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Variable pressure scanning electron microscope (VP-SEM) SU3500 Hitachi High-Technologies Europe
The new Hitachi SU3500 VP-SEM defines a new class in imaging performance well above the well established tungsten source SEM fleet on the market today. The clear...
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Scanning electron microscope (SEM) EVO Carl Zeiss Microscopy
EVO MA - for Materials Analysis High performance, total flexibility The EVO MA series of scanning electron microscopes are an indispensable tool for every application area in materials analysis. From aggregates to zeolites, the research grade EVO SEM will provide an imaging solution to drive your enterprise forward. Three different chamber types accept the widest range of specimen sizes whilst imaging...
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Scanning electron microscope (SEM) Jeol
JEOL has played a leading role in the development and evolution of scanning electron microscopy since the early 1960s. Over the past five decades, the SEM has become an indispensable tool in both advanced research and routine analysis for science and industry. JEOL has installed more than 8000 SEMs worldwide. SEMs are continually finding new applications in nanotechnology, where nano-fabrication...
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Field emission scanning electron microscope (FE-SEM) Agilent Technologies
The Agilent 8500 FE-SEM is a compact system that offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. The innovative 8500 has been optimized for low-voltage...
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Scanning electron microscope (SEM) for fiber analysis 0.04 - 100 nm | Fibermetric Phenom-World
Direct observation and measurement of micro and nano fibers is faster, more efficient and easier than ever before, with the improved Fibermetric application. In combination with the Phenom G2 pro desktop scanning electron microscope, the Fibermetric application allows you to produce accurate size information from micro and nano fiber samples. Recent developments have enabled us to extend...
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Tabletop scanning electron microscope (SEM) 30,000x Hirox Europe
New HIROX Tabletop SEM: Desktop Scanning Electron Microscope with integrated EDS BRUKER-AXS! Easy to use, fast, performant and easy maintenance, the HIROX Tabletop SEM combines the simplicity of an optical microscope...
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Scanning electron microscope (SEM) E3620 Rohde & Schwarz Europe
The E3620 is a Scanning Electron Microscope (SEM)-based Critical Dimension (CD) measurement system for photomasks. This CD SEM metrology system was designed specifically for 45nm technology...
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Scanning electron microscope (SEM) for photomask E3620 ADVANTEST Test and Measurement
The E3620 is a Scanning Electron Microscope (SEM)-based Critical Dimension (CD) measurement system for photomasks. This CD SEM metrology system was designed specifically for 45nm technology node production and 32nm process development. Its proprietary technology, the...
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Scanning electron microscope (SEM) MULTISCAN Lab OMICRON
Complementary surface analysis at the very same sample area Goniometer mounted high stability sample stage UHV Gemini for SEM with lateral resolution below 3nm SAM with lateral resolution below 5nm Atomic resolution STM and QPlus AFM FIB, EBL, EBID for nanostructuring SEMPA...
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Scanning electron microscope (SEM) Nano Scientific Corp
The NANO Scientific SEM is a high-performance scanning electron microscope for fast characterization and imaging of fine structures on both...
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The BRR™, a fully integrated SEM/AFM A fully integrated SEM / AFM combination tool for routine measurements. A single software interface enables AFM and SEM operation as well as combination...
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MTII recently acquired the Fullam brand of miniature tensile, compression and bend testing machines specifically designed for use in Scanning Electron Microscopes (SEMs), Atomic Force Microscopes (AFMs) and Light Microscopes (LMs). The dual...
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Scanning electron microscope (SEM) application software MCS SUTTER INSTRUMENT
The MOM Computer System and Software (MCS) is the software package MScan. This program has been designed to seamlessly control two-photon imaging, photostimulation and electrophysiology. While designed exclusively for use with the MOM, it is also compatible with other two-photon platforms. MOM microspcoe....
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The EBM powers E-Beam Columns in Scanning Electron Microscopes providing acceleration, bias and filament sources in a single compact package. Spellman’s proprietary HV packaging and encapsulation...
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Scanning electron microscope (SEM) application software ProtoCOL SYNBIOSIS
Every ProtoCOL system comes with the new ProtoCOL 2 software. This software brings advanced levels of control and...
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Complete vacuum system max. 34 l/min | SEM series KNF NEUBERGER
The process in the rotary evaporator can be monitored reliably with the vacuum system LABOXACT. A closed, patented system arrangement enables gentle distillation and high recovery...
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Assembly machine 2500 x 800 x 50 mm | SEM BIESSE
Sem is the self-adjusting electromechanical clamp that allows automatic management of door unit assembly operations for all those manufacturers requiring to raise their...
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HJ series of AC servomotors have high inertia rotors along with larger than standard shafts and bearings...
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Rotary piston blower max. 25 000 m3/h, max. 1 bar | SEM series MAPNER
The pistons incorporation of trilobular configuration, united to specifically configuration of the inlet nozzle housing allows toobtain a progressive compression, consequently a considerable reduction of the initial pulsating effect pul. The basic concept...
