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Features:
Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
SPM can be in liquid;
Real-time temperature and humidity detecting;
Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
Fast automatically tip-engaging
Simply change the tip holder to switch between STM and AFM;
Full digital control, auto system status recognition;
Adjustable lightening inside
With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
Controller and Computer connected through a 10M/100M Fast Ethernet;
Large sample size: up to diameter 45mm, 30mm thick;
Online Control Software and offline Image Processing Software for Windows;
Trace-Retrace scan, Back-Forward scan;
Online real-time 3D image;
Automatically Brightness and Contrast refresh;
Data can be loaded out for further analysis;
Nano-Movie function: Continuous data collection, storage and replay;
Multi-Analysis: Granularity and Roughness;
Tip Estimation and Image Re-construction;
Modularized design for convenience of maintenance and future upgrade;
Second display monitor and optical microscope system attachable;
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The LEAP Si™ Metrology System is a high-performance atom probe microscope providing 3D, atomic resolution, compositional imaging and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. The LEAP Si employs patented innovations that unlock the power of the 3D atom probe to address previously unsolved measurement challenges in semiconductors, material science, and nanomagnetics. Key features include: largest field of view, highest data rate, excellent mass resolution, and simplified sample preparation using microtip arrays. With the LEAP Si measurements that would have taken months, or been completely impossible, can be accomplished in a matter of hours.
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The LEAP HR is a high-performance atom probe microscope providing atomic resolution, 3D compositional imaging, and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. Each ion is analyzed by measuring the time of flight to the detector through an energy-compensated time-of-flight mass spectrometer. The LEAP HR employs patented innovations that provide best in class mass resolution while simultaneously enabling a large field of view (> 150 nm). This combination of high mass resolution with large field of view provides breakthrough capability for advanced materials applications. The large field of view enables the material’s atomic scale features to be understood in the context of the larger scale nanostructure. High mass resolution permits narrowly separated mass peaks to be differentiated, ensuring accurate compositional information.
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The JSPM-4500 UHV SPM is designed for the high resolution study of surfaces. This instrument is available as individual components for labs that already have a suitable vacuum chamber or as a complete system including vacuum system. The complete package offers both a chamber for sample preparation and modification and a chamber for imaging. Additional chambers can be added to accommodate additional sample preparation and analysis. Atomic scale imaging with both AFM and STM modes is available. Variable temperature options allow imaging with sample temperatures from less than 20K to above 1500K. STM modes include CITS, I-V, S-V, and I-S. Standard AFM modes include contact, friction force microscopy, current image, non-contact and discrete contact with frequency detection, and phase imaging.
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Laser Pulsing Mode expands the universe of applications for LEAP to low electrical conductivity materials including semiconductors and ceramics. In laser pulsing mode the LEAP electrode applies a static field to the specimen while an ultra-fast laser pulse triggers the removal of an atom. The Imago Laser Pulsing Module features a high pulse-repetition rate and proprietary real-time, optical-alignment correction which together enable high mass resolution, a large field of view, and fast time to results.
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There is only one way to get ahead - advance.
The new FARO Laser ScanArm V3!
The new FARO Laser ScanArm V3 offers numerous new and improved features and several advantages in conjunction with the new Quantum FaroArm - making it unique on the market for measuring machines.
The FARO Laser ScanArm enables users to inspect parts in detail by capturing huge point-cloud data. Its open architecture enables the user to employ Geomagic, Polyworks, RapidForm and many other third-party software programs.
In conjunction with the right software, the FARO Laser ScanArm V3 tackles all measurement tasks such as inspection, point cloud-to-CAD comparison, rapid prototyping, reverse engineering, and 3-D modeling. Its main benefits are the exact scanning of reflective and dark objects - the biggest challenge for all scanning systems.
The new FARO Laser ScanArm V3 is compatible with the Quantum FaroArm, the Platinum FaroArm and the Fusion FaroArm.
Advantages of the FARO Laser ScanArm V3:
» NEW – up to 30% more accurate: New Laser Line Probe V3 up to 30% more accurate than V2
» NEW - improved surface scanning: Higher performance when scanning dark or reflecting surfaces
» NEW - Smaller & lighter: Improved ergonomics through 30% weight reduction compared to V2
» NEW – Faster warm-up: 50% faster warm-up time compared to V2
» Integrated 7th axis - Higher flexibility: No external electronics and fixtures
» Ergonomic handle: Easy to handle
» Cable-free scanning: The Laser Line Probe is compatible with Quantum FaroArm's Bluetooth® technology
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The ShapeGrabber PLM600 laser 3D scanner is portable and extremely accurate, letting you scan small to large objects that are immobile or difficult to reach.
The ShapeGrabber PLM 600:
-Allows for rigorous quality control measures to be applied
-Captures millions of data points in a few minutes which represent the true surface geometry of complex-shaped parts including compound curves
-Lets you compare scans directly to CAD models
-Provides accurate and timely feedback on prototypes, allowing faster part design and process optimization
-Offers full surface 3D quality control
-Requires no CAD training
-Provides automated inspection in minutes
-Is easy to use
-Lets you automatically save and print reports
Physical Characteristics:
Foot Print: Variable
Work Surface: Adjustable
Maximum Height: Adjustable from 330 mm to 1750 mm
Electrical: 120 or 220 VAC, 50/60 Hz
Weight: 16kg to 20kg
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G-SCAN RX 2 is a 3D scanning probe for reverse engineering and inspection of complex forms. G-Scan RX 2 gives you minimum engineering downtime compared to all other traditional contact measuring tools.
G-Scan RX 2 is compatible with all Ethernet generation ROMER measuring arms.
G-Scan RX 2 is running with a standard 6 axis arm thanks to an integrating rotating axis inside the camera. Compatible with all existing reverse engineering and surface inspection software
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initial smallest measurable flow rate dependent on type of vane wheel:
in gases 0.2...1.6 m/s; in liquids 0.01...0.1 m/s
terminal flow rate dependent on type of vane wheel:
in gases 3 m/s; 20 m/s; 40 m/s; 80 m/s;120 m/s;
in liquids: 3 m/s; 7.5 m/s; 10 m/s; condition: no cavitation
probe diameter:
16 mm; 25 mm; 25/27 mm and 30 mm
working temperature range:
up to 100° C; 260 °C; 370 °C; 450 °C and 500 °C
maximum working pressure:
up to 10 bar overpressure (higher on demand)
explosion-proof type of protection:
Category 1G, 1D (Zone 0, Zone 20); Category 2G, 2D (Zone 1, Zone 21)
probe tube material:
aluminium, stainless steel, titanium
optional incl. direction indication
optional incl. integr. temperature measurement
special designs on request
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Compact units for use in Ex-applications:
for gas: Ex II 1/2 G Ex d e [ia] IIC T6 and
for dust: Ex II 1/2 D Ex iaD20/tDA21 IP6x TX
sensor for use in category 1 (Ex-zone 0 rsp. 20)
transducer housing for use in category 2 (Ex-zone 1 rsp. 21)
probe with diameter 25 mm in different lengths between 250 mm and 650 mm
initial smallest measurable flow rate:
in gases 0.3 m/s; in liquids 0.03 m/s
terminal flow rate:
in gases 20 m/s; 40 m/s; 80 m/s; 120 m/s
in liquids: 7,5 m/s; 10 m/s;
condition: no cavitation
working temperature range:
up to 100 °C; 260 °C; 370 °C und 500 °C
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design ZG7 (standard sensor):
probe with probe tube diameter of 21.3 mm with sliding probe guide piece for installation in pipelines/ducts; probes with an installation length of 500 mm or 1000 mm,
probe material:
stainless steel for use in non-hazardous areas
design ZG2 (standrard for mobile measurement):
extendable probe with probe tube diameter of 42 mm for greater insertion depths and mobile measurements
design ZG4 (universal sensor):
probe with probe tube diameter of 21.3 mm, with sliding probe guide piece for installation in pipelines/ducts
design ZG5:
probe with probe tube diameter of 21.3 mm, with lapped flange and welded, integral flange
for making contact with the medium
initial smallest measurable value:
approx. 0.5 m/s
terminal measurable value:
40 m/s; 60 m/s and 80 m/s
working temperature range:
-20 °C... 100 °C; 180 °C; 240 °C
maximum working pressure:
3 bar above atmospheric
explosion-proof type of protection:
EEx ia IIC T6 for zones 1 and 0
probe materials:
stainless steel, titanium, tantalum and HASTELLOY
necessary diameter of insertion opening: 42 mm
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Compact units for use in Ex-applications:
for gas: Ex II 1/2 G Ex d e [ia] IIC T6 and
for dust: Ex II 1/2 D Ex iaD20/tDA21 IP6x TX
sensor for use in category 1 (Ex-zone 0 rsp. 20)
transducer housing for use in category 2 (Ex-zone 1 rsp. 21)
design ZG8:
probe with probe tube diameter of 21.3 mm, with sliding probe guide piece for installation in pipelines/ducts, probes with different lengths from 500 mm up to 2000 mm
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Measure the mass of air ingested by a gasoline or diesel engine using hot wire anemometry. The concept is simple; the implementation is unique.
At the heart of the design of Delphi's Probe Air Meters is a platinum-based, glass-coated, heated sensing element. The element is a low mass, quick responding device used in a bridge circuit configuration. It is very robust to damage from dust impingement. Delphi's Probe Air Meters feature a patented dimpled flow management pattern that provides more consistent air flow across the sensing elements, enabling outstanding performance in application-specific ducting.
Delphi's family of Probe Air Meters includes:
· Probe Single for unidirectional air flow applications
· Probe Dual features two heated sensing elements
· Probe Bypass for 4- and 5-cylinder turbo engines
Delphi has delivered more that 40 million air meters since 1993.
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The MHM and MHC series of feedthroughs were designed to produce a leak free method of passing multiple probes or conductors (MHM and MHC) from ambient through to process conditions. Glands are available to carry upto 16 tubes or probes through a single fitting and elements in both metric and imperial sizes from 0.5mm (0.020") to 3.2mm (0.125")
The bodies of these feedthroughs are machined from 316L stainless steel and leak prevention is based upon soft sealant technology using Teflon®.Viton®, Neoprene, Lava & Grafoil®. All sealents are re-usable apart from Lava. Various thread forms and process connections are available including NPT, BSP, weld-neck and Tri-clover hygienic flanges.
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The PG series of feedthroughs were designed to produce a leak free method of passing a single probe or conductor from ambient through to process conditions.
The bodies of these feedthroughs are machined from 316L stainless steel and leak prevention is based upon soft sealant technology using Teflon®. Various thread forms and process connections are available including NPT, BSP, weld-neck and Tri-clover hygienic flanges.
Applying the correct torque to the gland cap nut will ensure a permanent leak free seal without damage to the probe or conductor. Following the removal of a probe or probes for calibration the sealant can be re-used.
Where it is necessary to remove one or more probes (perhaps for operational reasons) when using multiple probes, normal sterilising procedures can still be maintained by fitting the vacant positions with an EGB. This is fabricated in 316L stainless steel to the same diameter of the absent probe. It is constructed with a larger diameter on the chamber side to prevent movement of the blank through the sealant when exposed to chamber pressure.
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Electrical Feedthroughs:
Nor-Cal's extensive line of electrical feedthroughs are manufactured from ultra-high vacuum grade materials such as high alumina ceramic insulators, OFHC® copper and nickel conductors, and 304 stainless steel flanges. These robust ceramic to metal feedthroughs have electrical ratings for operation with one side in dry atmosphere while the opposite end is in a stable vacuum. They are used in ultra high vacuum systems with CF flanges or high vacuum systems with NW flanges. CF feedthroughs can be baked to 450°C and NWs to 204°C with maximum system pressure of 1 x 10-4 Torr. Our product line consists of the most commonly required feedthroughs for general vacuum applications. Customs designs or modified standards can readily be supplied.
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AutoPoint II is a fixtureless, gridless flying probe with a unique power off impedance analysis measurement system. Capable of detecting manufacturing and in-service faults as standard the measurement system is not limited to a single technique.
With the addition of the MiniScanner a wide range of complimentary instruments, whether from DiagnoSYS or an IEEE/GPIB interface instrument supplier, can be added and fully supported by the TestVue32™ operating software.
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| ... products without technical information |
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AutoPoint II is a fixtureless, gridless flying probe with a unique power off impedance analysis measurement system. Capable of detecting manufacturing and in-service faults as standard the measurement system is not limited to a single technique.
With the addition of the MiniScanner a wide range of complimentary instruments, whether from DiagnoSYS or an IEEE/GPIB interface instrument supplier, can be added and fully supported by the TestVue32™ operating software.
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| ... products without technical information |
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AutoPoint II is a fixtureless, gridless flying probe with a unique power off impedance analysis measurement system. Capable of detecting manufacturing and in-service faults as standard the measurement system is not limited to a single technique.
With the addition of the MiniScanner a wide range of complimentary instruments, whether from DiagnoSYS or an IEEE/GPIB interface instrument supplier, can be added and fully supported by the TestVue32™ operating software.
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| ... products without technical information |
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