FE-SEM

15 Industrial products | 3 Companies
 
 
Hitachi High-Technologies Europe
Analytical field emission scanning electron microscope (FE-SEM)  SU70 Hitachi High-Technologies Europe

The SU70 large chamber analytical field emission scanning electron microscope features a unique dual mode objective lens coupled with high probe current from a new Schottky emission electron gun allowing incredibly fast, stable analysis.The dual electron-optical modes: High Resolution ...

Ultra high resolution field emission scanning electron microscope (FE-SEM)  SU8000 Family Hitachi High-Technologies Europe

The SU8000 family of ultra high resolution FESEMs features a common, high performance electron optical platform to provide excellent imaging performance, with a choice of stages, chambers and signal detection systems to meet the wide variety of customer-specific needs for ultra high resolution microscopy.

A high brightness cold cathode field emission source is used together with Hitachi's ...

Variable pressure analytical field emission scanning electron microscope (VP FE-SEM)  SU6600 Hitachi High-Technologies Europe

Hitachi's SU6600 is a versatile Field Emission SEM for a diversified range of applications including imaging and analysis of advanced materials which have become increasingly important for modern science and engineering. It utilizes advanced Variable ...

Carl Zeiss Nano Technology Systems
Analytical field emission scanning electron microscope (FE-SEM)  MERLIN Carl Zeiss Nano Technology Systems

MERLIN™
Analytical Power for the Sub-Nanometer World

-Nano Analytics
-Total Information
-Ease of Use
-Future Assured

MERLIN™ - analysis and high resolution in one
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical ...

Field emission scanning electron microscope (FE-SEM)  SUPRA Carl Zeiss Nano Technology Systems

The answer to modern nano science challenges is the unique GEMINI® field emission SEM column, a sophisticated solution recognised by microscopists worldwide as the leader. The new SUPRA™ series, based on the 3rd generation GEMINI® ...

Field emission scanning electron microscope (FE-SEM) with EsB (in-column)  ULTRA Carl Zeiss Nano Technology Systems

The ULTRA FESEM, based on the SUPRA%uF0D4 FESEM comprises a high efficiency, ultra high resolution In-column EsB detector which enables nano-scale compositional BSE imaging. ...

Jeol
Analytical field emission scanning electron microscope (FE-SEM)  JSM-6701F Jeol

The JSM-6701F is a field emission scanning electron microscope (FESEM) incorporating a cold cathode field emission gun, ultra high vacuum, and sophisticated digital technologies for high resolution high quality imaging of micro structures. Featuring a conical FE gun and a semi-in-lens ...

Analytical field emission scanning electron microscope (FE-SEM)  JSM-7500F Jeol

The JSM-7500F is an analytical Field Emission SEM featuring enhanced performance, ease of operation, and energy efficiency. The JSM-7500F offers the highest resolution at the lowest ...

Analytical field emission scanning electron microscope (FE-SEM)  JSM-7001F Jeol

The JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. The JSM-7001F has a large, 5-axis, fully ...

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