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Lynx VS8 is an advanced stereo zoom microscope for Printed Circuit Board inspection and is ideal for all electronics applications including fine pitch, surface mount, TAB and BGA technology.
The Lynx VS8 consists of a stable, high capacity scanning stage that provides free floating movement for all sizes of board, including double sided PCBs. Stage can be locked for precision inspection tasks (x-axis, y-axis, or both). Complete with earthing point for static safe inspection.
Lynx VS8 provides magnification from x7 - x40 within the standard zoom range. An oblique and direct viewer can also be added to the modular system allowing the operator to view a subject direct or from an angle of 34° from vertical, which can be rotated through 360°.
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GOLD MCXI700
Inverted Metallurgical Microscope
Inverted microscopes are used for inspection, analysis and testing of microstructure of materials. The special design is necessary for observing large and heavy objects, e.g. metallurgical or electronic parts which are integrated in a compact body without special and expensive sample preparation.
OPTICS:
Objectives: MET ICO PLAN 5x/0.12, 10x/0.25, 20x/0.40, 50x/0.75; Eyepieces: EWF 10x/22 high eyepoint
MECHANICS
Body: stable, sturdy base, 360 x 280 mm; Head: ERGO head with variable inclination from 5° to 35°; Nosepiece: Quintuple ball-bearing nose-piece; Stage: Plain stage with glass insert plate; Illumination: 6V30W halogen for 100 - 240V / 50 - 60 Hz
OPTIONS
Photo/video port for ERGO head, binocular or trinocular head, objective MET ICO PLAN 100x/0.9, WD 0.7 mm, various eyepieces, attachable mechanical stage, auxiliary stages, photo/video adapters, digital cameras, aluminium carrying case
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Mantis Compact excels in the low magnification range for inspection or manipulation tasks where bench magnifiers have traditionally been used. Mantis Compact has a small footprint and low investment cost giving a superb price / performance ratio.
Patented optical technology allows operators freedom of head movement for superb ergonomics and hand-eye co-ordination, with the ability to wear glasses if required. Operators can increase productivity and improve quality, at an affordable price.
Mantis Compact offers: Superb hand-eye co-ordination for inspection and manipulation tasks; a choice of x4, x6 quick change objectives; Bright white, true colour, LED illumination providing over 10,000 hours of shadow-free viewing.
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MicroInspector II with microscope optic and big TFT
Inspection system for optical inspection with rigid endoscopes and microscope optics
The modular design allows all types of inspection using one system. This includes a sophisticated XYZ manipulator with a special object mount system, a MegaPixel camera set-up and an innovative Xenon lamp illumination system. One system provides both overviews and microendoscopic details.
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The measuring software SAPHIR makes this microscope an universal, though manual 2D-microscope, state-of-the-art tool. Esspecially while making first samples, the WM1 in combination with SAPHIR takes full advantage of its strenghts and capabilities.
Modular design, high optical quality via especially good surface light illumination and an excellent data reporting, these are prominent features of these microscopes.
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AM413ZT - Dino-Lite PRO (Polarizer)
The handheld digital microscope AM413ZT is a product extended from
handheld digital microscope AM413T by adding rotatable polarizer filter.
Simply by rotating the polarizer filter, the handheld digital microscope
AM413ZT could amazingly decrease the reflection glare to almost any extent, and could thus help the user see through the surface of fully or partially transparent materials, such as jewerly, skin, glass, and plastic, or see clearly the high reflectivity materials, such as metal or soldering. The handheld digital microscope AM413ZT could be very userful in some application including PCB, printing, machining, textile, jewerly, or skin care etc.
Product Features:
*Resolution: 1.3M pixels
*Adjustable magnification: 10x~50x, 200x
*Built-in 8 white-light LED illumination (software switchable)
*MicroTouch snapshot
*Frame rate: up to 30fps
*Interface: High speed USB image transmission (PC)
*Dimension:10cm (Height) *3.2CM (R)
*Software: DinoCapture
*With measurement & calibration capabilities
Support Operation System: Windows Vista, XP Professional x64 Edition, XP, 2000, or Windows Server 2003
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The VDM-E/Z™ is available with two interchangeable optics options:
- Patented Extended Depth of Field (EDF) Objective with on-axis lighting
- Zoom Objective with fiber optic ringlight and add-on lenses
The system is complete with fiber optic lighting and is available with a number of options to enhance its versatility. When inspecting small parts from any angle, VDM is the effortless clear choice.
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Lynx VS8 is an advanced stereo zoom microscope for Printed Circuit Board inspection and is ideal for all electronics applications including fine pitch, surface mount, TAB and BGA technology.
The Lynx VS8 consists of a stable, high capacity scanning stage that provides free floating movement for all sizes of board, including double sided PCBs. Stage can be locked for precision inspection tasks (x-axis, y-axis, or both). Complete with earthing point for static safe inspection.
Lynx VS8 provides magnification from x7 - x40 within the standard zoom range. An oblique and direct viewer can also be added to the modular system allowing the operator to view a subject direct or from an angle of 34° from vertical, which can be rotated through 360°.
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The XE-WAFER is a fully automated industrial AFM designed specifically to address surface roughness, trench width, depth and angle measurements on 200mm & 300mm wafers in a production environment. The system provides superior accuracy and precision nanometrology than any in the market today. Providing the highest resolution and the lowest gage sigma value imaginable for repeatability and reproducibility in the world, the XE-WAFER is the perfect solution for the semiconductor and hard disk drive industry which, until now, had very limited choice of industrial grade in-line inspection tools. We, Park Systems, take pride in providing you with the metrology solution you have been longing for.
- Allowable Sample Size (Up to 300mm Wafers)
- Allowable Scan Size (100 μm x 100 μm, Optional: 200 μm x 200 μm)
- Automatic Data Acquisition & Analysis of High Aspect Ratio Trench Features on Wafers
- Acoustic Enclosure with Built-in Anti Vibration Isolation System
- Designed Specifically for Production Facilities
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