs the goniometer mounted MULTISCAN STM as an ideal base for such dedicated experiments. The highly stable UHV chamber (30mm wall thickness) together with a rigid system frame and vibration isolation by a pneumatic auto-levelling damping system ensures both optimal STM and SEM performance.
|
|
Fiber Analysis made Faster, Better and Easier with the FEI Fibermetric System powered by Phenom
Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before. With the Fibermetric™ system powered by Phenom you can load and image samples in about 30 seconds. Magnifications up to 24,000 times produce accurate information on a large range of fibers as small as 100nm in diameter. Automated measurement generates all the statistical data you need in minutes, and unlike other SEM-based solutions, no laboratory infrastructure or trained microscopists are required.
The Fibermetric system accurately images and measures almost any fiber sample. The Fibermetric system delivers better data, faster, to improve your fiber material developmentand manufacturing.
- Save time
- Get all your statistical data, automatically
- See and measure nearly any micro/nano fiber
|
|
|
|
|
|
Phenom world's first Personal SEM for Metals
Rapidly examine alloys for metallurgical analysis, quality control, and failure analysis
The properties of many engineering materials are governed by a combination of metal composition and the morphology and distribution of key micro-structural features. These features can be observed with light microscopes, but when higher magnification and 3D detail is required, a scanning electron microscope (SEM) works best. The Phenom™ personal electron microscope exceeds the resolution of light microscopes (30 nm vs. 200 nm) and eliminates the expense, delay, and difficulty of operating a conventional SEM.
Phenom takes metallurgical imaging to a new level of clarity. For failure analysis of 3D objects, Phenom's large depth of focus can show the fracture origins and fatigue features.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images-with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
|
|
|
|
|
|
Phenom for particles
Best of both worlds: size and shape with Phenom in 30 secs
Particle size analyzers are becoming common in industrial and pharmaceutical laboratories. As important as size distribution is, the shape and agglomeration of sub-micron particles is only visible with an electron microscope. Phenom™ is the affordable solution to expand your lab capabilities. With an ultimate resolution of 30nm, Phenom will clearly identify and compare the morphology of fine particles or deposits for new formulations.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
|
|
|
|
|
|
Validate TEM and SEM samples, faster.
For advanced semiconductors, light microscopes lack resolution to ensure that SEM and TEM samples include regions of interest. If you can't use a DualBeam™ to prepare and validate every sample, Phenom™ can help. Now, FA labs can dedicate high-resolution SEMs to FA work, offloading routine work without outsourcing. The Phenom is easy for engineers to use, fits on a desktop, does not require special environmental preparations, and costs less than many high-end optical microscopes.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
|
|
|
|
|
|
|
The LEAP HR is a high-performance atom probe microscope providing atomic resolution, 3D compositional imaging, and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. Each ion is analyzed by measuring the time of flight to the detector through an energy-compensated time-of-flight mass spectrometer. The LEAP HR employs patented innovations that provide best in class mass resolution while simultaneously enabling a large field of view (> 150 nm). This combination of high mass resolution with large field of view provides breakthrough capability for advanced materials applications. The large field of view enables the material’s atomic scale features to be understood in the context of the larger scale nanostructure. High mass resolution permits narrowly separated mass peaks to be differentiated, ensuring accurate compositional information.
|
|
|
|
|
|
The Scanning probe Microscope (SPM) was developed during the 1980s and is now an indispensable tool for the direct high resolution study of surfaces and surface forces. Starting with the scanning tunneling microscope in 1981, the technique was broadened to atomic force microscopy including contact, non-contact, and discrete contact modes by 1988. By changing the force-sensing probe it is possible to detect magnetic forces, electrical forces, frictional forces, surface elasticity, and visco-elasticity, etc. The SPM is currently being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs, computer hard drives, magnetic media, electrical properties of materials, biological materials, to name a few.
Our SPM product line is comprised of the following offerings:
JSPM-4500 Scanning Probe Microscope: designed for the high resolution study of surfaces.
JSPM-5200 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
JSPM-5400 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
|
|
|
The MULTIPROBE P is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chambers in the MULTIPROBE P offers standard sample preparation facilities like thin film growth or sample sputtering and heating.
|
|
|
Laser Pulsing Mode expands the universe of applications for LEAP to low electrical conductivity materials including semiconductors and ceramics. In laser pulsing mode the LEAP electrode applies a static field to the specimen while an ultra-fast laser pulse triggers the removal of an atom. The Imago Laser Pulsing Module features a high pulse-repetition rate and proprietary real-time, optical-alignment correction which together enable high mass resolution, a large field of view, and fast time to results.
|
|
|
Hitachi is proud to introduce the HD-2300, Hitachi´s newest high resolution, high throughput STEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance. This second-generation 200kV STEM from Hitachi, surpasses current instrumentation in nanotechnology research, emphasizing superoir performance and enhanced user-friendly features of the previous HD-2000 model. The HD-2300 is an essential instrument for the advancement of Nano-Technology in the 21st century.
|
|
|
We are proud to present our NEW versatile solution for analytical purposes in combination with Ultra-High-Resolution and ample Signal Selection capabilities .
|
|
|
|
|
|
LASER-Assisted
3D Atom Probe for Semiconductors and Materials
The CAMECA LA-WATAP instrument is the next generation of Tomographic (or 3D) Atom Probe, providing quantitative atomic scale 3D elemental mapping of chemical heterogeneities in materials.
The LA-WATAP offers the following advantages:
Analysis of semiconductor materials with near-atomic depth resolution. This is possible by using a flexible (IR/ visible/ UV) ultrafast (400fs) laser setup. The unique hybrid evaporation mode combines reduced heating of the sample with ultra-fast surface polarisation promoting ion evaporation under the high DC electrical field.
Excellent mass resolution even on low thermal conductivity materials. This is obtained by reducing the heating of the sample with ultra-fast laser pulsing. Conventional picosecond laser based 3DAP work in thermal evaporation mode leading to thermal effects and peak tails.
Analysis of thin electrically insulating layers by using fs-laser pulses of short wavelength (UV).
Highest analyzer transmission (detected ions/evaporated atoms >60%). Reflectron-based 3DAP instruments reduce this typically to 35% due to the use of grids. Transmission is a key parameter when applying the (destructive) 3DAP technique to the quantification of nanoscale volumes.
Large analysis area (100nm in diameter) for a better statistics on composition measurements.
Fast acquisition, up to 1E6 atoms per minute depending on sample strength (flux of at./pulse).
Best quantitative results with the exclusive Advanced Delay Line Detector (ADLD) and its benchmark multi-hit performance.
Flexible and fast dedicated FIM (Field Ion Microscopy) detector for metallurgical application with highest S/N performance and fast switch between FIM and 3DAP modes.
|
|
The transmission electron microscope (TEM) uses electron translucent specimens with images directly projected on a screen or camera. Resolution better than 0.1 nm are now achievable, delivering atomic scale resolution
The all new LIBRA® range of Energy Filtering Transmission Electron Microscopes (EFTEM) combine state of the art electron optics with unique Koehler illumination, OMEGA In-column energy filtering, extremely stable digital electronics and genuine ease of operation.
The systems are operated through a pair of dedicated control panels supported by the WinTEM™ GUI following the successful philosophy of ZEISS´ SEMs instruments for maximum convenience and consistent “look-and-feel” operation across the entire product range.
|
|
With 11 accessory ports and optional simultaneous WDX, EDX and XRF analysis, the S-3700N is a true analytical instrument for ultra-large samples up to 300 mm across.
The patented Quad bias electron gun gives high current for excellent imaging and analytical performance throughout the kV range, but particularly at low voltages.
|
|
|
The Transmission Electron Microscope - TEM - has been used in all areas of biological and biomedical investigations because of its ability to view the finest cell structures. It is also used as a diagnostic tool in hospital pathology labs. For the crystallographer, metallurgist or semiconductor research scientist, current high voltage/high resolution TEMs, utilizing 200 keV to 1 MeV, have permitted the routine imaging of atoms, allowing materials researchers to monitor and design materials with custom-tailored properties. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter.
|
|
X-RayMicroanalysis:High Throughput, Impeccable Accuracy and No Compromises
Featuring high-resolution EDS X-ray detectors and X-ray microanalysis systems designed for high-throughput, ease of use, and comprehensive answers, as well as WDS and EBSD systems, Thermo Fisher Scientific offers complete solutions for chemical analysis in electron microscopy. When results count, count on us.
The Thermo Scientific NORAN System 7 provides the ultimate in microanalysis capabilities for the modern electron microscopy lab: X-ray detectors with the highest sensitivity, pulse processors and digital imaging with the highest throughput and the most sophisticated software suite available. Combined together, NORAN System 7 produces accurate results and answers in seconds making your lab a better place to work.
|
|
| ... products without technical information |
| |
|
|
FEM microscopes, X-ray microscopes, Electron microscopes
