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AQ6319
Powered by constant technological innovation, Ando presents its new flagship, the AQ6319 optical Spectrum Analyzer. The new AQ6319 packs the power of cutting-edge technologies with many years of research. It holds the best optical performance on the market and provides customers with a user-friendly interface for faster and more accurate measurement. In fact, the AQ6319 raises the standards in the optical testing industry.
With an unprecedented wavelength accuracy of ±10 pm (1520-1580 nm), the AQ6319 OSA has become an outstanding instrument in both general and specialized R&D labs for high accuracy wavelength measurement. Ando keeps the "free-space" design between the incident beam and the monochrometer; this proven technology which is inherited from the world-renowned AQ6317 series OSAs offers much greater facility for researchers using specialty fibers, especially with large core diameters. The new AQ6319 offers a much faster sweep speed than the previous models. It also features a LAN connection for faster and easier data transfer, as well as remote control capabilities. In addition, many new analysis functions have been included.
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The BaySpec’s CWDM Series Optical Spectrum Analyzer (OSA) is an embedded, integrated monitor that delivers precise measurement and powerful processing capabilities to coarse wavelength division multiplexing (CWDM) applications compliant with the ITU-T G.695 standard.
Coarse Wave Division Multiplexing (CWDM) combines up to 18 wavelengths onto a single fiber. CWDM technology uses ITU standard 20nm spacing between the wavelengths, from 1310nm to 1610nm. High reliability (GR-1209/1221 qualified) is achieved through a rugged mechanical design with no moving parts. Periodic calibration is not required. Input/Output (I/O) is provided through a dual port RAM interface accessed through ADD/DAT bus direct connection or serial (RS232 or USB) communications.
The CWDM OSA Series employs a highly efficient Volume Phase Grating (VPG) as the spectral dispersion element and an ultra sensitive InGaAs array detector as the detection element, thereby providing high-speed parallel processing and continuous spectrum measurements. As an input, the device uses a tapped signal from the main data transmission link through a single mode fiber, then collimating it with a micro lens. The signal is spectrally dispersed with the VPGâ, and the diffracted field is focused onto an InGaAs array detector. The control electronics read out the processed digital signal to extract required information. Both the raw data and the processed data are available to the host through the supported interfaces.
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The ultimate platform for network experts. Combines physical, optical, transport and datacom testing in a single box. Perform simultaneous acquisitions and fast data post-processing, and benefit from a scalable range of test applications and field-interchangeable modules.
Key Features and Benefits
Five configurations (two-slot, four-slot, seven-slot, eight-slot and bus protector), providing maximum flexibility for long-haul, metro, DWDM, high-fiber-count, Ethernet, SONET/SDH or DSn/PDH test applications
Pentium-powered, with up to 512 MB memory
Easy-to-read, high-resolution 12.1 inch TFT screen
Windows® operating system
Simultaneous acquisitions and fast data post-processing
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An all-parameter evaluation instrument providing a comprehensive characterization of modules and subsystems of up to 70 meters of device length.
* All-parameter analysis (loss, dispersion, PMD, etc)
* Total system integration
* High resolution S-C-L band capability
* Real-time measurements
* Integrated, easy to use interface
* Time domain viewing
* Complete polarization response
* Look inside devices - time domain viewing
* Automatic internal calibration
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Spectrographs are optical emission monitors that integrate sophisticated embedded processors and software designed to provide intelligent instrument control, data acquisition and endpoint interface capabilities.
Spectrograph SD1024F™ – High Performance
Features and Benefits
- Provides robust endpoint determination
- SpectraView™ software provides:
Variety of algorithms
Tool integration via Ethernet, RS232, and DI/O
- Use for endpoint detection, fault detection, and process diagnostics
- 200–800nm range
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Q8384 is a high-grade optical spectrum analyzer (Advantest) with a 4-pass monochromator and extremely low polarization dependance. Thanks to a special method used, a value of ±0.05 dB can be guaranteed, the typical value is as low as 0.02 dB. The narrowest resolution bandwidth and the broad dynamic range make the Q8384 an ideal measuring instrument in the DWDM technology for closest channel spacing. A special measurement function allows the automatic determination of erbium-doped fiber amplifiers (EDFA) parameters; these are e.g. noise figure, gain and spontaneous emission by simple comparison of the signal at the amplifier input with the signal at the amplifier output.
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Aaronia EMC Bundle:
Measurement Kit for straightforward pinpointing and measurement
of interference sources
- Pinpointing interference sources
- Estimation of interference field strength
- Verification of shielding and filtering measures
- Identifying faulty components
- Detecting circuitry overly sensitive to interference
It is perfect for locating interference sources which might have
been found e.g. in an EN55011, EN55022 or EN50371 (Class A
or Class B) survey.
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KRONOS V is the first turn-key system designed to provide true spectral content based, objective real-time engine knock detection and multi-cylinder acoustic analysis.
Significantly reduces time to map an engine from weeks to hours
Closed loop control of engine mapping process for "lights-out" operation
Improves efficiency by minimizing operator intervention required during tests
Provides superior data capture enabling detection, analysis, and replay of knock conditions
Can be added to most existing combustion systems for complete automated testing
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LEED IMAGE ANALYSIS SYSTEM
Model LIM08
Contains low light integration CCD camera, frame grabber, and ambient light cover
Features
Integrated image acquisition and beam energy control on regular and zoomed images
Measurements on "live" or "saved" images
Lattice constant calculations
Spot Intensity profile with fine adjustment
Manual and automatic I-V measurements
Subtraction and addition of images
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