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| PolaWiseTM is an advanced polarization measurement system for accurate characterization of all polarization related properties of light sources and optical materials. Based on General Photonics' patented magneto-optic polarization generation and analysis technology, the PSGA-101-A is specially designed for fiber optic applications and can effortlessly accomplish multiple functions, including polarization state generation (PSG), polarization state analysis (PSA), polarization extinction ratio (PER) measurement, polarization dependent loss (PDL) measurement, and polarization mode dispersion (PMD) measurement. Another attractive feature of the instrument is its large flip-top LCD graphic display design, an industry first that allows large viewing area on a compact, portable enclosure. Furthermore, a 2x20 character LCD is also included on the front panel for easy operation of the instrument for applications that do not require a graphic display, such as PER measurement. The instrument comes with an internal tunable laser for PDL and PMD measurement up to 10 ps. It can also control tunable lasers from third parties via a GPIB port for measurement of larger PMD values. The instrument also comes with a VGA port for use with an external LCD graphic display of the user's choice. PolaWiseTM: a wise instrument and a smart choice! |
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Verify the opacity of containers with on-line, high-speed, accurate and reliable measurements. The OPAX-1000™ combines proven sensor technology with innovative hardware to provide an easy-to-use system to measure light transmission in a wide variety of applications.
Many products require packaging designed to protect the contents from the damaging effects of light. Establishing pass/fail criteria for minimum opacity of these containers and providing on-line measurement eliminates defects and allows real-time quality control of these processes. The OPAX-1000™ provides a reliable solution, allowing you to monitor every container, and identify and remove containers with low opacity. |
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The control of surface microroughness on a hard disk is critical for manufacturers. The TMS 2000-RC from Schmitt Measurement Systems more than meets this challenge and several versions of this device are available. Schmittt revolutionized disk manufacturing technology by providing the fastest, most accurate, non-contact texture measurement system in the world - laser technology of the future available today.
The TMS 2000-RC provides fast, accurate, repeatable microroughness measurements for computer hard disk manufacturers. The system quadruples production throughput, compared to other testing devices. |
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| Measurements of diameters without contact. The haloes present in a Petri dish can be sized with this device only by pushing the reset button in one edge of the spot and moving the holder to the opposite edge of the halo. The display shows the diameter with an accuracy of 0.1 mm. |
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| The Power Wizard™ power meter from Synrad offers a unique solution to the measurement of laser power and serves as a service tool to ensure maximum laser performance at any time. Designed to measure power levels from 1-250W, the PW-250 provides accurate measurement of average laser power, which is displayed on an easy-to-read LCD screen. |
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| Coherent offers the broadest line of laser power meters and laser energy meters available anywhere. In addition, as the world's leading producer of laser systems, we thoroughly understand the practical requirements and challenges of using laser measurement tools. This puts Coherent in a unique position to configure a laser measurement system that provides the right combination of performance, features and cost for your particular needs. The modularity of the Coherent system also ensures that your investment will be protected as your needs evolve or change. |
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Features
-NIST traceable calibration
-Measures power and wavelength with ILX Power/Waveheads
-Integrating sphere-based power measurements
-Measurement heads cover a wide wavelength range from 350 to 1700nm
-Power measurement up to 10W
-Free-space and fiber measurement heads
-Easy test system integration with standard GPIB interface |
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| The OP710 offers an economical approach for optical power measurement applications where multiple channels are needed. Unlike other systems this instrument is built up with individual power meters allowing for unparalleled simultaneous data acquisition over all channels. |
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OAI's Model 306 UV Power Meter is a highly reliable direct reading Instrument designed expressly for measuring light intensity at the wafer plane of mask aligners, UV curing light sources, and any other UV light source. Special probes enable measurement of light in the visible range. Calibration accuracy is within +/- 3% and is NIST traceable. Measurement repeatability is within /- 1%. It is auto ranging from 0.1 to 1999 mw/cm2 full scale and has 1% linearity in this range. This instrument features meter to meter matchability.
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| The MetaPULSE® System uses patented picosecond ultrasonic laser sonar (PULSE™) technology to provide the industry's first production-worthy opaque film metrology tool. Its small-spot, non-contact, non-destructive technology enables on-product thickness measurements of single or multi-layer opaque films for aluminum and copper processes. In addition to thickness, the MetaPULSE identifies missing layers or interfacial problems such as poor adhesion, and characterizes material properties such as density and roughness. MetaPULSE is used by all of the top ten semiconductor manufacturers, and nearly 200 tools are currently providing production monitoring in fabs around the world. |
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The measuring systems series MFE (metrology front end) is
particularly suited to manufacturers of structured wafers, masks,
MEMS and similar products. Because of the very high cleanliness,
process and yield requirements, all tools are especially designed
for use in cleanrooms.
MFE systems measure critical dimensions and overlays on the
one hand and 3D topography or film thickness on the other.
All tools are metrological and comply with the necessary industry
standards such as the SECS II / GEM software interface.
Furthermore, the system is fully automated and equipped
with wafer cassettes and part carriers.
An EFEM and mini-environment for class 1 cleanrooms
rounds off the upper segment of the MFE tool series. |
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