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The 5800 series is a multi-configuration multi-functional test system that is designed to meet the ever changing needs of today's electronic manufacturing environment. An open approach to both hardware and software has been adopted. The open software architecture enables integration with code written using third party software such as Teststand™, Labview™, C#™ and VB.NET™, in short any platform that is .NET compliant.
The open hardware architecture allows configurable chassis and interface styles to accommodate low cost analog in-circuit testing, through to high integrity analog and digital functional test solutions. The integrated 21-slot PXI based backplane enables the user to implement solutions using not only Aeroflex PXI cards but also cards from any PXI card supplier. The 5800 Series of testers comprises three body styles, the 5850, 5830 & 5820.
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AutoPoint DT is a fixtureless, gridless flying probe with a unique power-off impedance analysis measurement system. Excellent for Manufacturing Defect Analysis (MDA) testing and Field Return Failures.
Supplied as a Stand Alone System or integrated with the PinPoint II Advanced Diagnostic Test System System
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IPTE develops test equipment, test handlers and turn-key solutions for the automation of testing and adjustments of PCB's and electronic products
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The S790VXI Series2 represents the ultimate high-performance, mixed signal ATE system. Its advanced hardware technology, coupled with CATE software for fast effective program production, makes the S790 Series2 the ideal solution for addressing today's major board test concerns - test program generation,and diagnostic speed and accuracy.
Protecting your investment - with complete S700-series backward compatibility. Fully compatible with all Schlumberger S700 test systems, the S790 Series2 provides a complete, riskfree migration path for all S700 series test programs.
Protecting large investments into earlier S700 test programs and fixtures is, for most users, a major concern. The S790 Series2 protects your investment; its compatible architecture allows existing test programs and fixtures to be loaded and run - simply and robustly - providing an assured, risk-free migration path.
All diagnostic data is also ported, avoiding lengthy and costly revalidation of new or modified diagnostics
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Fault coverage and return on investment, two major factors affecting the choice of a test system in today's competitive markets.
Combine these with the flexibility to adapt as technology advances and you have the blueprint for the most desirable test system on the market.
From board to program - the solution
PinPoint II 14 slot, has been engineered to meet these criteria. It is the fastest, most economical functional test workstation available, giving the best return on investment in the industry whether configured for diagnostics or functional test.
PinPoint II has, in its high specification and modular design, the stride and flexibility to keep one step ahead of the fast evolving electronics market. It is equally well suited to `one-offs' as it is to production quantities and the combination of test technologies within the one powerful environment provides the key to the diverse range of applications the system is suited to. In-circuit functional test of both analog and digital components, edge card functional, VI analysis, boundary scan, PXI test and schematic reverse engineering can all be included in the same test platform. Flexibility extends further into the interfacing of the tester to the unit under test. The PinPoint II has been developed to adapt to the needs of the customer - clips, probes, edge connectors and bed-of-nails fixtures can all be used.
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Features
Integrated test system
Compact footprint
Fixtures compatible with TCIL-P and TCIL-TS
Compact PLC for internal controls
Visualization and tester interface on external PC (e.g. tester PC) via USB interface
Stand alone operation
Manual width adjustment
SMEMA Interface
Compatibility with all standard test systems
Options
Product specific fixtures
ESD covers
Safety automatic door
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ATE QT2256-320PXI system is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform.
It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.
It is an In-Circuit Device / cluster tester when High Current Pin Driver options are installed and interfaced to the UUT either through clips / probes or nail bed. Standard configuration is 64 Channels high current Pin Drivers.
It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 4 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with ATE digital and analog pin drivers.
To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System.
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General description:
The InnoLas wafer sorting system IL 2600 can automatically sort, split merge and transfer wafer from any slot / cassette to any other slot / cassette in a six cassette array.
Wafer sizes from 100 mm to 200 mm can be handled without any mechanical adjustment in a single or multi-batch operation.
The laser mark code read for verification can be located at any position on the front and/or backside of the wafer.
The basic model has one reading unit (OCR, BC412, T7) for reading the laser code on the frontside of the wafer.
A second reading unit (OCR, BC412, T7) for reading the code on the backside of the wafer can be mounted as an option.
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