An ellipsometer is a surface analytical device which measures changes in light polarization both before and after a beam is reflected from the surface to be analyzed.
Ellipsometers are used in the optical, metallurgical and microelectronics industries to measure the thickness of surface coatings, to analyze protective coatings, to measure surface roughness, etc.
The principal types of ellipsometer are spectroscopic models, which use a broad-band light source, and laser models using a monochromatic light source.
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Single-wavelength ellipsometer (laser) 632.8 nm Angstrom Advanced
The PHE101 is the latest discrete wavelength ellipsometer with many new features, such as materials library, widest variable angle, a second laser for alignment and very...
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Imaging ellipsometer 658 nm, 38 – 90° | nanofilm_ep3sw Accurion GmbH
The next step forward in Imaging Ellipsometry with the nanofilm_ep3sw. The Single Wavelength nanofilm_ep3sw.is a powerful system to get started with Imaging Ellipsometry. Imaging allows you to have a direct view on the sample! You'll see a direct image of your sample from the CCD-camera. This image already...
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Ellipsometer LEOI-44 Lambda Scientific Pty Ltd
Features Ideal for Demo Observing Polarized Reflection Measuring Refractive Index Determining Polarization Change Introduction This is a manually operated experimental demonstrator of ellipsometry. An input...
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Ellipsometry is an optical technique for analyzing surfaces. It is founded on the light polarization state change, after reflection on a plane surface of a sample. A set of materials has been designed to introduce the principles and applications of...
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Spectroscopic ellipsometer omt-optische messtechnik
Spectroscopic ellipsometry is a powerful tool for thin film metrology. omt implements this method in an easy-to-use system with an advanced modular optical and mechanical...
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Spectroscopic ellipsometer 145 - 2100 nm | UVISEL HORIBA Jobin Yvon
High Precision R&D Spectroscopic Ellipsometer The UVISEL ellipsometer range offers the best combination of modularity and performance...
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Spectroscopic ellipsometer M-2000 J.A. Woollam Co.
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data...
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Single-wavelength ellipsometer (laser) Jasco
Ellipsometry is a method for determining the refractive index and extinction coefficients of a sample by measuring the change in polarization state...
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Spectroscopic ellipsometer SpecEl-2000-VIS Ocean Optics
The SpecEl-2000-VIS Ellipsometer measures polarized light reflected from the surface of a substrate to determine the thickness and refractive index of the material as a function of wavelength. The SpecEl is controlled...
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Spectroscopic ellipsometer 439L633P Rudolph Instruments Inc
The 439L633P Manual Ellipsometer is an advanced optical instrument. It measures the change...
