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Now in its fourth generation, the Loom Laser series Thread-Break Detection system uses cutting-edge laser and microprocessor technology to provide protection from thread breaks in any weaving environment.
Thread breaks are detected when the CPU senses small changes in the light received by the photocell (receiver). The system is programmed to differentiate between actual thread breaks and false signals generated, for example, when a dust particle or an insect passes through the beam.
Lasers can be strategically placed at critical points-the whiproll, back shed, front shed, or on the lay-to give complete thread-break coverage.
The advanced capabilities of the LL-2000 Loom Laser can detect threads as small as 30 microns on looms operating between 120 and 600 rpm. At the same time, the system is immune to changes in ambient light, and can withstand vibrations up to 14mm in amplitude at the surface of the receiver sensor.
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The OBR 4400 takes the industry's first ultra-high resolution OTDR with backscatter-level sensitivity designed for component- and module-level reflectometry to the next level. With a small, easily transportable platform, the capability to "see" reflections out to 2 kilometers with no dead zone, and integrated temperature and strain sensing, the OBR 4400 gives you the ultimate in fiber diagnostics. The OBR 4400 uses swept-wavelength coherent interferometry to measure minute reflections (< 0.0003 parts per billion) in an optical system as a function of length with spatial resolution less than 50 microns. This provides the user with precision reflectometry and unprecedented optical-module inspection and diagnostic capabilities by providing the ability to locate and troubleshoot splices, connectors, fiber bends and breaks, insertion loss points, track polarization, verify PM components and more.
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Up to 24 channels of Return Loss Measurement. The high resolution reflectometer measures Return Loss from 10dB to 72dB.
The OP930 supports a CW source mode. For the Return Loss measurement the laser sources are pulsed in the nanosecond region. For certain measurements a continuous modulated (CW) light signal is a required.
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The most versatile, complete light source available with up to three singlemode wavelengths on a single port, or four wavelengths (two multimode and two singlemode) on two ports.
Applications
Link-loss characterization
Fiber identification
Key Features and Benefits
Can transmit with a wavelength-identification digital encrypted protocol so that any compatible unit can automatically use the proper calibration parameters
Autonomy of 120 hours
Instrument identification available in six languages
Highest output power in the industry
Three-year warranty and recommended calibration interval, for dramatically reduced cost of ownership
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Features :
* 8 channels of user-selectable laser source modules
* ±3pm wavelength stability with ±0.003dB power stability
* Customer specified WDM DFB sources covering S, C, and L-bands at up to 20mW per channel
* Internal synchronous modulation to 500kHz
* Fiber optic switch modules available
* GPIB/IEEE488 and RS-232 interfaces
The FOM-7900B is a high-performance fiber-optic test and development platform with eight channels supporting plug-in laser source and fiber optic switch modules. This system provides a cost-effective solution for WDM and CWDM test applications including EDFA, SOA, and fiber optic component characterization.
Front panel plug-in modules are offered at user-specified wavelengths from 1475-1625nm including service channels at 1310, 1480, 1510, and 1625nm. Each channel can be tuned over a 1.7nm range with 0.001nm resolution. These sources can be customized to meet special requirements including fiber optic connector type, PM alignment and fiber, and center wavelength on ITU grid points.
For higher density WDM system requirements, up to 25 additional FOM-7900B mainframes can be linked together for a total of 200 channels, all controlled from a single GPIB address.
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Small, lightweight OTDR-dedicated platform factory-configured to house any EXFO OTDR configuration. Takes EXFO’s world-renowned OTDR technology to the next level of user-friendliness.
Applications
LAN/WAN to long-haul OTDR testing
Key Features and Benefits
Tests up to four wavelengths
The industry’s fastest acquisition times
Multimode and singlemode testing
Shortest dead zones available
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The OBR 4400 takes the industry's first ultra-high resolution OTDR with backscatter-level sensitivity designed for component- and module-level reflectometry to the next level. With a small, easily transportable platform, the capability to "see" reflections out to 2 kilometers with no dead zone, and integrated temperature and strain sensing, the OBR 4400 gives you the ultimate in fiber diagnostics. The OBR 4400 uses swept-wavelength coherent interferometry to measure minute reflections (< 0.0003 parts per billion) in an optical system as a function of length with spatial resolution less than 50 microns. This provides the user with precision reflectometry and unprecedented optical-module inspection and diagnostic capabilities by providing the ability to locate and troubleshoot splices, connectors, fiber bends and breaks, insertion loss points, track polarization, verify PM components and more.
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Two FasTesT ports: a three-wavelength singlemode port, including either 1625 nm or 1490 nm, and an optional two-wavelength multimode port, for a total of up to five wavelengths
Visual IL and ORL pass/fail analysis
Compatible with both the FTB-400 and FTB-200 platforms
FTTx ready: allows for the testing of passive optical networks (PONs) at 1310 nm, 1490 nm and 1550 nm, the three wavelengths recommended by the ITU-T (G.983.3) for PONs
Three-year warranty and recommended calibration interval, error-free testing and minimized training time
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Luna Technologies' Optical Backscatter Reflectometer (OBR) delivers unprecedented inspection and diagnostic capabilities for the fiber-optics industry. Luna's state-of-the-art OBR provides isolation of faults and problems well before final test, saving hours in rework and hard dollars in yield loss.
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Insertion Loss and Return Loss measurement for all four FTTX wavelengths. The 'no mandrel' method combined with concurrent dual-wavelength measurement makes this instrument the most efficient tool in FTTX component verification.
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The ultimate platform for network experts. Combines physical, optical, transport and datacom testing in a single box. Perform simultaneous acquisitions and fast data post-processing, and benefit from a scalable range of test applications and field-interchangeable modules.
Key Features and Benefits
Five configurations (two-slot, four-slot, seven-slot, eight-slot and bus protector), providing maximum flexibility for long-haul, metro, DWDM, high-fiber-count, Ethernet, SONET/SDH or DSn/PDH test applications
Pentium-powered, with up to 512 MB memory
Easy-to-read, high-resolution 12.1 inch TFT screen
Windows® operating system
Simultaneous acquisitions and fast data post-processing
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The 5800 series is a multi-configuration multi-functional test system that is designed to meet the ever changing needs of today's electronic manufacturing environment. An open approach to both hardware and software has been adopted. The open software architecture enables integration with code written using third party software such as Teststand™, Labview™, C#™ and VB.NET™, in short any platform that is .NET compliant.
The open hardware architecture allows configurable chassis and interface styles to accommodate low cost analog in-circuit testing, through to high integrity analog and digital functional test solutions. The integrated 21-slot PXI based backplane enables the user to implement solutions using not only Aeroflex PXI cards but also cards from any PXI card supplier. The 5800 Series of testers comprises three body styles, the 5850, 5830 & 5820.
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AutoPoint DT is a fixtureless, gridless flying probe with a unique power-off impedance analysis measurement system. Excellent for Manufacturing Defect Analysis (MDA) testing and Field Return Failures.
Supplied as a Stand Alone System or integrated with the PinPoint II Advanced Diagnostic Test System System
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IPTE develops test equipment, test handlers and turn-key solutions for the automation of testing and adjustments of PCB's and electronic products
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Features
Integrated test system
Compact footprint
Fixtures compatible with TCIL-P and TCIL-TS
Compact PLC for internal controls
Visualization and tester interface on external PC (e.g. tester PC) via USB interface
Stand alone operation
Manual width adjustment
SMEMA Interface
Compatibility with all standard test systems
Options
Product specific fixtures
ESD covers
Safety automatic door
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The S790VXI Series2 represents the ultimate high-performance, mixed signal ATE system. Its advanced hardware technology, coupled with CATE software for fast effective program production, makes the S790 Series2 the ideal solution for addressing today's major board test concerns - test program generation,and diagnostic speed and accuracy.
Protecting your investment - with complete S700-series backward compatibility. Fully compatible with all Schlumberger S700 test systems, the S790 Series2 provides a complete, riskfree migration path for all S700 series test programs.
Protecting large investments into earlier S700 test programs and fixtures is, for most users, a major concern. The S790 Series2 protects your investment; its compatible architecture allows existing test programs and fixtures to be loaded and run - simply and robustly - providing an assured, risk-free migration path.
All diagnostic data is also ported, avoiding lengthy and costly revalidation of new or modified diagnostics
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Fault coverage and return on investment, two major factors affecting the choice of a test system in today's competitive markets.
Combine these with the flexibility to adapt as technology advances and you have the blueprint for the most desirable test system on the market.
From board to program - the solution
PinPoint II 14 slot, has been engineered to meet these criteria. It is the fastest, most economical functional test workstation available, giving the best return on investment in the industry whether configured for diagnostics or functional test.
PinPoint II has, in its high specification and modular design, the stride and flexibility to keep one step ahead of the fast evolving electronics market. It is equally well suited to `one-offs' as it is to production quantities and the combination of test technologies within the one powerful environment provides the key to the diverse range of applications the system is suited to. In-circuit functional test of both analog and digital components, edge card functional, VI analysis, boundary scan, PXI test and schematic reverse engineering can all be included in the same test platform. Flexibility extends further into the interfacing of the tester to the unit under test. The PinPoint II has been developed to adapt to the needs of the customer - clips, probes, edge connectors and bed-of-nails fixtures can all be used.
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ATE QT2256-320PXI system is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform.
It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.
It is an In-Circuit Device / cluster tester when High Current Pin Driver options are installed and interfaced to the UUT either through clips / probes or nail bed. Standard configuration is 64 Channels high current Pin Drivers.
It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 4 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with ATE digital and analog pin drivers.
To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System.
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General description:
The InnoLas wafer sorting system IL 2600 can automatically sort, split merge and transfer wafer from any slot / cassette to any other slot / cassette in a six cassette array.
Wafer sizes from 100 mm to 200 mm can be handled without any mechanical adjustment in a single or multi-batch operation.
The laser mark code read for verification can be located at any position on the front and/or backside of the wafer.
The basic model has one reading unit (OCR, BC412, T7) for reading the laser code on the frontside of the wafer.
A second reading unit (OCR, BC412, T7) for reading the code on the backside of the wafer can be mounted as an option.
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