With the 3D Roughness Reconstruction application, the Phenom
G2 pro desktop scanning electron microscope (SEM) is able to generate 3D images and submicrometer roughness measurements.
This fully automated application for the Phenom G2 pro desktop SEM will help to communicate imaging results and will extract and visualize data normally hidden within a sample.
3D
3D imaging ...
Better, Faster Fiber Analysis
Now, direct observation and measurement of micro and
nano fibers is faster, better and easier than ever before, with
the improved Fibermetric application.
In combination with the Phenom™ G2 pro desktop scanning electron microscope, the Fibermetric application allows you to produce accurate size information from micro and ...
The Phenom G2 pure is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom G2 pure is equipped with the basic components for meeting imaging needs.
The Phenom G2 pure provides high-quality images while using basic features, ...
The next generation TM3000 Tabletop microscope builds on the success of its predecessor, the TM-1000, and offers significantly improved performance, including magnification up to 30,000x and better resolution, in a unit that occupies 20% less space and has an energy saving design. The new TM3000 is a tabletop variable ...
The new HT7700 120 kV transmission electron microscope is designed for bio-medical research and R&D for pharmaceutical, advanced materials and nanotechnology. The revolutionary HT7700 is optimized for high contrast imaging at low electron doses and is set to make life much easier for microscopists with 100% integration of all functions into the graphical user interface. The HT7700 features a unique, ...
The SU70 large chamber analytical field emission scanning electron microscope features a unique dual mode objective lens coupled with high probe current from a new Schottky emission electron gun allowing incredibly fast, stable analysis.The dual electron-optical modes: High Resolution ...
MERLIN™
Analytical Power for the Sub-Nanometer World
-Nano Analytics
-Total Information
-Ease of Use
-Future Assured
MERLIN™ - analysis and high resolution in one
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical ...
The answer to modern nano science challenges is the unique GEMINI® field emission SEM column, a sophisticated solution recognised by microscopists worldwide as the leader. The new SUPRA™ series, based on the 3rd generation GEMINI® ...
The ULTRA FESEM, based on the SUPRA%uF0D4 FESEM comprises a high efficiency, ultra high resolution In-column EsB detector which enables nano-scale compositional BSE imaging. ...
LVEM 5 is an electron microscope in transmission which combines image high resolution and ...
MTII recently acquired the Fullam brand of miniature tensile, compression and bend testing machines specifically designed for use in Scanning Electron Microscopes (SEMs), Atomic Force Microscopes (AFMs) and Light Microscopes (LMs). The dual ...
The MOM Computer System and Software (MCS) is the software package MScan. This program has been designed to seamlessly control two-photon imaging, photostimulation and electrophysiology. While designed exclusively for use with the MOM, it is also compatible with other two-photon platforms. MOM microspcoe. MCS ...
The BRR™, a fully integrated SEM/AFM
A fully integrated SEM / AFM combination tool for routine measurements. A single software interface enables AFM and SEM operation as well as combination ...
The JSM-6701F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures. Featuring a conical FE gun and a semi-in-lens ...
The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest ...
The JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large, 5-axis, fully ...
Photoemission Electron Microscopy (PEEM) is an extremely powerful imaging technique, whose versatility for topographical, chemical and magnetic contrast imaging at high resolution ...
The MULTISCAN LAB is the ultimate tool for the in-situ combination of various surface analysis techniques - simultaneously and on the very same sample spot. It is designed to combine ...
The E3620 is a Scanning Electron Microscope (SEM)-based Critical Dimension (CD) measurement system for photomasks.
This CD SEM metrology system was designed specifically for 45nm technology node production and 32nm process development.
Its proprietary technology, ...
The EBM powers E-Beam Columns in Scanning Electron
Microscopes providing acceleration, bias and filament
sources in a single compact package. Spellman's proprietary HV packaging and encapsulation ...
Every ProtoCOL system comes with the new ProtoCOL 2 software. This software brings advanced levels of control and ...
