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Resolution: 1 nm - 1.3 nm
The SU8010 is an entry level yet outstanding innovation that provides high performance classic cold field emission. It incorporates Hitachi's ultra-high-resolution semi-in lens electron with the Super-ExB filter and upper detector above ...
Resolution: 2 nm
... and area beyond our imagination. The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers ...
Resolution: 1 nm - 1.6 nm
When it comes to ultra-high resolution and analysis, this item provides sophisticated performance and is unmatched, being regarded as the newest versatile solution, designed for analytical purposes and for use in combination with ample ...
Resolution: 3 nm - 10 nm
The Hitachi S-3700N is a tungsten unit that has a larger chamber and is extremely versatile. This can measure samples of 300mm in size or smaller and has an observable area of 203mm in diameter. It uses analysis features on samples ...
Zeiss Merlin provides analytical capabilities for the sub-nanometer world. Merlin with the GEMINI II column is a combination of super fast analytics, high resolution imaging with excellent detection capabilities, and a future-proof flexibility ...
The SIGMA FE-SEM (Field Emission Scanning Electron Microscopes) is a series of advanced microscopes used in detecting electrons. It comes with an ...
Resolution: 30 nm
... class of analytical instrumentation that merges SEM navigated nano-probing at LHe temperatures with high performance STM imaging, spectroscopy and manipulation. Four Independent Scanning Tunnelling Microscopes Excellent ...
Resolution: 0.7, 3 nm
JSM-7800F Prime delivers the world's best resolution with the incorporation of the newly-developed, super-high resolution Gentle Beam (GBSH). In addition, the maximum probe current of the In-lens Schottky Plus gun has been increased from ...
Jeol
Resolution: 1, 1.3, 3 nm
The Schottky Field Emission Scanning Electron Microscope model JSM-7610F manufactured by JEOL features a high power optics enabling an effective throughput and quality performance that is attributed by the aperture angle ...
Jeol
Magnification: 250 unit - 200000 unit
The compact Agilent 8500 FE-SEM system is a field emission scanning electron microscope (FE-SEM) that has been improved to provide features commonly ...
Resolution: 1 nm
Magnification: 1000000 unit
FE-SEM was also developed for the first time in Korea by name of Seron Technology On Going CE Certificates FE-SEM was also developed in Korea by name of Seron Technologies ...