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N8 ARGOS
N8 ARGOSAFM / SPM the easy way
The N8 ARGOS is a compact and highly rigid stand for the NANOS AFM/SPM system. Equipped with a ultra precision vertical stage the AFM is approached with nanometer accuracy. Sophisticated algorithms provide a smooth and gentle probe approach. Accidental tip to sample contacts in non - contact measurement approaches belong to the past. Unique sliding X - Y stages provide the highest possible rigidity.
The stages are made of granite, a material with superior thermal behavior. Driven by high precision micrometer screws an exact positioning of the sample is provided. After reaching the measuring position on the sample the stage can be completely decoupled from the driving micrometer screws by simply turning them a few micrometers back. Thus, the granite stage elements are in direct contact over the entire running surface. This explains the superior drift - free behavior of this proprietary design. The straightforward, yet vibration insensitive stand provides the ideal setup for high accuracy AFM/SPM measurements down to a true atomic level.
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Ultra-high resolution microscopy places special demands on the equipment used to capture new information and reveal the secrets of the Nano-world.
The new S-5500 meets these with proven technology, combining high resolution and easy, reliable operation.
The S-5500 boasts a host of features and details, all designed to make high resolution microscopy and analysis that much easier
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The Hitachi S-4800 is a truly versatile platform comprising impressive high resolution performance, advanced detection technology, and a user interface that makes it possible to capture even the most short lived moments accurately and clearly.
It employs a semi-in-lens design for large sample accommodation while achieving ultra-high resolution comparable to performance only available with in-lens UHR SEMs.
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The MicroTime 100 time-resolved microscope contains the complete optics and electronics for recording fluorescence decays in small volumes by means of Time-Correlated Single Photon Counting (TCSPC). The system is based on a conventional upright microscope body. With the MicroTime 100, decay times down to some picoseconds can be resolved. The system allows operation at laser repetition rates as high as 84 MHz and count rates up to several million counts/sec. An optional piezo scanner can be used for 2D imaging e.g. for Fluorescence Lifetime Imaging (FLIM)
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This stage with a 15 cm movable granite object table and a positioning accuracy of 100 nm is the ideal solution for fully automated routine measurements, and gives the highest AFM measurement stability. With the push of a button, you can switch between a high resolution, conventional microscope with DIC function and the AFM scanner, thus combining a quick visual control with a high resolution AFM measurement. The repositioning problems of working with more examination methods are totally eliminated. Upon request, we can include other measuring equipment also.
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The LEAP Si™ Metrology System is a high-performance atom probe microscope providing 3D, atomic resolution, compositional imaging and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. The LEAP Si employs patented innovations that unlock the power of the 3D atom probe to address previously unsolved measurement challenges in semiconductors, material science, and nanomagnetics. Key features include: largest field of view, highest data rate, excellent mass resolution, and simplified sample preparation using microtip arrays. With the LEAP Si measurements that would have taken months, or been completely impossible, can be accomplished in a matter of hours.
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Revolutionary automatic axis-aligment fucntions (Auto Beam Setting, Auto Axial Aligment, ect.)
Even better resolution of 10nm at 3kV
Real time, dual image display and signal mixing
5-axis motorized stage with high tilt (-20 ~ +90 deg.) a tall sample up to 80mm high applicable (Type 2)
Analytical specimen chamber with optimum geometry for simultaneous accommodation with EDS, WDS and EBSD
Saving floor space and electric power consumption due to TMP evacuation system
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It features a flexible input lens system that collects a large acceptance angle from a well defined analysis area. This allows on the one hand to achieve extreme good countrates from large analysis areas, and thus the fast and time efficient collection of spectral information. On the other hand, the size of the analysis area can be reduced by an aperture to below 60µm diameter, which then allows dedicated small spot analysis of selected areas of interest. The hemispherical analyser is based on the EA 125 concept, which is known for its excellent energy resolution and low background noise.
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The Hitachi Tabletop Microscope is the perfect imaging platform for any Light Microscope lab needing higher resolution and deeper focus depth. Requiring no electron microscopical technical skills or sample preparation techniques, the TM-1000 can be used by anyone able to use a digital camera. It's that easy!
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JEOL has played a leading role in the development and evolution of scanning electron microscopy since the early 1960s. Over the past five decades, the SEM has become an indispensable tool in both advanced research and routine analysis for science and industry. JEOL has installed more than 8000 SEMs worldwide.
SEMs are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology has been developed to help researchers to see the structures they make. More and more failure analysis, pathology, forensic, metallurgical and environmental labs are replacing traditional optical microscopes with SEMs.
As the range of applications for the SEM grows -- and as new discoveries require higher resolutions and greater versatility -- JEOL keeps pace with new technology that enables the SEM user to produce unprecedented images of the microscopic and nanometric world.
Our SEM product line is comprised of four categories differentiated by resolution and configuration:
Conventional Tungsten High Vacuum SEMs: ideal for failure analysis, inspection, and characterization.
Conventional Tungsten Low Vacuum SEMs: for imaging and X-ray analysis of wet, nonconductive, unprepared samples.
Conventional Thermal Field Emission SEMs: field emission source provides higher resolution; high stability and high current in a small spot size and generates high x-ray fluxes for chemical analysis at high resolution conditions.
Semi-in-Lens Cold Cathode Field Emission SEMs: highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.
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As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.
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The in-situ combination of STM, SEM and SAM for high resolution structural and chemical analysis creates a superior research tool. Atomic resolution STM is ideally complemented by the abilities of the SEM to image large surface areas, help to identify areas of interest, and finally assist the precise positioning of the STM tip to the desired spot on the surface.
The MULTISCAN LAB employs the goniometer mounted MULTISCAN STM as an ideal base for such dedicated experiments. The highly stable UHV chamber (30mm wall thickness) together with a rigid system frame and vibration isolation by a pneumatic auto-levelling damping system ensures both optimal STM and SEM performance.
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The LEAP HR is a high-performance atom probe microscope providing atomic resolution, 3D compositional imaging, and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. Each ion is analyzed by measuring the time of flight to the detector through an energy-compensated time-of-flight mass spectrometer. The LEAP HR employs patented innovations that provide best in class mass resolution while simultaneously enabling a large field of view (> 150 nm). This combination of high mass resolution with large field of view provides breakthrough capability for advanced materials applications. The large field of view enables the material’s atomic scale features to be understood in the context of the larger scale nanostructure. High mass resolution permits narrowly separated mass peaks to be differentiated, ensuring accurate compositional information.
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The Scanning probe Microscope (SPM) was developed during the 1980s and is now an indispensable tool for the direct high resolution study of surfaces and surface forces. Starting with the scanning tunneling microscope in 1981, the technique was broadened to atomic force microscopy including contact, non-contact, and discrete contact modes by 1988. By changing the force-sensing probe it is possible to detect magnetic forces, electrical forces, frictional forces, surface elasticity, and visco-elasticity, etc. The SPM is currently being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs, computer hard drives, magnetic media, electrical properties of materials, biological materials, to name a few.
Our SPM product line is comprised of the following offerings:
JSPM-4500 Scanning Probe Microscope: designed for the high resolution study of surfaces.
JSPM-5200 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
JSPM-5400 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
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The MULTIPROBE P is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chambers in the MULTIPROBE P offers standard sample preparation facilities like thin film growth or sample sputtering and heating.
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Laser Pulsing Mode expands the universe of applications for LEAP to low electrical conductivity materials including semiconductors and ceramics. In laser pulsing mode the LEAP electrode applies a static field to the specimen while an ultra-fast laser pulse triggers the removal of an atom. The Imago Laser Pulsing Module features a high pulse-repetition rate and proprietary real-time, optical-alignment correction which together enable high mass resolution, a large field of view, and fast time to results.
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Hitachi is proud to introduce the HD-2300, Hitachi´s newest high resolution, high throughput STEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance. This second-generation 200kV STEM from Hitachi, surpasses current instrumentation in nanotechnology research, emphasizing superoir performance and enhanced user-friendly features of the previous HD-2000 model. The HD-2300 is an essential instrument for the advancement of Nano-Technology in the 21st century.
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We are proud to present our NEW versatile solution for analytical purposes in combination with Ultra-High-Resolution and ample Signal Selection capabilities .
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With 11 accessory ports and optional simultaneous WDX, EDX and XRF analysis, the S-3700N is a true analytical instrument for ultra-large samples up to 300 mm across.
The patented Quad bias electron gun gives high current for excellent imaging and analytical performance throughout the kV range, but particularly at low voltages.
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The Transmission Electron Microscope - TEM - has been used in all areas of biological and biomedical investigations because of its ability to view the finest cell structures. It is also used as a diagnostic tool in hospital pathology labs. For the crystallographer, metallurgist or semiconductor research scientist, current high voltage/high resolution TEMs, utilizing 200 keV to 1 MeV, have permitted the routine imaging of atoms, allowing materials researchers to monitor and design materials with custom-tailored properties. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter.
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Today, with the culmination of more than 20 years experience, Bruker Optics offers state-of-the-art infrared and Raman microscopes. RamanScopeIII is based on a next generation, 'hybrid' platform that can accommodate multiple wavelengths of Raman excitation. The new RamanScopeIII system can be coupled to Bruker Optics' multi-range fully digital FT-Raman module, the RAM II, as well as the standalone MultiRAM FT-Raman spectrometer.
Optical Microscopy
The RamanScopeIII is based on the Olympus BX series optical microscope, all the necessary tools for sample visualization and contrast enhancements such as the Koehler brightfield and darkfield illumination, polarized light, Nomarski differential interference contrast (DIC) and fluorescence are available.
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Raman microscopy is an information rich way to characterize your samples in life sciences, geology, nanotechnology, semiconductor, forensic science and any other application where accurate chemical identification is needed.
DeltaNu presents a high performance Raman microscope at an affordable price. The ExamineR™ combines the quality of Olympus microscopy with the performance of DeltaNu's Raman spectroscopy. This combination creates a Raman microscope with outstanding imaging and spectral characteristics.
DeltaNu is the price/performance leader in Raman microscopy. Our ExamineR system comes with your choice of wavelength modules - 532nm, 785nm, or 1064nm. Our patent pending design puts the Raman module on top of the microscope and changing wavelengths is as simple as switching modules - no more tedious laser, filter, grating, and fiber optic changes like other microscopes. And, with the Raman module on top, the ExamineR's footprint is the smallest in the industry.
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DualScope DS 45-40 is a compact, very stable, and reasonably priced AFM scanner with a fixed laser and a scan area of 40 µm x 40 µm x 2,7 µm. the working distance corresponds to that of a conventional 45 mm microscope objective. The instrument works in AC mode which is optimal for most applications. The focal plane of the optics built into the scanner is permanently app. 100 µm (standby distance) below the cantilever. Thus, focussing before the scanning is not necessary. When the cantilever is in the standby distance before the scan and between scans, it is possible to move the sample without risk, and at the same time, the scanner provides a sharp optical image of the sample surface as well as of the cantilever tip. Hereby, it is possible to find an interesting location on the sample quickly and without problems.
The scanner works with standard AC mode (Non-contact mode) cantilevers, which must have a highly reflecting back side. The cantilevers are held by a magnetic mechanism and are thus very easy to change. The routine of parking the scanner, changing the cantilever, adjusting the frequency, and starting again on the first scan line will take only app. 5 to 6 minutes.
To make possible this simple cantilever change, we deliver our cantilever pre-mounted on a metal holder. If special cantilevers are to be used, naturally, we can deliver the tools for easy mounting of the cantilevers on our metal holders.
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The scanners of the DualScope DS 95 series are available in a number of different variants. The DS 95-50 scanner has a standard scan range of 50 µm x 50 µm x 5 µm, and the DS 95-200 scanner has a standard scan range of 200 µm x 200 µm x 15 µm. The DS 95-50 scanner can also be delivered with a larger Z scan range of 15 µm. The AFM scanners work in AC and DC mode (contact and non-contact mode) as well as support the measurement of the lateral torsion of the cantilever (Lateral Force mode). Irrespective of the scan range, all scanners have atomic resolution in the Z direction.
In the DS95 scanners, the laser unit is moved with the scanner during scanning, i.e. the laser point will not move at the back of the cantilever during scanning. Thus disturbances in the reflection layer on the cantilever do not influence the AFM image.
All scanners have a built-in linearization sensor in order to eliminate the influence of hysteresis in the Z piezo. Thereby, large differences in the height of the sample surface will be measured correctly, even if the scanner has only been calibrated with small differences in height, and vice versa. To allow measurements also in liquids, the scanner is equipped with a rubber membrane at the bottom, protecting the electronics from moisture entering the housing. So these scanners can also work in liquids such as water or alcohol.
The built-in optics in these scanners is similar to that of a 95 mm microscope objective. In contradistinction to the DualScope DS 45-40 model, the focal plane is independent of the cantilever position and lies app. 1 mm below the scanner front. Thus it is especially easy to find a certain position on the sample surface.
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