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World's first Personal Electron Microscope
FEI™ is the company that helps you see beyond the limits of conventional optical and electron microscopes. Phenom is the easiest-to-use SEM ever made, breaking through the performance barriers of optical microscopes while defining a new standard for usability by non-experts. Now engineers, researchers, educators, and students - with very little training - can make high-resolution, sub-micron images themselves; where they want, how they want, and most importantly, when they want.
Phenom is a high resolution desktop imaging tool that simplifies and accelerates your imaging workflow. Never before could you have this level of resolution, magnification and speed at such a price point. With magnifications of 20x to 24,000x and an ultimate resolution of 30 nm, it's ideal for routine inspection and detailed imaging of materials. And, Phenom is extremely easy to operate too, meaning everyone can use it.
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Phenom™ brings the sub-micron world within easy reach of teachers and students
Engaging students of all ages with microscopy is easier than ever. Phenom achieves the ease of a light microscope with automated touch screen control, 30 second sample loading and only 15 minutes of training per user. Sample variety is limited only by imagination.
Phenom stimulates the development of investigative techniques, active learning and scientific inquiry skills by giving students an interactive, dynamic and fun learning tool.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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SIGMA – Advanced Analytical Microscopy - Now available with VP Technology
The SIGMA, featuring GEMINI® technology provides outstanding imaging and analytical results from a field emission microscope.
The SIGMA is now available with variable pressure (VP) technology for exceptional imaging and analysis of non-conductive specimen. It is compatible with a wealth of accessories including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior materials contrast and SE imaging in VP.
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MERLIN™
Analytical Power for the Sub-Nanometer World
-Nano Analytics
-Total Information
-Ease of Use
-Future Assured
MERLIN™ - analysis and high resolution in one
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical capability. The core of MERLIN is the enhanced GEMINI II column which, with its double condenser system, achieves an image resolution of 0.8 nanometers. A sample current of up to 300 nanoamperes is available for analytical purposes such as energy and wavelength dispersive X-ray spectroscopy (EDS and WDS), diffraction analysis of backscattered electrons (EBSD) or the generation of cathodoluminescence.
The system supports the user with a wide range of detailed solutions for tasks that could not be adequately performed in the past. The foundation for this achievement has been laid by the Carl Zeiss "Complete Detection System". This consists of the in-lens SE detector for surface imaging, the in-lens EsB detector for material contrast and the AsB detector for widely dispersed backscattered electrons. The latter contain specific information on the crystal orientation of the sample.
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The answer to modern nano science challenges is the unique GEMINI® field emission SEM column, a sophisticated solution recognised by microscopists worldwide as the leader. The new SUPRA™ series, based on the 3rd generation GEMINI® column, offers a complete range of ultra high resolution FESEMs models to cover all fields of applications in nano technology, cryo, nano structural materials analysis and semiconductor development and failure analysis.
The key advantages of the GEMINI® FESEM column are superb resolution down to 0.1kV, high efficiency In-lens SE detector, minimal adjustments when changing operating voltage and low magnetic fields at specimen level. The SUPRA's unique variable pressure (VP) capability enables examination of non-conducting specimens without time consuming preparation. The versatile analytical ultra high resolution FESEM concept extends imaging and analytical resolution beyond previously achievable limits.
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The ULTRA FESEM, based on the SUPRA%uF0D4 FESEM comprises a high efficiency, ultra high resolution In-column EsB detector which enables nano-scale compositional BSE imaging. The newly developed Energy selective Backscattered (EsB) detector represents the latest developments of the renowned GEMINI®technology. The ULTRA incorporates the GEMINI® In-lens SE detector for crisp topographic imaging and the EsB detector for clear compositional contrast. Simultaneous real-time imaging and mixing of both signals offers ultimate imaging capabilities. The EsB detector comprises a filtering grid which enables high resolution BSE imaging revealing previously unseen image details.
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EVO® MA and LS Series SEM
Driven by applications
The EVO® series SEM has evolved to provide users in Materials Analysis and Life Science with microscopes designed to match their needs. Both microscopes series share some key features.
Key features
- Class leading x-ray geometry
- Class leading secondary electron imaging in variable pressure
- High brightness LaB6 source option
- Clean pumping technology with fast pumpdown
- High repeatability stage with large stage movements
The EVO® MA 10, EVO® MA 15 and EVO® MA 25 microscopes provide, as standard, the capability to use variable pressure (VP) operation.
The EVO® LS 10, EVO® LS 15 and EVO® LS 25 microscopes are environmental SEMs providing, as standard, the capability to prevent dehydration artefacts in the microscopy of life science specimens.
The EVO® MA and LS series ensures the perfect solution to every application requirement.
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New HIROX Tabletop Mini-SEM:
Desktop Scanning Electron Microscope with integrated EDS BRUKER-AXS!
Easy to use, fast, performant and easy maintenance, the HIROX Mini-SEM combines the simplicity of an optical microscope with the strength of a Scanning Electron Microscope!
From 20x to 30 000X
* Visualization
* Measurements
* Control
* Output
... in just a few seconds!
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The NeoScope benchtop SEM economically complements both optical microscopes and
traditional SEMs. The NeoScope makes it easy to obtain high magnification images with high resolution and large depth of field using a microscope that is as simple to operate as a digital camera, but has the powerful electron optics of an SEM.
Whether used by trained electron microscopists as a simple screening instrument, or by lab technicians as a higher resolution alternative to the light microscope, the NeoScope will help accelerate the pace of research in the life sciences, forensics, and failure analysis of manufacturing materials.
Basic operation of the NeoScope is simple with auto focus, auto contrast and auto brightness controls. No special sample preparation, such as coating or drying, is required. The NeoScope operates in both low and high vacuum modes and has three settings for accelerating voltage suitable for a variety of applications, all of which can be programmed in special pre-stored recipe files.
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Fiber Analysis made Faster, Better and Easier with the FEI Fibermetric System powered by Phenom
Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before. With the Fibermetric™ system powered by Phenom you can load and image samples in about 30 seconds. Magnifications up to 24,000 times produce accurate information on a large range of fibers as small as 100nm in diameter. Automated measurement generates all the statistical data you need in minutes, and unlike other SEM-based solutions, no laboratory infrastructure or trained microscopists are required.
The Fibermetric system accurately images and measures almost any fiber sample. The Fibermetric system delivers better data, faster, to improve your fiber material developmentand manufacturing.
- Save time
- Get all your statistical data, automatically
- See and measure nearly any micro/nano fiber
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Phenom world's first Personal SEM for Metals
Rapidly examine alloys for metallurgical analysis, quality control, and failure analysis
The properties of many engineering materials are governed by a combination of metal composition and the morphology and distribution of key micro-structural features. These features can be observed with light microscopes, but when higher magnification and 3D detail is required, a scanning electron microscope (SEM) works best. The Phenom™ personal electron microscope exceeds the resolution of light microscopes (30 nm vs. 200 nm) and eliminates the expense, delay, and difficulty of operating a conventional SEM.
Phenom takes metallurgical imaging to a new level of clarity. For failure analysis of 3D objects, Phenom's large depth of focus can show the fracture origins and fatigue features.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images-with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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Phenom for particles
Best of both worlds: size and shape with Phenom in 30 secs
Particle size analyzers are becoming common in industrial and pharmaceutical laboratories. As important as size distribution is, the shape and agglomeration of sub-micron particles is only visible with an electron microscope. Phenom™ is the affordable solution to expand your lab capabilities. With an ultimate resolution of 30nm, Phenom will clearly identify and compare the morphology of fine particles or deposits for new formulations.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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Validate TEM and SEM samples, faster.
For advanced semiconductors, light microscopes lack resolution to ensure that SEM and TEM samples include regions of interest. If you can't use a DualBeam™ to prepare and validate every sample, Phenom™ can help. Now, FA labs can dedicate high-resolution SEMs to FA work, offloading routine work without outsourcing. The Phenom is easy for engineers to use, fits on a desktop, does not require special environmental preparations, and costs less than many high-end optical microscopes.
Phenom™ is a high-resolution personal electron microscope with an optical camera for never-lost navigation. Its innovative touch-screen user interface and control knob let you quickly produce high-quality electron microscope images—with little or no training. Phenom can handle a wide range of samples with minimal preparation. Samples are loaded instantly with our patented low vacuum load-lock technology. SEM images are ready within 30 seconds. Phenom software lets users make precise on-screen feature measurements. Images are saved on a USB memory stick or network storage location for off-line analysis and distribution.
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Ultra-high resolution microscopy places special demands on the equipment used to capture new information and reveal the secrets of the Nano-world.
The new S-5500 meets these with proven technology, combining high resolution and easy, reliable operation.
The S-5500 boasts a host of features and details, all designed to make high resolution microscopy and analysis that much easier
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The Hitachi S-4800 is a truly versatile platform comprising impressive high resolution performance, advanced detection technology, and a user interface that makes it possible to capture even the most short lived moments accurately and clearly.
It employs a semi-in-lens design for large sample accommodation while achieving ultra-high resolution comparable to performance only available with in-lens UHR SEMs.
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The Hitachi Tabletop Microscope is the perfect imaging platform for any Light Microscope lab needing higher resolution and deeper focus depth. Requiring no electron microscopical technical skills or sample preparation techniques, the TM-1000 can be used by anyone able to use a digital camera. It's that easy!
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JEOL has played a leading role in the development and evolution of scanning electron microscopy since the early 1960s. Over the past five decades, the SEM has become an indispensable tool in both advanced research and routine analysis for science and industry. JEOL has installed more than 8000 SEMs worldwide.
SEMs are continually finding new applications in nanotechnology, where nano-fabrication techniques are so advanced that new SEM technology has been developed to help researchers to see the structures they make. More and more failure analysis, pathology, forensic, metallurgical and environmental labs are replacing traditional optical microscopes with SEMs.
As the range of applications for the SEM grows -- and as new discoveries require higher resolutions and greater versatility -- JEOL keeps pace with new technology that enables the SEM user to produce unprecedented images of the microscopic and nanometric world.
Our SEM product line is comprised of four categories differentiated by resolution and configuration:
Conventional Tungsten High Vacuum SEMs: ideal for failure analysis, inspection, and characterization.
Conventional Tungsten Low Vacuum SEMs: for imaging and X-ray analysis of wet, nonconductive, unprepared samples.
Conventional Thermal Field Emission SEMs: field emission source provides higher resolution; high stability and high current in a small spot size and generates high x-ray fluxes for chemical analysis at high resolution conditions.
Semi-in-Lens Cold Cathode Field Emission SEMs: highest resolution SEMs; the cold cathode produces the finest probe size, especially at low accelerating voltages; the semi-in-lens pulls the secondary electrons off the surface by a detector in the objective lens, reducing noise at lower working distances.
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As an entirely new advanced imaging tool for bioscience research and industrial inspection fields, the NeoScope benchtop SEM extends your vision by combining the familiarity of a digital camera with the high resolution and depth of field of a powerful SEM. Born from the combined expertise of Nikon Instruments and JEOL, the NeoScope SEM’s advanced features are complemented by simplicity and affordability.
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The in-situ combination of STM, SEM and SAM for high resolution structural and chemical analysis creates a superior research tool. Atomic resolution STM is ideally complemented by the abilities of the SEM to image large surface areas, help to identify areas of interest, and finally assist the precise positioning of the STM tip to the desired spot on the surface.
The MULTISCAN LAB employs the goniometer mounted MULTISCAN STM as an ideal base for such dedicated experiments. The highly stable UHV chamber (30mm wall thickness) together with a rigid system frame and vibration isolation by a pneumatic auto-levelling damping system ensures both optimal STM and SEM performance.
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We are proud to present our NEW versatile solution for analytical purposes in combination with Ultra-High-Resolution and ample Signal Selection capabilities .
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Hitachi is proud to introduce the HD-2300, Hitachi´s newest high resolution, high throughput STEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance. This second-generation 200kV STEM from Hitachi, surpasses current instrumentation in nanotechnology research, emphasizing superoir performance and enhanced user-friendly features of the previous HD-2000 model. The HD-2300 is an essential instrument for the advancement of Nano-Technology in the 21st century.
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