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Affordable, Research-Grade AFM with Flexible Sample Handling
An economic extension of the XE-100, the XE-70 is Park Systems’ new AFM solution for budget conscious customers. Having a compact mechanical design, the XE-70 continues the innovative technology of the XE-series that sets it apart from conventional AFM. The XE-70 shares the same modes, options, and electronics as well as all other systems in the XE product line.
- Compact mechanical design
- 50 μm × 50 μm XY scan range
- 12 μm Z scan range
- Manual optics stage
- Complete new system with XE electronics
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The XE-200 is an AFM with increased capacity that supports 200 mm wafer investigation. In addition to the precise scan performance provided by True Non-Contact mode, the XE-200 offers users an encoded XY stage that travels over the entire 200 mm x 200 mm sample area, an enlarged XY scan range of 200 μm x 200 μm, and a Z scan range of 25 μm. Also, the industrial-grade automation features of the instrument greatly minimize the user‘s required participation during system operation.
- Supports up to 8 inch wafer
- 200 μm × 200 μm XY scan range
- 25 μm Z scan range
- Industrial-grade acoustic enclosure with steel frame
- Fully motorized XY stage travels entire 200 mm × 200 mm
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The new Nanosurf easyScan 2 FlexAFM scan head makes measurements in liquid as simple as measuring in air. It is the most versatile and flexible AFM ever. Whether you want to operate the FlexAFM in air or in liquid, on metal surfaces or biological samples, it makes no difference to you as a user. This is true flexibility!
Key Features & Benefits
- True measurement flexibility in air and in liquid
- Flat, linear, and fast scanning thanks to the flexure-based scanner technology
- More measurement versatility with the FlexAFM’s liquid capabilities and added Lateral Force mode
- No more laser adjustment because of SureAlign™ optics
- Easy sample positioning and approach thanks to a clear top and side view in air and liquid
- Quick setup, easy handling, and immediate results because of Nanosurf’s “ease of use” concept and design
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The Nanosurf Nanite extends Nanosurf's new and innovative AFM scanner design to work-intensive industrial applications. When time and throughput are of utmost importance, the automated Nanite system is your answer.
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HDD Slider manufacturers can now reliably depend on Park Systems’ XE-PTR, a fully automated industrial in-line AFM for automatic Pole Tip Recession measurements on rowbar-level sliders. As most HDD manufacturers are turning to PMR (Perpendicular Magnetic Recording), sub-nano scale accuracy, repeatability and throughput are the keys to slider inspection for improving the overall yield. Matching the highest resolution AFM in the world with the lowest one gauge sigma value imaginable for repeatability and reproduction, the XE-PTR is the perfect solution for slider manufacturers who, until now, had very limited choice of industrial grade in-line inspection tools for HDD slider metrology. We, Park Systems, take pride in providing you with the metrology solution you have been longing for.
- Allowable Sample Size: Rowbars and Sliders
- Automatic Data Acquisition and Analysis of Sliders
- Designed Specifically for Manufacturing Facilities
- Automatic Tip Exchange (Optional)
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Nanosurf's easyScan series has gained worldwide popularity through its affordability, portability, and ease of use, with hundreds of systems currently in use.
Now its successor, the easyScan 2, unites these three unique characteristics with a fully modular system design. Whether you need a teaching tool, a training Scanning Probe Microscope, or a research instrument, what you need is what you get.
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The Mobile S atomic force microscope is a whole new way to look at atomic force microscopy. Mobility. Ease of use. Sleek design. Modern and well-integrated software. Unsurpassed support and reliability. And a price much lower than you'd pay for a comparable AFM system.
World's first battery-powered AFM!
Announcing a new dimension in atomic force microscopy: the Mobile S battery-powered AFM.
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Renishaw manufactures a wide range of optical spectroscopy products, including: Raman microscopes, compact process monitoring Raman spectrometers, Raman analysers for scanning electron microscopes, lasers for spectroscopy, and state-of-the-art cooled CCD detectors.
The Renishaw Raman systems exploit the Raman effect to identify and characterise the chemistry and structure of materials in a non-contacting, non-destructive manner.
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World's first Personal Electron Microscope
FEI™ is the company that helps you see beyond the limits of conventional optical and electron microscopes. Phenom is the easiest-to-use SEM ever made, breaking through the performance barriers of optical microscopes while defining a new standard for usability by non-experts. Now engineers, researchers, educators, and students - with very little training - can make high-resolution, sub-micron images themselves; where they want, how they want, and most importantly, when they want.
Phenom is a high resolution desktop imaging tool that simplifies and accelerates your imaging workflow. Never before could you have this level of resolution, magnification and speed at such a price point. With magnifications of 20x to 24,000x and an ultimate resolution of 30 nm, it's ideal for routine inspection and detailed imaging of materials. And, Phenom is extremely easy to operate too, meaning everyone can use it.
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The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale. With the MFP-3D Stand Alone (MFP-3D-SA) AFM, scientists can now choose a sensitive and precise AFM with the lowest noise performance that also includes a complete scientific software environment. The MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements. The MFP-3D has the flexibility to acquire your data, analyze it, and even make publication-ready graphics.
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Phenom™ brings the sub-micron world within easy reach of teachers and students
Engaging students of all ages with microscopy is easier than ever. Phenom achieves the ease of a light microscope with automated touch screen control, 30 second sample loading and only 15 minutes of training per user. Sample variety is limited only by imagination.
Phenom stimulates the development of investigative techniques, active learning and scientific inquiry skills by giving students an interactive, dynamic and fun learning tool.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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MERLIN™
Analytical Power for the Sub-Nanometer World
-Nano Analytics
-Total Information
-Ease of Use
-Future Assured
MERLIN™ - analysis and high resolution in one
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical capability. The core of MERLIN is the enhanced GEMINI II column which, with its double condenser system, achieves an image resolution of 0.8 nanometers. A sample current of up to 300 nanoamperes is available for analytical purposes such as energy and wavelength dispersive X-ray spectroscopy (EDS and WDS), diffraction analysis of backscattered electrons (EBSD) or the generation of cathodoluminescence.
The system supports the user with a wide range of detailed solutions for tasks that could not be adequately performed in the past. The foundation for this achievement has been laid by the Carl Zeiss "Complete Detection System". This consists of the in-lens SE detector for surface imaging, the in-lens EsB detector for material contrast and the AsB detector for widely dispersed backscattered electrons. The latter contain specific information on the crystal orientation of the sample.
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SIGMA – Advanced Analytical Microscopy - Now available with VP Technology
The SIGMA, featuring GEMINI® technology provides outstanding imaging and analytical results from a field emission microscope.
The SIGMA is now available with variable pressure (VP) technology for exceptional imaging and analysis of non-conductive specimen. It is compatible with a wealth of accessories including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior materials contrast and SE imaging in VP.
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The answer to modern nano science challenges is the unique GEMINI® field emission SEM column, a sophisticated solution recognised by microscopists worldwide as the leader. The new SUPRA™ series, based on the 3rd generation GEMINI® column, offers a complete range of ultra high resolution FESEMs models to cover all fields of applications in nano technology, cryo, nano structural materials analysis and semiconductor development and failure analysis.
The key advantages of the GEMINI® FESEM column are superb resolution down to 0.1kV, high efficiency In-lens SE detector, minimal adjustments when changing operating voltage and low magnetic fields at specimen level. The SUPRA's unique variable pressure (VP) capability enables examination of non-conducting specimens without time consuming preparation. The versatile analytical ultra high resolution FESEM concept extends imaging and analytical resolution beyond previously achievable limits.
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The ULTRA FESEM, based on the SUPRA%uF0D4 FESEM comprises a high efficiency, ultra high resolution In-column EsB detector which enables nano-scale compositional BSE imaging. The newly developed Energy selective Backscattered (EsB) detector represents the latest developments of the renowned GEMINI®technology. The ULTRA incorporates the GEMINI® In-lens SE detector for crisp topographic imaging and the EsB detector for clear compositional contrast. Simultaneous real-time imaging and mixing of both signals offers ultimate imaging capabilities. The EsB detector comprises a filtering grid which enables high resolution BSE imaging revealing previously unseen image details.
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The Voyage™ is a Confocal Raman Microscope System that is designed to deliver true confocality and true flexibility. Its robust opto-mechanical design provides one design to fit multiple microscopes, including Olympus BX51 research microscope or Nikon Eclipse 80i advanced research microscope. In addition, the innovative design of detachable confocal subassembly provides the retrofit for users to turn their own microscopes into confocal Raman microscope. Its optimized optical design for confocal concept, combined with B&W Tek core technologies of patented CleanLaze® laser and patent pending spectrometer with highest resolution, delivers the smallest spot size in the market, spectral resolution of 3 cm-1, and near-excitation cut-on at 100 cm-1. This compact confocal Raman Microscope System is available with 532 nm or 785 nm laser excitation.
Highlights
- Optimized True Confocal Design
- Spectral Resolution 3cm-1
- 100cm-1 of the Raleigh Line
- Detector Cooled to -20ºC
- One design fits multiple microscopes
- Retrofit for users with microscopes
- Adjustable Slit
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EVO® MA and LS Series SEM
Driven by applications
The EVO® series SEM has evolved to provide users in Materials Analysis and Life Science with microscopes designed to match their needs. Both microscopes series share some key features.
Key features
- Class leading x-ray geometry
- Class leading secondary electron imaging in variable pressure
- High brightness LaB6 source option
- Clean pumping technology with fast pumpdown
- High repeatability stage with large stage movements
The EVO® MA 10, EVO® MA 15 and EVO® MA 25 microscopes provide, as standard, the capability to use variable pressure (VP) operation.
The EVO® LS 10, EVO® LS 15 and EVO® LS 25 microscopes are environmental SEMs providing, as standard, the capability to prevent dehydration artefacts in the microscopy of life science specimens.
The EVO® MA and LS series ensures the perfect solution to every application requirement.
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New HIROX Tabletop Mini-SEM:
Desktop Scanning Electron Microscope with integrated EDS BRUKER-AXS!
Easy to use, fast, performant and easy maintenance, the HIROX Mini-SEM combines the simplicity of an optical microscope with the strength of a Scanning Electron Microscope!
From 20x to 30 000X
* Visualization
* Measurements
* Control
* Output
... in just a few seconds!
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The NeoScope benchtop SEM economically complements both optical microscopes and
traditional SEMs. The NeoScope makes it easy to obtain high magnification images with high resolution and large depth of field using a microscope that is as simple to operate as a digital camera, but has the powerful electron optics of an SEM.
Whether used by trained electron microscopists as a simple screening instrument, or by lab technicians as a higher resolution alternative to the light microscope, the NeoScope will help accelerate the pace of research in the life sciences, forensics, and failure analysis of manufacturing materials.
Basic operation of the NeoScope is simple with auto focus, auto contrast and auto brightness controls. No special sample preparation, such as coating or drying, is required. The NeoScope operates in both low and high vacuum modes and has three settings for accelerating voltage suitable for a variety of applications, all of which can be programmed in special pre-stored recipe files.
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Fiber Analysis made Faster, Better and Easier with the FEI Fibermetric System powered by Phenom
Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before. With the Fibermetric™ system powered by Phenom you can load and image samples in about 30 seconds. Magnifications up to 24,000 times produce accurate information on a large range of fibers as small as 100nm in diameter. Automated measurement generates all the statistical data you need in minutes, and unlike other SEM-based solutions, no laboratory infrastructure or trained microscopists are required.
The Fibermetric system accurately images and measures almost any fiber sample. The Fibermetric system delivers better data, faster, to improve your fiber material developmentand manufacturing.
- Save time
- Get all your statistical data, automatically
- See and measure nearly any micro/nano fiber
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Phenom world's first Personal SEM for Metals
Rapidly examine alloys for metallurgical analysis, quality control, and failure analysis
The properties of many engineering materials are governed by a combination of metal composition and the morphology and distribution of key micro-structural features. These features can be observed with light microscopes, but when higher magnification and 3D detail is required, a scanning electron microscope (SEM) works best. The Phenom™ personal electron microscope exceeds the resolution of light microscopes (30 nm vs. 200 nm) and eliminates the expense, delay, and difficulty of operating a conventional SEM.
Phenom takes metallurgical imaging to a new level of clarity. For failure analysis of 3D objects, Phenom's large depth of focus can show the fracture origins and fatigue features.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images-with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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Phenom for particles
Best of both worlds: size and shape with Phenom in 30 secs
Particle size analyzers are becoming common in industrial and pharmaceutical laboratories. As important as size distribution is, the shape and agglomeration of sub-micron particles is only visible with an electron microscope. Phenom™ is the affordable solution to expand your lab capabilities. With an ultimate resolution of 30nm, Phenom will clearly identify and compare the morphology of fine particles or deposits for new formulations.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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Validate TEM and SEM samples, faster.
For advanced semiconductors, light microscopes lack resolution to ensure that SEM and TEM samples include regions of interest. If you can't use a DualBeam™ to prepare and validate every sample, Phenom™ can help. Now, FA labs can dedicate high-resolution SEMs to FA work, offloading routine work without outsourcing. The Phenom is easy for engineers to use, fits on a desktop, does not require special environmental preparations, and costs less than many high-end optical microscopes.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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The transmission electron microscope (TEM) uses electron translucent specimens with images directly projected on a screen or camera. Resolution better than 0.1 nm are now achievable, delivering atomic scale resolution
The all new LIBRA® range of Energy Filtering Transmission Electron Microscopes (EFTEM) combine state of the art electron optics with unique Koehler illumination, OMEGA In-column energy filtering, extremely stable digital electronics and genuine ease of operation.
The systems are operated through a pair of dedicated control panels supported by the WinTEM™ GUI following the successful philosophy of ZEISS´ SEMs instruments for maximum convenience and consistent “look-and-feel” operation across the entire product range.
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FRT Atomic Force Microscopes (AFMs) scan the surface of a sample using a very fine tip on the end of a microscale cantilever.
Atomic interactions between the tip and the surface lead to a deflection of the cantilever which is then detected by a piezoresistive element. Based on this effect, the AFM can measure the topography or roughness of a surface with very high resolution non destructively. The AFM can be used in different operating modes and thus allows for the investigation of further properties, such as electrical and magnetical forces or elasticity of a specimen.
topography measurement at very high resolution
automatic approach of the tip to the surface
sampling of surface areas by means of a piezoresistive elementcontact/non-contact mode
measurement of electrical and magnetic properties
measurement of lateral forces and elasticity1
measurement in liquids2
further operating modes upon request
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The attoAFM I is a compact atomic force microscope designed particularly for applications at low and ultra low temperatures. The instrument works by scanning a cantilever accross a sample surface and by measuring its deflection with highest precision using a fiber based optical interferometer. Contact, non-contact, and modulation mode are applicable.
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N8 ARGOS
N8 ARGOSAFM / SPM the easy way
The N8 ARGOS is a compact and highly rigid stand for the NANOS AFM/SPM system. Equipped with a ultra precision vertical stage the AFM is approached with nanometer accuracy. Sophisticated algorithms provide a smooth and gentle probe approach. Accidental tip to sample contacts in non - contact measurement approaches belong to the past. Unique sliding X - Y stages provide the highest possible rigidity.
The stages are made of granite, a material with superior thermal behavior. Driven by high precision micrometer screws an exact positioning of the sample is provided. After reaching the measuring position on the sample the stage can be completely decoupled from the driving micrometer screws by simply turning them a few micrometers back. Thus, the granite stage elements are in direct contact over the entire running surface. This explains the superior drift - free behavior of this proprietary design. The straightforward, yet vibration insensitive stand provides the ideal setup for high accuracy AFM/SPM measurements down to a true atomic level.
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Ultra-high resolution microscopy places special demands on the equipment used to capture new information and reveal the secrets of the Nano-world.
The new S-5500 meets these with proven technology, combining high resolution and easy, reliable operation.
The S-5500 boasts a host of features and details, all designed to make high resolution microscopy and analysis that much easier
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The Hitachi S-4800 is a truly versatile platform comprising impressive high resolution performance, advanced detection technology, and a user interface that makes it possible to capture even the most short lived moments accurately and clearly.
It employs a semi-in-lens design for large sample accommodation while achieving ultra-high resolution comparable to performance only available with in-lens UHR SEMs.
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This stage with a 15 cm movable granite object table and a positioning accuracy of 100 nm is the ideal solution for fully automated routine measurements, and gives the highest AFM measurement stability. With the push of a button, you can switch between a high resolution, conventional microscope with DIC function and the AFM scanner, thus combining a quick visual control with a high resolution AFM measurement. The repositioning problems of working with more examination methods are totally eliminated. Upon request, we can include other measuring equipment also.
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