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electron microscope / SEM / for analysis / digital camera
electron microscope
ZEISS SIGMA

The SIGMA FE-SEM (Field Emission Scanning Electron Microscopes) is a series of advanced microscopes used in detecting electrons. It comes with an ...

scanning electron microscope / for analysis / 3D / computerized
scanning electron microscope
SU5000

Resolution: 2 nm

... and area beyond our imagination. The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers ...

electron microscope / for analysis / ultra-high resolution / digital camera
electron microscope
SU-70

Resolution: 1 nm - 1.6 nm

When it comes to ultra-high resolution and analysis, this item provides sophisticated performance and is unmatched, being regarded as the newest versatile solution, designed for analytical purposes and for use in combination with ample ...

electron microscope / for analysis / digital camera / FE-SEM
electron microscope
S-3700N

Resolution: 3 nm - 10 nm

The Hitachi S-3700N is a tungsten unit that has a larger chamber and is extremely versatile. This can measure samples of 300mm in size or smaller and has an observable area of 203mm in diameter. It uses analysis features on samples ...

scanning electron microscope / laboratory / digital camera / compact
scanning electron microscope
U9320A 8500

Magnification: 250 unit - 200000 unit

The compact Agilent 8500 FE-SEM system is a field emission scanning electron microscope (FE-SEM) that has been improved to provide features ...

scanning electron microscope / for analysis / high-resolution / high-speed
scanning electron microscope
JSM-7800F Prime

Resolution: 0.7, 3 nm

JSM-7800F Prime delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from ...

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Jeol
scanning electron microscope / for analysis / ultra-high resolution / digital camera
scanning electron microscope
JSM-7610F

Resolution: 3, 1, 1.3 nm

The Schottky Field Emission Scanning Electron Microscope model JSM-7610F manufactured by JEOL features a high power optics enabling an effective throughput and quality performance that is attributed by ...

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Jeol
electron microscope / for analysis / digital camera / FE-SEM
electron microscope
LT NANOPROBE

Resolution: 30 nm

... class of analytical instrumentation that merges SEM navigated nano-probing at LHe temperatures with high performance STM imaging, spectroscopy and manipulation. Four Independent Scanning Tunnelling Microscopes Excellent ...