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The new Dektak Xtl™ stylus profile gives amazingly exact, repeatable, and reproducible metrology for an extensive variety of applications. With its capability to suit examples of up to 350mm x 350mm, this framework brings fanciful Dektak execution to 200mm and 300mm wafer manufacturing....

The The Dektak XT™ stylus profiler, manufactured by Bruker, has an innovative design that provides optimum consistency of under five angstroms...


The LJ-V series is the world's fastest 3D laser inspection system at 64,000...


From the highly recognized and world class brand of Nikons innovation is proprietary scanning-type optical interference measurement technology achieves height resolution. Nikon provides...


The Alpha-Step D-500 Stylus Profiler offers industry-leading high resolution 2D profiling, 2D stress, profile stitching and many additional features in an easy-to-use platform. The system includes a 140 mm manual stage and an innovative optical lever sensor technology. The Alpha-Step...

The P-17 stylus profiler offers industry leading surface measurement repeatability for reliable measurement performance. The surface measurement tool has 200 mm scan length standard - the only stylus profiler on the market to offer long scan capability without the need for stitching. The UltraLite® sensor includes dynamic force control, excellent linearity, and the...

KLA-Tencor offers complete optical interferometer solution and surface profilometer targeting the needs of the research and engineering community. The optical interferometer and 3D surface...

The Alpha-Step IQ is a mechanical, stylus-based step profiler that can measure waviness, roughness, step heights up to 0.1%, save programs for later use, provide data analysis and image capture of scans....


The Panasonic UA3P profilometer series is designed to measure aspherical lenses & molds, semiconductor wafers, and any other precision component requiring nanometer level accuracy ranging...

Panasonic recently released the UA3P-L to measure vertical wall surfaces and inside surfaces for all holes including micron-sized...


The Sensofar S line can be used for non contact optical three dimensional profiling which opens new arenas towards 3D experience.It consists of a combination of confocal and interferometry techniques in the...

The Plu Series is a control of production unit which was designed by Sensofar for optical characterization of large samples. Built with the Sensofar optical profiling technology, the series...


The Laser Profilometer can be used for quantifying geometrical parameters of wheel flange and tire thickness. It comes with an integrated RF603 laser...


The PGI 1240 is utilized as a measurement system, for small to medium sized aspherics optics market. The unit is suitable for applications, which require...

The PGI Dimension Series, manufactured by Taylor Hobson®, is a surface profiler that gives the 3D form a precise measurement in hollow and lofty aspherical lenses as well as modules...

The PGI 840 Model of Profilometer, manufactured by Taylor Hobson, is specifically designed for optical industry applications. It is mainly used to permit aspheric lenses to be...

The CCI HD is a non-contact optical 3D profiler. It has the capabilities for thin and thick film measurements. It uses a correlation algorithm that is innovative and patented to located the coherence...

The CCI MP Series, manufactured by Taylor Hobson®, is a non 3D profiler interferometer with a modified measurement type that utilizes a creative correlated algorithm that is monopolized that...


Measurements: automated measurement of surface texture (ISO 25178) and profile roughness (ISO 4287)

The IF-Profiler is a 3D profilometer to measure surface finish including form in a high vertical resolution. Roughness is measured based on the extraction of a linear profile (Ra, ) according to ISO 4287/88. In addition, users benefit from areal based roughness measurement according...


Profile360 is an in-line, real-time, non-contact measurement system for continuously monitoring key profile dimensions in complex shapes such as rubber, ceramic, plastic, and wood-plastic composite...


The 3D profilometer µscan custom that is made to measure topography, height profile or layer thickness in production processes. Its...


The NanoCam Sq dynamic optical profiler measures surface roughness on small and large optical quality surfaces. The non-contact NanoCam Sq replaces slow, messy replication methods required with traditional workstation optical profilers.

By enabling on-machine...


The Shape Die System is suitable for the measurement of shape, and depth profile of the inner die. It is utilized for improving the quality, and saving operational costs through early testing. Also,...


Cost-effective profilometer and 3D scanning solution
Integrated motion system with 50 mm travel
User friendly concept
Sophisticated analysis and automation software

The cyberSCAN VANTAGE 50 is a compact, non-contact profiling system for fast scanning of...

High-speed and high-resolution 3D scanning system
Raster sizes up 10.000 x 10.000 data points
User friendly concept
Sophisticated analysis and automation software


Large 315 mm x 315 mm scanning area
Fast, precise and accurate measurement on small and large samples
User friendly concept
Sophisticated analysis and automation software


Large 350 mm x 350 mm scanning area
Large z-range at high resolution using a closed loop axis
User friendly
Sophisticated analysis and automation software

The CT 350S is a non-contact profilometer with a 350 mm x-, y-scanning stage and...

Dual non-contact measurement system
3D mapping of thickness, bow, warpage and rouhgness
User friendly concept
Sophisticated analysis and automation software

The CT 350T is a non-contact double-sided optical profilometer with a 300 mm x-, y- scanning stage. The upper sensor is mounted on a highly accurate...


The MicroSpy® Profile is an optical single-sensor profilometer for budget...

The MicroSpy® Mobile is as a portable surface metrology unit, perfectly suited for direct surface...

The MicroProf® 100 is the established measurement device for easy...

The MicroProf® 200 is the most successful model from the FRT...

In development, production or quality assurance the measurement of flat, extended structures is problematic. Besides...


The SPG-1000 digital surface profile gauge will allow the peak to valley height of blast cleaned surfaces to be accurately...


The non-contact profilometer Viking for affordable laser measuring

Solarius Development introduces a new low-cost non-contact laser profilometer, Viking. The tool is designed to...


Model 7505-01 Multi-function Optical Profiling System
Chroma 7505-01 Multi-Functional Optical Profiling System applicable for micro-nano and wide range measurement
1D, 2D and 3D measurement capabilities
Equipped with film measurement function (1D) to do non-destructive film thickness measurement when penetrating reflection measurement is in use
Perform 2D defect measurement via...


The Filmetrics F42 can map the thickness of films, such as OSP, at over one-million points, each with a spot size as small as 3 microns. Using an integrated CCD camera, live video makes it easy to pinpoint exact measurement locations. Once the feature is...


The NewView™ 7100 white light interferometer provides affordable versatility in non-contact surface profiling. With powerful tools for characterizing and quantifying surface roughness, step...

Building on the proven reliability of ZYGO's trusted NewView optical profiler, ZYGO's NewView Delta provides important operational and performance enhancements which make it easy to measure precision parts right on the factory floor. The NewView Delta extends the field...

ZeMapper™ Optical Profiler
Zemetrics ZeMapper System

Key Features:

• Rigid platform improves stability and increases accuracy by reducing vibration-induced errors.

• Point and click move-to-measure automation.

• Computer-controlled 5-axis motorized precision stages.

• High-res, low-noise, 4 megapixel sensor delivers...

FC-CSP Strip Automatic HVM Inspection
CSP-3000 - Full inspection of FC-CSP strips round and flat bumps
Full Inspection of FC-CSP Strips
Round and Flat Bumps
Inspecting a mixture of round and flat bumps in a single measurement is no problem on CSP-3000, the only inspection tool capable of measuring both. It is Zygo's third generation...


How to choose this product


Traditional profilometers consist of a very fine probe in contact with the surface to be measured. Its tip moves parallel to the surface, along the x and y axes. Irregularities cause the tip to move perpendicular to the surface, in the z axis. Optical versions replace the tip with a non-contact probe.


These instruments are used in quality control laboratories to provide information on the state of an object's surface. This is important in polishing and stripping operations. They monitor flatness, smoothness, particle size, manufacturing and machining faults of all types of material.


There are both contact and non-contact profilometers. In the former, a stylus moves over the surface, providing information on changes in the z axis, perpendicular to the surface. The latter typically use an optical device to obtain a three-dimensional image of the surface. In some, a laser beam sweeps the study area. In others, images taken from different angles can be used to generate a 3D representation of the surface on a computer.

How to choose

Choice will depend on required precision, from several nanometers to several micrometers, and whether the surface under examination is hard or ductile. Other factors include the speed of data acquisition and whether the probe is likely to scratch or deform the surface.


Contact profilometer:
- Compatibility with all surfaces
- Not affected by surface optical qualities
- High resolution
- Relatively inexpensive

Optical profilometer:
- No contact
- No surface deterioration
- Fast


Contact profilometer:
- Slow
- May scratch surface
- Influenced by surface hardness

Optical profilometer:
- Limited operating radius

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