motion up to 180 µm
high resonant frequency
parallelogram construction
additional mass up to 20 kg
applications:
quality control
automation
fine adjustment of optical components
mikro-assembly
This element was originally developed for quality control in the optical industry %u2013 it consists of a piezostage in combination with a micrometer drive.
The user can first adjust the position of the actuator manufacturer and then fine-tune this position with the aid of the piezostage.
The resolution is in the nm and sub-nm range.
Because of the very robust construction of the element, an additional mass of up to 20 kg can be lifted.
• SYLVAC inductive measuring system, patented
• Digital display LCD, height of digits 6 mm
• Data output RS232, combined with external power feeding
• Simplex transmission
• Rotating display Ø 44 mm over 270°
• Non-rotating manufacturers of spindle
• Tungsten carbide anvil
• Fine adjustment as accessory
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