Measuring microscopes

45 Industrial products | 21 Companies
 
 
Guiyang Xintian OETECH
Measuring microscope Guiyang Xintian OETECH

Features:
The master microscope is equipped with multiple eyepieces and objectives, with large view field and sharp imaging;
The photoelectric and digital technology ...

Toolmaker's microscope for measuring and inspection Guiyang Xintian OETECH

JX14B Digital Large Tool Microscope
It can measure accurately the size, angle, shape and position of the different workpieces, and various parameters of external thread. This machine is suit for using in measuring room, inspection station, colleges and universities together with science
research ...

Measuring microscope  max. 180 mm | JD20 Guiyang Xintian OETECH

Features:

Characteristics
The minimum division value reaches 0.2μm, high ...

Sipcon Instrument Industries
Measuring microscope  SDM-TR-3D Sipcon Instrument Industries

fully versatile high precision measuring microscope ...

Technolab GmbH Germany
Video measuring and inspection microscope  EasyInspector Technolab GmbH Germany

EasyInspector

The EasyInspector is a portable high-resolution video microscope with autofocus (Full HD resolution ...

RAM Optical Instrumentation (ROI)
Video measuring and inspection microscope  150 x 75 mm | StarLite GX RAM Optical Instrumentation (ROI)

The StarLite GX is the newest design in a complete non-contact inspection system with interactive measurement capabilities at your fingertips. It is everything you need for accurate video measurement.

Interactive ...

Video measuring and inspection microscope  300 x 300 mm | Sprint 200-300 RAM Optical Instrumentation (ROI)

Sprint™ models 200 to 300 are precision instruments designed for easy focusing and part positioning.

Sprint systems are an excellent choice for ...

ADVANTEST Test and Measurement
Scanning electron microscope (SEM) for photomask  E3620 ADVANTEST Test and Measurement

The E3620 is a Scanning Electron Microscope (SEM)-based Critical Dimension (CD) measurement system for photomasks.
This CD SEM metrology system was designed specifically for 45nm technology node production and 32nm process development.
Its proprietary technology, ...

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