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Applications
Universal and precise measurement of organic single and multilayer coatings
Performance features
- measurement of unknown layer materials
- measurement on any substrate with bearing capacity (wood, plastics, metal, etc.)
- measurement of single layer and multilayer coatings possible
- integrated microscope with precision vernier
Measuring principle
Wedge cut principle according to DIN 50 986, ISO 2808, ASTM D 4138, NF T 30-123
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Reflectance and thickness measurement systems for laboratory applications
ETA-SST is a system for measurement of spectral reflectance and layer thickness. Its small size and easy-to-use operating software make this system an excellent choice for laboratory applications and small-scale quality control procedures.
Thickness ragnge:
model 380-1050: 0.1 - 20 µm
model 850-1700: 1 - 30 µm
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21PlusTM is the ultimate measurement and control system and the highest performance gauging platform available to the industry. It incorporates the deep experience born of EGS’ CIMLine, Tracerlab, LFE, Soter and System 21 heritage and embeds it in a wholly new electronic package.
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