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Weight: 990 kg
Width: 1,190 mm
Height: 1,800 mm
The Hitachi NP6800 is a SEM-based dedicated probing system designed to meet the analytical needs of the 10-nm design node semiconductor device and beyond. The precision piezoelectric-driven actuator is equipped with X, Y and Z axes probe ...
Resolution: 0.1 nm
Weight: 159, 284 kg
Length: 1,024, 762 mm
... User-Friendly, High-Precision, 3-Axis Measurement As modern manufacturing technology becomes increasingly miniaturized and precise, highly accurate measurements are even more essential—not only along ...
... imaging (Nobel Prize for Chemistry 2014). The fully integrated STED (STimulated Emission Depletion) systems Leica TCS SP8 STED 3X and Leica TCS SP8 STED ONE meet the requirements of daily research and provide fast, ...
... laboratory applications, especially for cytology, haematology, and pathology. For special diagnostics requirements, the microscope is certified for in-vitro-diagnostics (IVD) like in-vitro-fertilization (IVF). Leica ...
Magnification: 10 unit - 1,000 unit
Length: 750 mm
Width: 700 mm
... routines with 3-axis CNC control. Large objects A generous 200 mm x 150 mm measurement capacity lets you measure a wide range of parts and components, and Hawk Duo’s class-leading Z-axis ...
... both cases. In the entry-level class, the M3 measurement software sets standards in intuitive operation and functionality. Should you have further demands on the programming and analysis possibilities, then our 3D ...
... handling with the highest measuring precision WM1 400 (300) CNC / WM1 400 (300) M3 CNC • SAPHIR measurement and analysis software or M3 measurement software • 3-axis ...
Weight: 17 kg
Length: 490 mm
Width: 251 mm
The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...
Nikon Metrology
Magnification: 50, 100, 200, 400 unit
Resolution: 1,000, 5,000 nm
Weight: 45 kg
... working distance PL L 5x/O.15 WD=4400mm PL L IOW030 WD=3400mm PL L 20W035 WD=3000mm PL L 40WO.35WD=30.OOmm Inclination from 00 to 450 Interpupillary distance 50mm-75mm Diopter adjustable ±5 Nosepiece Quadruple ...
Usage： INSPECT series measuring metallurgical microscope are widely used in semiconductor packages, solder pads, loop height, FPD panels (LCM), wafer level CSPS and so on. Features: ■ High-precision marble base, table ...
Resolution: 1 nm
Motorized Inverted Microscopes Zaber’s MVR microscopes lower the barriers to automated microscopy. Combining Zaber's precision motion control with world-class optics, these microscopes ...
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