Inspection machines for the electronics industry

27 companies | 64 products
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The Hitachi NE4000 nanoEBAC gives excellent EBAC images using Hitachi’s patented EBAC amplifiers. Users can operate the easy to use GUI(Graphical User Interface)with various...

This is an advanced XY step proximity exposure system for the eighth generation of color filter substrate. The photo mask bending correction mechanism...

The XY step proximity exposure system is exclusively designed for the 7th generation color filter substrate and is a highly productive system. High precision exposure is made...

The Hitachi LE9300S is an exposure system ideally suited for vast volume of glass substances. It...

The LE9100S Exposure System was developed for 5th generation color filter substrates. It boasts...

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To make sure laser diodes work at the start of the manufacturing process,the Model 2520 Pulsed Laser Diode Test System was introduced.With the use if its...

The System 25 Laser Diode LIV Test System Kit from Keithley is capable of keeping in pace on production demands by enabling manufacturers of laser diode modules increase throughput, and yield by...

The Automated Characterization Suite (ACS) interactive software is designed for monitoring semiconductor...

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A key to single device traceability - Get ready for the next level of inkless production. IC’s are getting more and more complex, denser,...

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The VisEdge CV300R and CV300R-EP are built with a cutting edge technology, designed to inspect edge defects and edge metrology requirements for progression and volume...

The WaferSight 2+ from KLA Tencor is a bare wafer geometry measurement system that has been made for CMP and lithography applications. It is also designed to fulfill specific metrology requirements for 1Xnm design nodes. It offers a high accuracy,...

Based on proven industry resistivity mapping standards, the RS-200 resistivity mapping system offers reliable and accurate sheet resistance measurement for 45 nm and over. In order to meet today's production requirements for 300 mm...

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Brockhaus' Stator Tester ST 510 is a measuring device designed for soft magnetic materials. The unit features a non-destructive testing of the magnetic properties of stators.

This can control the quality...

Determination of the filling factor in the construction of stators
Exact calculation of stator-package height
Usable for electrical motor and transformer production
According to IEC 60404-13
Quality control of production process and goods intake control

Determination of the filling factor in the construction of stators
Exact calculation...

The Inline Measuring System EBA is widely utilized in monitoring and documenting the soft magnetic properties present in electrical steels. It provides continuous inline quality control and inline measurement of...

The HG 200 is a device manufactured by Brockhaus Measurements. It is a device determines the magnetic properties of hard magnetic materials and measures the procedure according to IEC 60404-5.

The...

This rotor tester is intelligently designed for measurement of multipolar magnetized permanent magnet rotors and testing of field strength distributions. This unit also features adjustments for rotors that have different sizes. The variable number of hall sensors...

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The ERSA mobile scope is a portable video microscope. The device is used for inspecting solder joints that are in electronic production environments. It is also useful for optical inspection and recording of digital images. It can also carry out...

The ERSASCOPE 2, manufactured by Kurtz Ersa, is now employing megapixel, digital USB 2.0 camera technology, thus providing up to a 400% increase in resolution. The enhanced...

The ERSASCOPE 1 Series, manufactured by Ersa®, is a BGA inspection system that is designed based on the original ERSASCOPE inspection to provide a...

ERSASCOPE System XL permits use of ERSASCOPE 1 or ERSASCOPE 2 for big board applications. The system...

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Micro Epsilon's colorCONTROL MFA Systems are generally utilized for applications that involve flexible color and intensity...

The dimension control 8260 for Ingot is a measuring system that inspects the surface of the bricks. It uses several laser line scanners for measuring side lengths, angles, phase lengths, planarity and diagonal...

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The Optical BGA Inspection System provides pictures with high resolution and detailed definition. The unit produces sharp solder ball...

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The SemDex AR13, manufactured by Isis Sentronics, is an automatic, compact LED wafer inspection metrology...

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UV-EXPOSURE BOXES

Exposure boxes for single side expose of fotosensitive PCB laminates

Strong aluminum...

VACUUM UV EXPOSURE BOXES

Exposure boxes for single side and double side expose of fotosensitive PCB laminates and...

TOPVAK EXPOSURE BOXES

Exposure Box with vacuum tentering frame for single side exposure of fotosensitive PCB laminates...

TUV ERASURE BOXES

TUV low pressure lights for erasure UV erasable E-Prom, PLD,...

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High Performance SIMS Instrument for the Analysis of Radioactive Samples

The IMS 7fR is a shielded magnetic sector SIMS instrument specifically developed for the analysis of highly radioactive materials. Derived from the IMS 7f, it offers all necessary protections against radiation...

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Test system for stators and rotors from motor production.

Definable...

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From the earliest inspection of completed modules in the TFT...

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High-Throughput Automated Solar Cell Tester

The Spi-Cell Sorter™ sorts photovoltaic cells according to their electrical performance, tested under simulated sunlight. A pulsed xenon lamp with an optical filter...

The Inspection Station includes a ball table with pop-up pads to secure the module. A power supply with clip leads is used to measure...

High Resolution Inspection for Solar Modules
The Spi-EL series of solar module testers uses electroluminescence (EL) measurements to identify microcracks and other invisible defects in modules. The testers utilize cooled near-infrared CCD camera...

Automates Spi-Sun Simulator, Hi-Pot & Labeling

The Spi-Module QA is an automated photovoltaic module testing system that combines the advanced I-V measurement capabilities of the Spi-Sun Simulator with high voltage isolation (Hi-Pot) and ground continuity testing. Integrated automation provides...

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The Explorer Architecture allows individual systems to be configured with any combination of wafer front, back, and edge module...

It incorporates Rudolph's Focused Beam ellipsometry technology...


The S3000S™ Metrology System is designed for in-line process control of 300mm advanced diffusion...

Utilizing multi-wavelength Focused Beam Ellipsometry (FBE) for best of...

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General Dynamics has deep domain experience in developing precision micro inspection imaging systems used in some of the most demanding applications such as processing semiconductor wafers, read-write heads and hard disks.

With over 30 year experience in the field of...

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Accuracy remained and shortened inspection...

Maskless. Beam-overlapping method.
Applicable...

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Desktop AOI system for efficient inspection of...

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The Model 3315 Rotor Mapping Station is a precision system designed to measure rotor run-out (TIR) and disc thickness variation (DTV). The station utilizes a precision rotary table in conjunction with non-contact capacitive sensors capable of making very small displacement measurements...

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Compact Rotor Scan System

Easy Application
· 4-Probe scanning round magnets (cylindrical or disc)
·...

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