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This stage with a 15 cm movable granite object table and a positioning accuracy of 100 nm is the ideal solution for fully automated routine measurements, and gives the highest AFM measurement stability. With the push of a button, you can switch between a high resolution, conventional microscope with DIC function and the AFM scanner, thus combining a quick visual control with a high resolution AFM measurement. The repositioning problems of working with more examination methods are totally eliminated. Upon request, we can include other measuring equipment also.
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The LEAP Si™ Metrology System is a high-performance atom probe microscope providing 3D, atomic resolution, compositional imaging and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. The LEAP Si employs patented innovations that unlock the power of the 3D atom probe to address previously unsolved measurement challenges in semiconductors, material science, and nanomagnetics. Key features include: largest field of view, highest data rate, excellent mass resolution, and simplified sample preparation using microtip arrays. With the LEAP Si measurements that would have taken months, or been completely impossible, can be accomplished in a matter of hours.
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The LEAP HR is a high-performance atom probe microscope providing atomic resolution, 3D compositional imaging, and analysis to research and industry. Materials are examined by removing and analyzing individual atoms. Atoms are removed by a combination of a high electrical field and either: (1) an ultra-fast voltage pulse or (2) an ultra-fast laser pulse. Each ion is analyzed by measuring the time of flight to the detector through an energy-compensated time-of-flight mass spectrometer. The LEAP HR employs patented innovations that provide best in class mass resolution while simultaneously enabling a large field of view (> 150 nm). This combination of high mass resolution with large field of view provides breakthrough capability for advanced materials applications. The large field of view enables the material’s atomic scale features to be understood in the context of the larger scale nanostructure. High mass resolution permits narrowly separated mass peaks to be differentiated, ensuring accurate compositional information.
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The Scanning probe Microscope (SPM) was developed during the 1980s and is now an indispensable tool for the direct high resolution study of surfaces and surface forces. Starting with the scanning tunneling microscope in 1981, the technique was broadened to atomic force microscopy including contact, non-contact, and discrete contact modes by 1988. By changing the force-sensing probe it is possible to detect magnetic forces, electrical forces, frictional forces, surface elasticity, and visco-elasticity, etc. The SPM is currently being used to study samples ranging from semiconductor surfaces and devices, thin films, archeological artifacts, compact discs, computer hard drives, magnetic media, electrical properties of materials, biological materials, to name a few.
Our SPM product line is comprised of the following offerings:
JSPM-4500 Scanning Probe Microscope: designed for the high resolution study of surfaces.
JSPM-5200 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
JSPM-5400 Environmental Scanning Probe Microscope: a multipurpose, high resolution SPM offering ease of use with diverse measurement and sample environments.
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The MULTIPROBE P is a dual-chamber surface science UHV system with a large multi-technique analysis chamber for electron spectroscopy and UHV scanning probe microscopy, and a separate sample preparation chamber with FEL. The preparation chambers in the MULTIPROBE P offers standard sample preparation facilities like thin film growth or sample sputtering and heating.
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Laser Pulsing Mode expands the universe of applications for LEAP to low electrical conductivity materials including semiconductors and ceramics. In laser pulsing mode the LEAP electrode applies a static field to the specimen while an ultra-fast laser pulse triggers the removal of an atom. The Imago Laser Pulsing Module features a high pulse-repetition rate and proprietary real-time, optical-alignment correction which together enable high mass resolution, a large field of view, and fast time to results.
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LASER-Assisted
3D Atom Probe for Semiconductors and Materials
The CAMECA LA-WATAP instrument is the next generation of Tomographic (or 3D) Atom Probe, providing quantitative atomic scale 3D elemental mapping of chemical heterogeneities in materials.
The LA-WATAP offers the following advantages:
Analysis of semiconductor materials with near-atomic depth resolution. This is possible by using a flexible (IR/ visible/ UV) ultrafast (400fs) laser setup. The unique hybrid evaporation mode combines reduced heating of the sample with ultra-fast surface polarisation promoting ion evaporation under the high DC electrical field.
Excellent mass resolution even on low thermal conductivity materials. This is obtained by reducing the heating of the sample with ultra-fast laser pulsing. Conventional picosecond laser based 3DAP work in thermal evaporation mode leading to thermal effects and peak tails.
Analysis of thin electrically insulating layers by using fs-laser pulses of short wavelength (UV).
Highest analyzer transmission (detected ions/evaporated atoms >60%). Reflectron-based 3DAP instruments reduce this typically to 35% due to the use of grids. Transmission is a key parameter when applying the (destructive) 3DAP technique to the quantification of nanoscale volumes.
Large analysis area (100nm in diameter) for a better statistics on composition measurements.
Fast acquisition, up to 1E6 atoms per minute depending on sample strength (flux of at./pulse).
Best quantitative results with the exclusive Advanced Delay Line Detector (ADLD) and its benchmark multi-hit performance.
Flexible and fast dedicated FIM (Field Ion Microscopy) detector for metallurgical application with highest S/N performance and fast switch between FIM and 3DAP modes.
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Renishaw probe systems provide an innovative solution to improve the efficiency of your machine tools.
Touch probes on CNC machining centres and lathes can be used to identify and set-up parts, measure features in-cycle for adaptive machining, and verify finished component dimensions.
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The high deflection values of the FIDIA tracer K5 guarantee an excellent digitizing behavior. The reduced vertical space requirement allows em-ployment also with machines with small vertical travel.
The tracer can be fastened to a copying arm or in the spindle tool clamp which increases the precision in digitizing
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First launched in 1994, the SX 100 is the latest generation CAMECA EPMA instrument. The central concept is a fully digitized instrument with highly integrated electronics and full automation for unattended analysis and evaluation. Comfort and ease of control are made possible by the dedicated keyboard together with the ergonomic software interface.
The tradition of superb analytical performances, based on the famous precision and reliability of the CAMECA WDS analyzers and extreme stability of the primary beam, has been continued. An uninterrupted development program has led to the introduction of new features.
Major applications are found in: geochemistry, mineralogy, geochronology, physical metallurgy, nuclear metallurgy, materials science including glass, ceramics, superconductors, cements, microelectronics, biochemistry, ...
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The FARO Laser ScanArm® offers numerous new and improved features and several advantages in conjunction with the new FaroArm® Quantum - making it unique on the market for measuring machines.
The FARO Laser ScanArm enables users to inspect parts in detail by capturing huge point-cloud data. Its open architecture enables the user to employ Geomagic, Polyworks, RapidForm and many other third-party software programs.
In conjunction with the right software, the FARO Laser ScanArm tackles all measurement tasks such as inspection, point cloud-to-CAD comparison, rapid prototyping, reverse engineering, and 3D modeling. Its main benefits are the exact scanning of reflective and dark objects - the biggest challenge for all scanning systems.
The FARO Laser ScanArm is compatible with the FaroArm Quantum, Platinum, and Fusion.
Advantages of the FARO Laser ScanArm:
» Up to 30% more accurate: Laser Line Probe up to 30% more accurate than previous model
» Improved surface scanning: Higher performance when scanning dark or reflecting surfaces
» Smaller & lighter: Improved ergonomics through 30% weight reduction compared to previous model
» Faster warm-up: 50% faster warm-up time compared to previous models
» Integrated 7th axis - Higher flexibility: No external electronics and fixtures
» Ergonomic handle: Easy to handle
» Cable-free scanning: The Laser Line Probe is compatible with FaroArm's Quantum Bluetooth® technology
For more information visit: www.laserscanarm.faro.com
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The HandyPROBE™ arm-free portable probing system and the C-Track™ dual-camera sensor form a unique duo that generates high accuracy measures and increases the reliability and speed of the measurement process. This portable CMM has been designed and optimized to operate in “real life”, shop floor conditions.
Compared to other existing coordinate measurement technologies, the HandyPROBE 100% portable wireless CMM gives you total freedom of movement, therefore allowing you to significantly increase your productivity and quality!
Benefits:
_ Higher measurement accuracy
_ Faster and easier measurement
_ Greater, extendable measurement volume
_ Truly portable device
_ User friendly
_ Excellent ROI
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G-SCAN RX 2 is a 3D scanning probe for reverse engineering and inspection of complex forms. G-Scan RX 2 gives you minimum engineering downtime compared to all other traditional contact measuring tools.
G-Scan RX 2 is compatible with all Ethernet generation ROMER measuring arms.
G-Scan RX 2 is running with a standard 6 axis arm thanks to an integrating rotating axis inside the camera. Compatible with all existing reverse engineering and surface inspection software
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For Video on this product use this link:
http://www.conaxbuffalo.com/videos/Sealing_Gland_Introduction/index.html
Conax Technologies Model PG Packing Glands provide pressure/vacuum sealing for tubes, proces, pipes, cable or any single element assembly (not eletrically isolating), including thermocouples, RTDs, thermometers, thermistor probes, capillary tubes, tubewells, multi-pair cables and analyzer sample tubes. PG glands seal against gases and liquids and resist element movement under pressure. Conax also manufactures sealed feedthroughs for multiple elements up to 240 wires or several elements with different diameters.
Features:
-Stainless Reusable Steel Fitting
-Seals 1 Element
-For Gas or Liquid
-Pressure*: Vacuum to 10,000 PSI (690 bar)
-Temperature Range From -400°F to +1600°F (-240°C to 870°C)
-Field Adjustable
-Simple Assembly - Insert Element, Torque Cap
-Replaceable Sealant Permits Repeated Use of Fitting
-Tube Stress Concentration Minimized
Application Ideas:
Pressure or vacuum sealing of thermocouples, RTDs, dial-type thermistor probes, glass thermometers, capillary tubes, ceramic tubewells, quartz tubewells, multi-pair cables, analyzer sample tubes, etc.
Replacement Sealant (RS) available consisting of sealant only.
Example: RS-PG2-125-T
Optional stocked body materials: Monel 405, Hastelloy C276 & 316SS.
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Conax buffalo sealing gland
The MHM and MHC series of feedthroughs were designed to produce a leak free method of passing multiple probes or conductors (MHM and MHC) from ambient through to process conditions. Glands are available to carry upto 16 tubes or probes through a single fitting and elements in both metric and imperial sizes from 0.5mm (0.020") to 3.2mm (0.125")
The bodies of these feedthroughs are machined from 316L stainless steel and leak prevention is based upon soft sealant technology using Teflon®.Viton®, Neoprene, Lava & Grafoil®. All sealents are re-usable apart from Lava. Various thread forms and process connections are available including NPT, BSP, weld-neck and Tri-clover hygienic flanges.
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Electrical Feedthroughs:
Nor-Cal's extensive line of electrical feedthroughs are manufactured from ultra-high vacuum grade materials such as high alumina ceramic insulators, OFHC® copper and nickel conductors, and 304 stainless steel flanges. These robust ceramic to metal feedthroughs have electrical ratings for operation with one side in dry atmosphere while the opposite end is in a stable vacuum. They are used in ultra high vacuum systems with CF flanges or high vacuum systems with NW flanges. CF feedthroughs can be baked to 450°C and NWs to 204°C with maximum system pressure of 1 x 10-4 Torr. Our product line consists of the most commonly required feedthroughs for general vacuum applications. Customs designs or modified standards can readily be supplied.
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The PG series of feedthroughs were designed to produce a leak free method of passing a single probe or conductor from ambient through to process conditions.
The bodies of these feedthroughs are machined from 316L stainless steel and leak prevention is based upon soft sealant technology using Teflon®. Various thread forms and process connections are available including NPT, BSP, weld-neck and Tri-clover hygienic flanges.
Applying the correct torque to the gland cap nut will ensure a permanent leak free seal without damage to the probe or conductor. Following the removal of a probe or probes for calibration the sealant can be re-used.
Where it is necessary to remove one or more probes (perhaps for operational reasons) when using multiple probes, normal sterilising procedures can still be maintained by fitting the vacant positions with an EGB. This is fabricated in 316L stainless steel to the same diameter of the absent probe. It is constructed with a larger diameter on the chamber side to prevent movement of the blank through the sealant when exposed to chamber pressure.
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B&B Thermo-Technik GmbH offers Digital Thermometers for various applications:
- A simple Digital Immersion Thermometer
with LED display for only some Euro
- A robust Digital Thermometer Type 305
Measuring range -50°C up to 1300°C
High accuracy
Short response time
Hold Feature
- A universal Digital Thermometer type 8856 with 2 outputs
for various thermocouples
with RS232 interface
with many features
i.e. MIN, MAX, DT., average temperature...
Further information and temperature probes will be found at our Temperature Shop:
www.temperature-shop.eu
Do you request special temperature probes? We develop and produce also according customer specific requirements. Please send your inquiry!
In the Temperature-Shop you will also find information about our range of:
- Temperature Humidity Sensors
- Thermocouple Connectors
- Temperature Measurement Instruments
- Infrared Thermometers
- Hygrometers
- Datenloggers
- Recorders
- Stationary Pyrometers
- Controllers
- Indicators
- Transmitters
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KIMO specially designed and developed TM200 for temperature measurement.
Simple, accurate and intuitive, TM 200 has a large colored display and easy browsing is done thanks to its joystick on keypad.
Multi-probes, innovative and evolutive, TM can display 6 temperature measurements simultaneous :
- A thermocouple module with 4 inputs (module which is individually calibrated and is automatically recognized by the instrument) :
· from –200 to +1300°C (thermocouple K)
· from 100 to +750°C (thermocouple J)
· from –200 to +400°C (thermocouple T)
- 2 PT100 inputs.
A large choice of probes is available : general use, penetration, contact, ambient, Velcro, wired…..
To simplify the use, PT100 probes are wireless probes.
TM200 can measure, store up to 8,000 values and restore on PC (wireless communication).
Join our distribution network all over the word....Contact us !
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