Inspection machines for the electronics industry

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semiconductor inspection machine - NEXIV FOUP

The NEXIV VMR-C4540 - intended for use with 300mm frontage aperture combined Pod and facade aperture transport package wafer transporters...

wafer inspection machine with microscope - NWL200

The NWL200 series is a semiconductor equipment suitable for microscope inspection with a 100 micron thin...

wafer inspection machine with microscope - 200 mm | Eclipse L200N Series

The Nikon Eclipse L200N Series is a range of IC inspection microscopes that has three versions to choose...

wafer inspection machine - 300 mm | Optistation-7

Nikon Optistation-7 incorporates the most recent advancements in wafer transport....

wafer inspection machine - 300 mm | Optistation-3000

The Optistation 3000 ensures exceptionally accurate and rapid examination of 300 mm wafers....

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CD-SEM (critical dimension-scanning electron microscopy) wafer inspection machine - CD-SEM CG5000

The CD-SEM of series CG5000 is an advanced scanning electron microscope that delivers high resolution and high throughput results. CG5000 has been developed to meet the most challenging...

CD-SEM (critical dimension-scanning electron microscopy) wafer inspection machine - SEM CG4100

Hitachi has completely developed the pattern to improve the stage of precise measurement for integrated technology growth.

The CD-SEM for 32nm with CG4100 includes an assortment of functions and flexible...

DR-SEM (defect review-scanning electron microscopy) wafer inspection machine - RS6000 Series

The Hitachi Multi Purpose SEM Inspago RS6000 Series provide superior quality and contrast with its innovative electron optic system that enhances resolution, contrast, and robustness for capturing...

unpatterned wafer surface inspection machine - LS Series

The state-of-the-art Wafer Surface Inspection System LS Series features excellent durability and reproducibility....

patterned wafer defect inspection machine - IS Series

The HITACHI Dark Field Wafer Defect Inspection System IS Series utilizes enhanced darkfield imaging technology, allowing for very precise...

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X-ray inspection machine for circuit boards - 680 x 635 mm, 180 kV | phoenix microme|x

The phoenix microme|x is reilient and easy to use. It offers excellent image quality and is very reliable in re-analyzing lab failures...

X-ray inspection machine for circuit boards - 27 x 25

The phoenix microme|x DXR-HD has a combined 2D / 3D CT operation which offers its positioning accuracy in the spectrum of 2D and 3D inspection tasks. It is used for microfocus...

X-ray inspection machine for circuit boards - 16 x 16

The phoenix x|aminer is a simple to use admission stage X-ray examination system with powerful presentation that is intended for the extraordinary requirements of the maximum resolution examination of electronic congregations, constituents and Printed Circuit Board Assembly. The system...

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test system - 2520

To make sure laser diodes work at the start of the manufacturing process,the Model 2520 Pulsed Laser Diode Test System was introduced.With the use if its...

semiconductor characterization software - ACS

The Automated Characterization Suite (ACS) interactive software is designed for monitoring semiconductor...

programmable test system - System 25

The System 25 Laser Diode LIV Test System Kit from Keithley is capable of keeping in pace on production demands by enabling manufacturers of laser diode modules increase throughput, and yield by...

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wafer inspection and sorting machine - CS 1250

The state-of-the-art Datacon die sorter...

wafer inspection and sorting machine - DS9000e

The Datacon DS900 is a fully automated, high speed die sorter with output to a frame or carrier. The Film frame, expander...

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patterned wafer defect inspection machine - 29xx, 28xx  Series

KLA Tencor's 2900 Series of broadband defect inspection platforms offer high-quality optical defect detection. This device is capable of capturing previously untraceable wafer discrepancies on almost impossible die ranges...

patterned wafer defect inspection machine - Puma 9650

The 9650 Puma narrowband visual imperfection check system includes technical advances in sensitivity and sound control, offering enhanced defect capture in yield-important die regions, for example, the edge...

electron beam patterned wafer defect inspection machine - eS80x Series

KLA-Tencor eS805 electron beam inspection system is used for detecting leading-edge defects, both physical and electrical, on a variety of structures and layers. It supports...

high-sampling patterned wafer defect inspection machine - 8900

KLA Tencor's High-Sampling Patterned-Wafer Defect Inspection System is ideal for a wide variety of technical defects unto the sub-micron up to the five-micron range. The High-Sampling Patterned-Wafer Defect Inspection System...

patterned wafer macro defect inspection machine - CIRCL™

The CIRCL™ is a bunch of tool that is composed of modules which are responsible for the inspecting the defects of the front side macro; edge inspection, profile...

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measuring device - min. -1 bar | testo 557

The TESTO 557 is a all-in-one product, that will simplify the maintenance process that technicians have to struggle with every day. It is used as a digital manifold...

measuring device - max. 1.1 bar | testo 552

The TESTO 552 digital vacuum measuring instrument offers very precise information and provides measurement for even the smallest pressures. It is mainly used for the evacuation of...

measuring device - max. 10 000 ppm, max. 25 hPa | testo 435-3

The Testo 435-3, Multi-function Instrument for A/C, ventilation and Indoor Air Quality with Protection class IP54 rating, is the best solution for professional ambient...

analyzer - max. 21 000 ppm | testo 350 box

Whether you are testing for compliance or troubleshooting and tuning your combustion process, the testo 350 portable emission analyzer has everything...

analyzer - max. 8 000 ppm, -40 ... 1 200 °C | testo 330-2 LL

The flue gas analyzers in the Testo family feature new instrument functions that offer reliability and support. The Testo 330-LL series comes with a color display that has a high resolution, extended...

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video inspection system / BGA - MOBILE SCOPE

The ERSA mobile scope is a portable video microscope. The device is used for inspecting solder joints that are in electronic production environments. It is also useful for optical inspection and recording of digital images. It can also carry out...

video inspection system / BGA - ERSASCOPE 2

The ERSASCOPE 2, manufactured by Kurtz Ersa, is now employing megapixel, digital USB 2.0 camera technology, thus providing up to a 400% increase in resolution. The enhanced...

video inspection system / BGA - ERSASCOPE 1

The ERSASCOPE 1 Series, manufactured by Ersa®, is a BGA inspection system that is designed based on the original ERSASCOPE inspection to provide a...

video inspection system / BGA - ERSASCOPE XL

ERSASCOPE System XL permits use of ERSASCOPE 1 or ERSASCOPE 2 for big board applications. The system...

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video inspection system / BGA - ERSASCOPE XL

Micro Epsilon's colorCONTROL MFA Systems are generally utilized for applications that involve flexible color and intensity...

wafer inspection machine - 2 - 5 mm

The wafer edge inspection system measures the surface of the wafer with high precision using three image processing cameras. Defects larger than 300...

the semiconductor industry measuring device - 2500 mm | dimensionCONTROL 8260

The dimension control 8260 for Ingot is a measuring system that inspects the surface of the bricks. It uses several laser line scanners for measuring side lengths, angles, phase lengths, planarity and diagonal...

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semi-automatic wafer inspection machine - ø 150 - 300 mm | Proforma 300SA

The Proforma 300SA is an instrument manufactured by MTI instruments. It delivers full wafer surface scanning at the press of a button. It is applicable for both semiconducting and semi-insulating wafer materials.
It...

semi-automatic wafer inspection machine - ø 75 - 200 mm | Proforma 200SA

The Proforma 200SA is an instrument manufactured by MTI instruments. It delivers full wafer surface scanning at the press of a button. It is applicable for both semiconducting and semi-insulating wafer...

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visual inspection system - M20x-HD EasyView

The M20x-HD EasyView Model of HD Visual Inspection System, manufactured by Optilia Instruments, is specifically designed to offer quick, cost effective and ergonomic performance enables video inspection....

video inspection system / BGA - Optilia Digital BGA Inspection System, Exclusive

The Optical BGA Inspection System provides pictures with high resolution and detailed definition....

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the semiconductor industry measuring device - IMS 7fR

High Performance SIMS Instrument for the Analysis of Radioactive Samples

The IMS 7fR is a shielded magnetic sector SIMS instrument specifically developed for the analysis of highly radioactive materials. Derived from the IMS 7f, it offers all necessary protections against radiation...

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printed circuit board assembly inspection machine - HawkEye™

HawkEye™ is a print verification solution aimed at operators, not just process engineers. Its fast to set-up and easy to understand, delivering high speed paste-on-pad verification to highlight insufficient paste and prompt corrective action.

Thinner...

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printed circuit board assembly inspection machine - HawkEye™

The Metrology Sorter System is the user-friendly on-the-fly final inspection and sorting in SCHMID's Wafer Backend* and is designed for diamond wire cut and slurry cut wafers as well as for monocrystalline,...

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solar cell testing machine - Spi-Cell Sorter™

High-Throughput Automated Solar Cell Tester

The Spi-Cell Sorter™ sorts photovoltaic cells according to their electrical performance, tested under simulated sunlight. A pulsed xenon lamp with an optical filter...

solar cell testing machine - Spi-Cell Sorter™

The Inspection Station includes a ball table with pop-up pads to secure the module. A power supply with clip leads is used to measure...

inspection system - Spi-EL™  series

High Resolution Inspection for Solar Modules
The Spi-EL series of solar module testers uses electroluminescence (EL) measurements to identify microcracks and other invisible defects in modules. The testers utilize cooled near-infrared CCD camera...

solar cell testing machine - Spi-Module QA™ 3500 & 4600

Automates Spi-Sun Simulator, Hi-Pot & Labeling

The Spi-Module QA is an automated photovoltaic module testing system that combines the advanced I-V measurement capabilities of the Spi-Sun Simulator with high voltage isolation (Hi-Pot) and ground continuity testing. Integrated automation provides...

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modular wafer inspection machine - Explorer Cluster

The Explorer Architecture allows individual systems to be configured with any combination of wafer front, back, and edge module...

wafer inspection machine - F30™

Designed to blur the lines between DF micro inspection and traditional macro inspection, the F30 module boasts a five...

inspection machine for the electronics industry - NSX 320

The NSX® family is the market leader for automated macro defect inspection for advanced packaging. Built on that success, the NSX 320 system offers...

wafer inspection machine - NSX Metrology Series

Unique and established 3D technologies now combined with macro defect inspection to offer a complete 2D/3D inspection and metrology solution for emerging advanced packaging applications.

As advanced packaging process control becomes...

wafer inspection machine - E30™, B30™

The Class 1 certified E30 and B30 modules (available separately or combined in one module)...

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in-line wafer inspection unit - LaserTrac™

General Dynamics has deep domain experience in developing precision micro inspection imaging systems used in some of the most demanding applications such as processing semiconductor wafers, read-write heads and hard disks.

With over 30 year experience in the field of...

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board-mount analyzer / drilling - HS series , HA/HT series


Accuracy remained and shortened inspection...

UV exposure unit for PCB manufacturing - DE-H/S series

Maskless. Beam-overlapping method.
Applicable...

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UV exposure unit for PCB manufacturing - DE-H/S series

Incident light microscope for wafer inspection

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stator test system - ST 510

Brockhaus' Stator Tester ST 510 is a measuring device designed for soft magnetic materials. The unit features a non-destructive testing of the magnetic properties of stators.

This can control the quality...

stator test system - SFT 300

Determination of the filling factor in the construction of stators
Exact calculation of stator-package height
Usable for electrical motor and transformer production
According to IEC 60404-13
Quality control of production process and goods intake control

Determination of the filling factor in the construction of stators
Exact calculation...

online test system - EBA

The Inline Measuring System EBA is widely utilized in monitoring and documenting the soft magnetic properties present in electrical steels. It provides continuous inline quality control and inline measurement of...

magnetic field tester / for hard magnetic materials - HG 200

The HG 200 is a device manufactured by Brockhaus Measurements. It is a device determines the magnetic properties of hard magnetic materials and measures the procedure according to IEC 60404-5.

The...

magnetic field tester / for hard magnetic materials - HG 200

This rotor tester is intelligently designed for measurement of multipolar magnetized permanent magnet rotors and testing of field strength distributions. This unit also features adjustments for rotors that have different sizes. The variable number of hall sensors...

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