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The 5800 series is a multi-configuration multi-functional test system that is designed to meet the ever changing needs of today's electronic manufacturing environment. An open approach to both hardware and software has been adopted. The open software architecture enables integration with code written using third party software such as Teststand™, Labview™, C#™ and VB.NET™, in short any platform that is .NET compliant.
The open hardware architecture allows configurable chassis and interface styles to accommodate low cost analog in-circuit testing, through to high integrity analog and digital functional test solutions. The integrated 21-slot PXI based backplane enables the user to implement solutions using not only Aeroflex PXI cards but also cards from any PXI card supplier. The 5800 Series of testers comprises three body styles, the 5850, 5830 & 5820.
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IPTE develops test equipment, test handlers and turn-key solutions for the automation of testing and adjustments of PCB's and electronic products
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Features
Integrated test system
Compact footprint
Fixtures compatible with TCIL-P and TCIL-TS
Compact PLC for internal controls
Visualization and tester interface on external PC (e.g. tester PC) via USB interface
Stand alone operation
Manual width adjustment
SMEMA Interface
Compatibility with all standard test systems
Options
Product specific fixtures
ESD covers
Safety automatic door
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The S790VXI Series2 represents the ultimate high-performance, mixed signal ATE system. Its advanced hardware technology, coupled with CATE software for fast effective program production, makes the S790 Series2 the ideal solution for addressing today's major board test concerns - test program generation,and diagnostic speed and accuracy.
Protecting your investment - with complete S700-series backward compatibility. Fully compatible with all Schlumberger S700 test systems, the S790 Series2 provides a complete, riskfree migration path for all S700 series test programs.
Protecting large investments into earlier S700 test programs and fixtures is, for most users, a major concern. The S790 Series2 protects your investment; its compatible architecture allows existing test programs and fixtures to be loaded and run - simply and robustly - providing an assured, risk-free migration path.
All diagnostic data is also ported, avoiding lengthy and costly revalidation of new or modified diagnostics
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Fault coverage and return on investment, two major factors affecting the choice of a test system in today's competitive markets.
Combine these with the flexibility to adapt as technology advances and you have the blueprint for the most desirable test system on the market.
From board to program - the solution
PinPoint II 14 slot, has been engineered to meet these criteria. It is the fastest, most economical functional test workstation available, giving the best return on investment in the industry whether configured for diagnostics or functional test.
PinPoint II has, in its high specification and modular design, the stride and flexibility to keep one step ahead of the fast evolving electronics market. It is equally well suited to `one-offs' as it is to production quantities and the combination of test technologies within the one powerful environment provides the key to the diverse range of applications the system is suited to. In-circuit functional test of both analog and digital components, edge card functional, VI analysis, boundary scan, PXI test and schematic reverse engineering can all be included in the same test platform. Flexibility extends further into the interfacing of the tester to the unit under test. The PinPoint II has been developed to adapt to the needs of the customer - clips, probes, edge connectors and bed-of-nails fixtures can all be used.
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ATE QT2256-320PXI system is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform.
It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities for conventional PCBs.
It is an In-Circuit Device / cluster tester when High Current Pin Driver options are installed and interfaced to the UUT either through clips / probes or nail bed. Standard configuration is 64 Channels high current Pin Drivers.
It has in-built 20MHz 12bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices.
Integrated Boundary Scan Test controller (Up to 4 Chains) and software package can be used to test today’s PCBs with high density / high pin count devices. Uses latest technology Boundary Scan hardware with RAM based drivers / sensors in synchronization with ATE digital and analog pin drivers.
To effectively test CPU based boards without excluding the CPU from the test, the system offers optional Qmax patented Bus Cycle Signature System.
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The functional testers with AC timing that has been dominating the market cost in excess of USD300K upwards. The cost of maintaining such a tester is also exorbitant. Ultimately, this increase the final cost of the product.
Qmax latest innovative product, the "No Foot- print" QT2216 Full Functional mixed signal tester is designed to help the semiconductor companies doing final test be more competitive in the following ways:
1. Much lower cost of test equipment
2. No Foot Print means less space needed on test floors
3. Lower maintenance cost
The advantage of the QT2216 is its adaptability. It can be loaded with different modules to alter its configuration for different tests. It can be configured to test ADC including sigma delta type, DAC, digital, opto, linear, high voltage / current devices etc.
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SIM-Small Instrumentation Modules-is a compact test and measurement platform for a wide range of applications. Unlike other modular systems, SIM offers complete front-panel as well as remote operation, allowing you to choose between manual and computer control. Up to eight instruments share the same mainframe which provides power, clock synchronization, communications, and module status. For additional versatility, you can cascade mainframes or other RS-232 instruments, and even operate modules outside the mainframe.
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The GX1110 is a high performance, single-channel PXI arbitrary waveform generator that offers function generator and arbitrary waveform generator functionality within one instrument. Built-in waveforms are available for use with both the DDS or AWG modes of operation and include Sine, Triangle, Ramp, Noise, Gaussian pulse and Sinx/x. A flexible sequencer is also available as part of the AWG's architecture, supporting the generation of complex waveforms.
The GX1200/1201 is a single-channel PXI-based Arbitrary Waveform Generator. The GX1200/1201 is a high performance waveform generator that combines many powerful functions in one small package.
The GX1200/1201 is a single-channel PXI-based Arbitrary Waveform Generator. The GX1200/1201 is a high performance waveform generator that combines many powerful functions in one small package.
The GC1300 is a single-channel PCI-based Arbitrary Waveform Generator. It is a high performance waveform generator that combines many powerful functions in one small package. Supplied free with the instrument is Arbconnection software, which is used for controlling the GC1300 and for generating, editing and downloading waveforms from a remote computer.
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The GP1616H function generator is a programmable instrument capable of generating predefined Sine, Square, Triangle, Ramp, Haversine, Haver triangle and Pulse waveforms as well as a programmable DC output. The firmware is customized to be fully compatible with the Hewlett Packard 8116A GPIB command set. Software test procedures using the original HP8116A instrument require no code modification when upgrading to the GP1616H.
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The GP1550 series features:
- pulse widths from 10nS to 10S
- delays from 0nS to 10S with up to 6-digits resolution.
- Output levels are from -10V to +10V, with pulse amplitudes from 0.5V to 10Vp-p into a 50 Ohm load.
The GP1612H features:
- variable pulse widths from 10 ns to 10 s,
- delays from 0 ns to 10 s with up to 6 digits resolution
- adjustable output levels from -8V to +8V, with pulse amplitudes from .1V to 16Vp-p into 50 ohms load (.2V to 32Vp-p into open circuit).
These Pulse Generators also feature selectable complementary pulse and double pulse, in continuous, triggered, gated and counted burst modes.
They allow selection of predefined amplitude and offset for critical stimulus and testing of major semiconductor technologies as TTL, CMOS and ECL.
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The GC1300 is a single-channel PCI-based Arbitrary Waveform Generator. It is a high performance waveform generator that combines many powerful functions in one small package. Supplied free with the instrument is Arbconnection software, which is used for controlling the GC1300 and for generating, editing and downloading waveforms from a remote computer.
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The GTX22x0 family of universal time interval counters provides all the features of stand-alone counters in PXI form factor. There are three versions of the PXI counters, GTX2210, GTX2220 and GTX2230. The GTX2210 support frequency range up to 225MHz, the GTX2220 to 1.3GHz and the GTX2230 covers frequencies up to 2GHz.
The GTX22x0 series counters have two signal input channels via BNC connectors, an external timebase, arm input, and a gate signal output. The separate input signals can be used for Arming and Gating the circuitry, and controlling the timing of the analysis (start/stop duration) for more meaningful measurements.
The GTX22x0 series counters are universal in that they provide many measurement functions of other frequency counters, including frequency, period, and time interval. The GTX22x0 series also have event counting and timing functions over a single channel, such as totalize and ratio between channels.
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The ETA-GT II geometrical tester is a compact measurement system for all stages of disc manufacture - including stamper verification, half-disc and bonded discs.
It enables all relevant geometrical data to be determined, including the inner hole and the lead-in and lead-out diameter. The disc tray permits measurement of disc eccentricity relative to the inner groove (lead-in) as well as to the outer groove (leadout). With its easy-to-use, intuitive user interface, it provides a graphic representation of accuracy for measured geometrical data such as eccentricity, unroundness and layer shift of optical
discs or stampers.
While the ETA GT II serves CD as well as DVD, the ETAGT II / Blue provides one measurement system for all formats CD/DVD/BD.
KEY BENEFITS
- Geometrical tester for all stages of disc manufacture,
from stamper verification to molded CD or half discs to
bonded DVD and BD (optional)
- Measuring all cases: Prerecorded, recordable and
rewritable
- Ready for Blu-Ray single and dual layer discs (ETA-GT II
/ Blue)
- ETA-GT II (CD/DVD) upgradable to ETA-GT II / Blue
(CD/DVD/BD)
- Evaluation of eccentricity and unroundness
- Layer shift evaluation for dual-layer DVDs and BDs
- Evaluation of inner hole, plus inner and outer groove
diameter
- Indicator axes for adjustements to compensate eccentricity
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