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The Vehicle Bus Analyzer Speaks Your Language
The Vehicle Bus Analyzer is the first conventional oscilloscope to decode CAN serial data into Symbolic (application layer) text. Now, for the first time, an engineer has both the full range of CAN protocol stack information-symbolic, hex, and electrical signal-and the ability to view additional in-circuit electrical signals (sensors and actuators, voltage levels, transients, etc.) that influence the CAN bus. In addition, up to four different CAN buses can be decoded at one time. Standard and specialized oscilloscope tools can be used to validate and debug designs.
Eliminate the Barriers to Fast Debug
Direct symbolic decoding and triggering allows fast and intuitive understanding of events. Simply load your existing DBC database file into the oscilloscope (no re-entry of data is required); capture CAN message traffic; and all electrical (signal), protocol (hex), and symbolic (application) layer information is quickly displayed on the oscilloscope screen. Use standard oscilloscope and specializedVehicle Bus Analyzer tools to find rare events, automatically measure and statistically analyze event timing, and graph/plot information, including extracted CAN message data.
Unique Measurement Tools
The VBA can make many measurements not possible with other instruments. Aside from timing measurements, the VBA can also extract CAN data from a CAN message stream, graphically plot that data on the oscilloscope display, and compare it to other electrical signals. Here, information on the steering angle and steering angle rate of change is extracted from the CAN message acquisition, rescaled to decimal values, and plotted as a time-correlated "Track" on the VBA display.
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Agilent network analyzers accurately characterize components by measuring their effect on the amplitude and phase of swept-frequency and swept-power test signals.
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NetSpector enables protocol analysis in switched networks from one central point. The network sniffer is modularly designed: Display unit and recording agent are separate and can be used at different locations.
The display unit is the user interface with which data recording is controlled and the recorded data are indicated. The recording agent is responsible for the actual recording (capturing). It is either installed on the same station on which the display unit was installed or – and this is the special feature – on a remote station.
The recording agent records network communication on the remote station and, when necessary, sends it to the indication station. The display unit can be run on the local workstation while the recording takes place remotely on a switch.
Real and local data flow can be recorded by targeted placement. The problematic effects of active components connected in between (routers, switches, bridges) are thus avoided.
NetSpector captures all frames from the start up. Each station participating in network communication is registered and added to a station list. From the station list you select the station to investigate and you create the frame list of the selected station. The colour labelling of the frames makes it easier for you to find individual frames. The frame you see fully decoded and in detail in the frame detail window. In addition it is also possible to display the frame content as hexadecimal and ASCII in the frame hex window.
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JDSU's proven family of Bus Doctor RX analyzers empowers computing, storage, silicon, and design engineers to simplify and accelerate the design and troubleshooting of serial and parallel buses used in electronics and computing products. Bus Doctor is unmatched in its flexibility and advanced analysis capabilities, including the industry's large trace buffers – twice the size of computing solutions – at 18.4 GBs and capable of capturing 256 million events bi-directionally with 4 nanosecond capture resolution. Trace capabilities are further extended through hardware-assisted features such as powerful cross-sequence triggering, extensive filtering options, advanced search capabilities, protocol-aware capture including automatic bus configuration, the ability to segment trace buffers, and accurate capture of specific bus events even across protocol domains. With Bus Doctor, engineers can quickly identify, locate, analyze, and resolve even the most complex issues faster and more accurately while significantly accelerating time-to-market.
With its modular architecture, the Bus Doctor becomes a dedicated analyzer for different bus types simply by changing out protocol pods and TAPs. In this way, users can leverage the Bus Doctor platform to extend their test tool budget across 13 serial and parallel buses, including SCSI, P-ATA, USB, SATA, Memory Card (MC), and PCI Express. With an additional logic analyzer probe, the Bus Doctor is effectively 14 distinct analysis tools in one.
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The Xgig® Analyzer offers a wide array of advanced analysis capabilities to enable users to achieve more robust product performance without sacrificing time-to-market. With its wide range of capabilities, including intelligent triggering, automated capture, and Xgig Expert analysis, troubleshooting time is reduced from hours to minutes.
Protocol Support:
* 1, 2, 4, 8 Gb/s Fibre Channel
* 1.0, 10 Gb/s Ethernet
* 10 Gb/s FCoE
* 1.5, 3.0, 6.0 Gb/s SAS/SATA
* 1, 2, 4, 8 Gb/s Fibre Channel
Function Support:
* Analyzer
* BERT
* Load Tester
* Jammer / Error Injector
* Target Emulation and Traffic Generation
* Compliance Test
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The AP-4000 captures the wireless signals between a base-station and a mobile terminal and analyzes the protocols. With its excellent analysis capabilities, AP-4000 is the perfect partner for interoperability testing.
- 3GPP FDD Compliant
- Analysis of UP Link and DOWN Link
- Analysis of Protocol Layers 1.2 and 3
- Analysis of C-P-lane RRC/NAS decode
- Analysis of U-Plane IPv4 Header/H245 PCAP Format Export
- Automatic Trace Mode using RRC message feedback
- Cell Search function
- MS Selection
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PCI Express® Protocol Analyzers and Exercisers
The extensive PCI Express test equipment family from LeCroy includes expert analysis systems designed to meet your PCI Express needs. The PETracer ML system supports lane widths up to x8, while our most advanced systems, the PETracer EML and Summit Gen2, support up to 16 lanes with trace memory of 8 GB. The new PETracer Summit Gen2 is the first analyzer to support PCI Express Spec 2.0 (Gen2) traffic at 5 Gb/s per lane.
SAS/SATA Protocol Analyzers and Exercisers
Analyzers and exercisers from LeCroy for Serial Attached SCSI (SAS) and Serial ATA (SATA) deliver the power, flexibility, and features you need. The SASTracer Analyzer and SASTrainer Exerciser support both SAS and SATA traffic at speeds up to 3 Gb/s, while the SATracer Analyzer and the SATrainer Exerciser offer lower-cost solutions dedicated to SATA.
USB Protocol Analyzers and Exercisers
LeCroy provides a comprehensive range of solutions for all USB data rates, including Hi-speed (480 Mb/s), Full-speed (12 Mb/s), and Low-speed (1.5 Mb/s). The development tools provide a variety of solutions from the high portability of the USBMobile HS Analyzer to the powerful, flexible, and upgradable USBTracer/Trainer Analyzer and Exerciser System.
Fibre Channel Protocol Analyzer System
The LeCroy FCTracer 4G Analyzer supports all Fibre Channel data rates up to 4 Gb/s. The FCTracer supports up to four channels (two full-duplex links), and allows cascading of multiple analyzers to provide a synchronized display of up to 16 links for testing of switches and similar multi-port devices. Interchangeable plug-in modules support easy expansion and upgrading of the system.
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Exceptional Tools for Serial Data Analysis
The LeCroy SDA family of products, built on the world's fastest Real-time Oscilloscope architecture, delivers outstanding real-time measurement solutions for signals with data rates up to 10 Gb/s and combines the analysis capability of several different classes of equipment in one single-box solution.
The SDA 18000 serial data analyzer is a true breakthrough in signal analysis. It delivers the industry's highest bandwidth — 18 GHz — as well as a combined highest sampling rate of 60 GS/s and longest memory of up to 150 million points available in a real-time test instrument.
Serial Data Analyzer
Based on the industry's most advanced digital oscilloscope platform, the SDA 18000 is a 4-channel real-time analyzer that offers outstanding analysis capability, accurate jitter analysis, and pristine signal fidelity up to 10 Gb/s data rate. The SDA 9000 serial data analyzer delivers 9 GHz analog front end bandwidth with up to 40 GS/s and memory depths up to 100 Mpts/channel.
With Serial data - both optical and electrical - being a dominant form of data transmission, fast and accurate analysis becomes a top priority. LeCroy offers a complete set of measurement tools for serial data analysis by providing exceptional vertical market solutions at the physical layers and at the protocol level.
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X-Strata980 for analysis of trace elements and coating thickness
Combining a high power X-ray tube and high resolution detector, the X-Strata980 X-ray Fluorescence analyzer delivers limits of detection in single digit ppms!
Oxford Instruments offers a full range of instruments dedicated to the electronics manufacturing industry. Our XRF instruments are available in different configurations; for RoHS compliance screening and testing. Please contact us to find out about the wide variety of solutions offered.
Key Applications:
Trace analysis of hazardous substances
Solder alloy analysis
Coating thickness measurement of gold and palladium on electronics
Metal alloy chemistry identification
Coating thickness measurement on jewelry
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Features:
Thick800 is specially designed for rapid and non-destructive detection of plating thickness and elemental analysis. Thick800 adopts best lightening structure, 3-D movable sample platform and laser positioning system, which enable the point-by-point detection of plating thickness and elemental content on large-size sample.The up-and-down movable glass shield helps to prevent the radiation of X-Rays away from operator.
Technical Specifications:
Analysis Range: Element K~U.
Multiple layers are able to be analyzed simultaneously.
The accurate of thickness measurement is 10nm.
More than 5 layers can be analyzed simultaneously.
Independent matrix effect correction models.
Most advanced thickness analysis recipes.
Repeatability is up to 10nm.
Long-period Working Stability and feasibility is lower than 10nm.
Configurations:
Open sample chamber
3-D movement is realized by 2-D movable platform and up-and-down movement of detector and x-ray tube.
Double-laser positioning system.
Automatic collimator switch
Glass shield cap
Electronic circuit for signal detection
High and low voltage power supply
Electro-cooling Si-Pin semiconductor detector instead of liquid nitrogen cooling ones
X-ray tube
PC and ink-jet printer
Sample chamber: 20X14X5In (517mmx352mmx150mm)
Machine Dimension: 26X19X21In (648mmx490mmx544mm)
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kajaaniALKALi™ Alkali Analyzer
The kajaaniALKALi™ Alkali Analyzer is an automatic titrator system that provides accurate and repeatable analysis of green, causticized and white liquor for optimizing alkali dosage to the digester. The kajaaniALKALi measures the absolute values of Sodium Hydroxide, Sodium Sulfide, and Sodium Carbonate, and calculates Effective Alkali (EA), Active Alkali (AA), Total Titratable Alkali (TTA), Causticizing Degree (CE%), and Sulfidity (S%).
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Powerful tool for improving laser-via-hole as well as drilled-hole PWB processes.
To 100% inspection of drilled-hole enabled by high-speed inspection
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Accuracy remained and shortened inspection time sharply. (HS)
Powerful tool for improving laser-via-hole as well as drilled-hole PWB processes. (HA/HT)
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APPLICATION
Coating Thickness Analyzer is a tool for precise and accurate XRF measurement of various metallic and non-metallic coatings thickness (anticorrosive, insulating, antioxidizing, waterproof, pipe coating, etc.). Base/coating components are elements from Mg to U. System is applicable for control and monitoring of industrial processes.
FEATURES
- Automatic choice of coating thickness evaluation method for optimization of relative error of measurements,
- Remote control of analyzer electronics and software by ETHERNET interface from Workstation Device and communications with OPC server,
very simple and convenient operation and service,
- Possibility to install the measurement block under and above the measured material,
- built-in industrial computer.
For additional information, please contact us: XRF@bruker-baltic.lv
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Years of development and attention to customer needs have made Thermo Scientific Niton alloy analyzers the first choice in XRF technology, bringing lab-quality elemental analysis wherever it is needed in a field-hardened package. Now, in addition to superior positive grade identification and composition analysis of alloy/metal coatings and substrates, the Niton® XL3t offers the benefit of our coating thickness/coating weight measurement technology - providing an "out-of-the-box" nondestructive solution for gauging the effectiveness of coating and plating systems.
Fast and easy-to-use, the Niton XL3t 800 not only performs at line and plating bath solution analysis, but provides more accurate measurements than non-XRF technologies such as eddy current, magnetic induction, and Beta backscatter. You get precise, nondestructive multilayer coating thickness results in seconds. Testing at the plating line both increases productivity and improves process efficiency - no more over-coating or under-coating. What's more, the Niton XL3t is your answer to measuring large or irregularly shaped samples, as well as small-diameter wiring or tubing. Cutting samples for benchtop analysis are a thing of the past.
Typical applications are:
-Galvanized zinc over steel
-Zinc or zinc alloy over steel
-Hard chrome over steel
-Electroless nickel over steel
-Chrome/nickel/copper over steel, Zamak™ or plastic
-DACROMET™ coating over steel
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The Electrokinetic Analyzer for Solid Surface Analysis SurPASS
Use the SurPASS electrokinetic analyzer to investigate the zeta potential of macroscopic solids based on the streaming potential and streaming current method. The zeta potential is related to the surface charge at a solid/liquid interface and is a powerful indicator for the surface chemistry (pH titration) and liquid phase adsorption processes. The SurPASS helps you to understand and improve surface properties and to develop new specialized materials.
An indispensable contribution to solid surface analysis
* High sensitivity for detecting small changes in the surface properties
* Easy access to information on surface charge and related properties
From tiny particles to large wafers
* Different measuring cells for flexible sample mounting
* Cylindrical Cell for powders (min. particle size 25 µm) and fibers
* Clamping Cell for non-destructive measurement of planar solids
* Adjustable Gap Cell for small samples (20 mm x 10 mm)
Save time, reduce downtime
* Quick exchange of measuring cells
* Update of measured parameters every second
* Intuitive software with well-known Microsoft Windows® features
Fully automated measurements
* Automated measuring procedures requiring little manual interaction
* Integrated titration unit gives you fully automated adjustment of pH and additive concentration
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Micromeritics' ASAP 2050 Xtended Pressure Sorption Analyzer (xPSA) is an easy-to-use instrument capable of collecting adsorption data in an elevated-pressure environment. The instrument is designed to characterize zeolites and novel new materials such as metal organic frameworks (MOF) and other crystalline materials used in PSA processes. Rapidly obtained isotherms using a wide range of gases and the heat of adsorption are routinely determined from this characterization.
The ASAP 2050 analysis manifold is equipped with a pressure transducer capable of operating from vacuum to 10 atmospheres. The instrument may be used with a large variety of gases including: methane, ethane, ethylene, propane, propylene, butane, carbon dioxide, carbon monoxide, nitrogen, oxygen, argon, and nitrous oxide. Retaining many design elements of Micromeritics’ popular ASAP 2020, the ASAP 2050 includes two independent vacuum systems that allow simultaneous preparation of two samples and analysis of another. Sample preparation and analysis can occur concurrently without interruption and without the risk of cross-contamination.
In addition to controlling the instrument’s operation, powerful Windows® software also reduces the raw data collected during the analysis. An interactive reporting system includes an extremely versatile graphic user interface for custom presentation of results. The standard ASAP 2050 system offers a wide variety of reports, including DFT (Density Functional Theory), BET surface area, pore size distributions, and isotherm cycling.
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Micromeritics’ low cost Gemini VII 2390 Series surface area analyzers utilize a patented twin-tube design to produce fast, accurate, and repeatable surface area and porosity results. An ideal tool for teaching, research, and quality control environments, the Gemini VII permits low to high surface area measurements without requiring exotic gases such as argon or krypton.
Three model options are available. The Gemini VII 2390a provides standard methods for: single-point and multipoint BET and Langmuir surface areas, total pore volume, micropore analysis by the t-method, and much more. The Gemini VII 2390p provides additional precision with the addition of a saturation pressure tube and is designed to provide a rapid measurement of the adsorption isotherm. The Gemini VII 2390t has all the capability of the 2390p with the additional ability to perform a BJH or Dollimore-Heal pore size distribution using both adsorption and desorption isotherms of up to 1000 points.
All models can be operated stand alone or connected to a computer running Micromeritics’ Gemini VII Windows® software. The Windows version includes easy-to-follow installation videos and system verification tests to ensure optimum performance and reliability. How-to videos provide on-screen instruction on instrument operation.
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Micromeritics introduces the TriStar II 3020, a fully automated, three-station surface area and porosity analyzer capable of increasing the speed and efficiency of quality control analyses, with the accuracy, resolution, and data reduction to meet most research requirements. The three analysis ports operate simultaneously and independently of one another. For additional throughput, four TriStars can be operated with one computer. The speed and accuracy of the Tristar II make it an ideal instrument for a wide variety of applications that include pharmaceuticals, catalysts, carbon, cosmetics, paints, pigments, geoscience, fuel cells, high-tech ceramics, and much more.
The new TriStar II features a dedicated Po port, allowing the measurement of saturation pressure on a continuous basis. A 2.75-liter Dewar and extended length sample tubes allow complete adsorption and desorption isotherms to be collected without operator intervention. The TriStar II can collect up to 1000 data points. Fine details of the isotherm can be observed and recorded providing high resolution and revealing pore structure details. The instrument also features a krypton option, allowing precise measurements in the very low surface area range.
The TriStar II also combines versatility in analysis methods, data reduction, and reporting to allow the user to optimize analyses to specific applications. Reports include adsorption and desorption isotherms, BET surface area, mesopore pore size and area distributions, Statistical Process Control (SPC), new isotherm and thickness models, isosteric heat of adsorption, and integrated DFT models.
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