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Nanosurf's easyScan series has gained worldwide popularity through its affordability, portability, and ease of use, with hundreds of systems currently in use.
Now its successor, the easyScan 2, unites these three unique characteristics with a fully modular system design. Whether you need a teaching tool, a training Scanning Probe Microscope, or a research instrument, what you need is what you get.
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AA2000 Scanning Probe Microscope
High Performance
Atomic-scale of resolution
Large sample size
With a DSP inside for great performance
Real time operating system embedded
Fast Ethernet connection with computer
Multi-Function
Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
Force Analysis: I-V Curve, I-Z Curve, Force Curve
Online real-time 3D image for better observation
Multi-channel signals for more sample details
Trace-Retrace scan, Back-Forward scan
Multi-Analysis: Granularity and Roughness
Data load-out for further analysis
Easy Operation
Fast automatically tip-engaging
Simple change the tip holder to switch between STM and AFM
Full digital control, auto system status recognition
Software-based sample movement
Nano-Movie function: Continuous data collection, storage and replay
Modularized design for convenience of maintenance and future upgrade
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Atomic Force Microscopes (AFMs) scan the surface of a sample using a very fine tip on the end of a microscale cantilever.
Atomic interactions between the tip and the surface lead to a deflection of the cantilever which is then detected by a piezoresistive element. Based on this effect, the AFM can measure the topography or roughness of a surface with very high resolution non destructively. The AFM can be used in different operating modes and thus allows for the investigation of further properties, such as electrical and magnetical forces or elasticity of a specimen.
topography measurement at very high resolution
automatic approach of the tip to the surface
sampling of surface areas by means of a piezoresistive elementcontact/non-contact mode
measurement of electrical and magnetic properties
measurement of lateral forces and elasticity1
measurement in liquids2
further operating modes upon request
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The Nanosurf Nanite extends Nanosurf's new and innovative AFM scanner design to work-intensive industrial applications. When time and throughput are of utmost importance, the automated Nanite system is your answer.
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The Mobile S atomic force microscope is a whole new way to look at atomic force microscopy. Mobility. Ease of use. Sleek design. Modern and well-integrated software. Unsurpassed support and reliability. And a price much lower than you'd pay for a comparable AFM system.
World's first battery-powered AFM!
Announcing a new dimension in atomic force microscopy: the Mobile S battery-powered AFM.
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The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale. With the MFP-3D Stand Alone (MFP-3D-SA) AFM, scientists can now choose a sensitive and precise AFM with the lowest noise performance that also includes a complete scientific software environment. The MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements. The MFP-3D has the flexibility to acquire your data, analyze it, and even make publication-ready graphics.
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Applicable wafer sizes: 200 / 300mm
Hitachi's wide-area AFM series features a fully automated inline metrology instrument that combines 3 applications in one tool:
- Wide-area surface profiling up to 25mm square
- High-accuracy scanning from 0.1 to 10µm square
- High-aspect-ratio structure 3D metrology by Hitachi's patented Step-InTM mode
The WA-1300 can operate fully automated like a CD-SEM. Recipes include automated wafer handling from cassette-to-cassette, global wafer alignment by pattern matching on optical microscope images, target addressing by on-tip-axis optical microscope and/or rough orientation AFM scanning, and the intended measurement. Fully automated tip replacement is also provided.
3D structure metrology
In Hitachi's patented Step-In mode, the AFM probe does not move in transverse direction so that no lateral force is applied to the tip. This enables the use of ultra-thin and high-aspect ratio probes like even carbon-nanotubes and guarantees a distortion-free, accurate imaging of all patterns such as lines, trenches and contact holes.
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- Ultra-High-Performance Closed-Loop Scanner for AFM/SPM
- Compact Manipulation Tool for Nanotechnology
- Resonant Frequency 9.8 kHz
- Ultra-High-Precision Capacitive Feedback
- Parallel-Motion Metrology for Highest Linearity and Stability
- 50 Picometers Resolution
- 5 x 5 x 5 µm Travel Range
- Very Small Package
- Rugged Piezo Stage design provides highest precision and lifetime.
Ultra-High-Performance Piezo Stage Scanner/Manipulator for Nanotechnology
The P-363 PicoCube® XY/XYZ is an ultra-high-performance closed-loop piezo scanning system. Designed for AFM, SPM and nanomanipulation applications, it combines an ultra-low inertia, high-speed XY/XYZ piezo scanner with non-contact, direct-measuring, parallel-metrology capacitive feedback capable of 50 picometers resolution. On top of being extremely precise, the PicoCube® system is also very small and rugged. Measuring only 30 x 30 x 40 mm (30 x 30 x 26 mm for XY version), it is easy to integrate in any scanning apparatus.
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Vector Series abrasive flow machines have been redesigned through a joint effort between Extrude Hone Corporation and its customers. Over three hundred existing machine customers were contacted to provide input concerning a new machine design. The customers were asked for suggestions concerning machine operation, ease of maintenance, ergonomics and safety. The result is an extremely flexible Vector Series that is capable of polishing large extrusion and forming dies, multiple workpieces at one time and production deburring. The working tabletop has been lowered and enlarged, to accommodate bulky and heavy components. The abrasive media cylinders can be provided in sizes ranging from 4 inch diameter to 12 inch diameter. The Vector and the Vector HP offer a choice of pressure ranges to meet specific production requirements. Another standard feature on the Vector Series is the touch screen operator interface terminal which simplifies all machine functions in both an automatic or manual mode. This machine can also be ordered with optional flow control.
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At the Heart of Extrude Hone
Extrude Hone patented the Abrasive Flow Machining (AFM) process in the 1960's as a method to deburr, polish and radius difficult-to-reach surfaces.
The typical AFM process (two-way flow) uses two vertically opposed cylinders which extrude an abrasive media back and forth through passages formed by the workpiece and tooling. Abrasive action occurs wherever the media enters and passes through the most restrictive passages. The extrusion pressure is controlled between 7-200 bar (100-3,000 psi), as well as the displacement per stroke and the number of reciprocating cycles.
One-way AFM systems flow the abrasive media through the workpiece in only one direction, allowing the media to exit freely from the part for fast processing, easy cleaning and simple quick-exchange tooling.
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With many years of experience we are focused on MicroStream® Abrasive Flow Machining (AFM), a leader in the field of surface finishing and edge contouring which has been designed developed and is manufactured and is marketed by Micro Technica®.
The MicroStream® Abrasive Flow Machining (AFM) system is a leader in the field of surface finishing and edge contouring. It attains surface improvements to previously unknown surface finishing's and is able to generate precision edge generation to, with other methods, inaccessible intersections.
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