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Electron microscopes
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Resolution: 0.3 nm - 1.5 nm
Weight: 500 g
Sample preparation for TEM and STEM imaging or atom probe tomography. Easy to use with advanced automation. Capable of high quality subsurface 3D characterization. FIB sample preparation The new Thermo ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 2,000,000 unit
Resolution: 2, 10, 3 nm
Tabletop field emission gun scanning electron microscope for high quality imaging across disciplines. Field emission gun scanning electron microscope The Thermo Scientific ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Resolution: 0.6, 1.2, 0.7, 1 nm
... beam scanning electron microscope for TEM sample preparation including 3D characterization, cross-sectioning and micromachining. The Thermo Scientific Helios 5 Plasma FIB (PFIB) DualBeam ...
THERMO FISHER SCIENTIFIC - MATERIALS SCIENCE
Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm
... SU9000 utilizes an ultra-stable side-entry sample stage similar to high-end TEM systems and incorporates optimized vibration damping and a closed cabinet to shield the electron optics from environmental noise.
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted ...
Hitachi High-Tech Europe GmbH
In an industrial quality, failure analysis, or research environment, the scanning electron microscope (SEM) is the solution of choice for metallography and failure analysis applications, due to its ability ...
DIGITAL MICROSCOPE FOR AUTOMATIC BRINELL MEASUREMENTS ISO 6506 - ASTM E10 Electronic microscope for automatic Brinell indentation measurement with a ball of Ø 2.5 or 5 or 10 mm •User friendly and compact •Auto ...
Magnification: 300,000 unit
Resolution: 3, 4, 8 nm
Weight: 480 kg
... scanning electron microscope. It has excellent image quality, low vacuum mode compatibility, high resolution images in different fields of view. The depth of field is large and the image is rich in stereo. Extended ...
CIQTEK Co., Ltd.
Magnification: 1 unit - 2,500,000 unit
Resolution: 1, 1.5, 0.8 nm
Weight: 950 kg
CIQTEK SEM5000 is a high-resolution, feature-rich field emission scanning electron microscope (FE-SEM, FEG SEM). Advanced column design, high voltage tunneling technology (SuperTunnel), low aberration ...
CIQTEK Co., Ltd.
Resolution: 0.9, 2.5 nm
CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. With the three-stage ...
CIQTEK Co., Ltd.
... your SEM insights Increase your FIB sample throughput Experience best 3D resolution in your FIB-SEM analysis Maximize Your SEM Insights Extract true sample information from your high ...
ZEISS Métrologie industrielle
... Omega energy filter, a side-entry liquid nitrogen cooling stage and an automated specimen exchange system, is a cryo-electron microscope (cryo-EM) that enables observation of bio-molecules at cryo-temperature. ...
Jeol
Resolution: 20 nm
... Scanning Electron Microscope (SEM), PEEM directly images surface areas emitting photoelectrons in real-time, without scanning. Electron emission from surfaces can be caused in various ...
Video Toolmaker Microscope(Standard) Usage Video toolmaker microscope is a photoelectric measuring system of high precision and efficiency. This video toolmaker Microscope is widely ...
To identify the smallest and most subtle defects in leading-edge packaged microelectronic applications, ECHO VS includes standard features such as heated water for optimum acoustic coupling, Flexible TAMI for efficient capture of the ...
Magnification: 1,000,000 unit
Resolution: 3 nm
... Scanning Electron Microscope(SEM). It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material ...
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