Semiconductor microscopes

Do you need help making a decision?  Take a look at our buying guide
9 companies | 22 products
exhibit your products

& reach your clients in one place, all year round

Exhibit with us
Search
{{#pushedProductsPlacement4.length}} {{#each pushedProductsPlacement4}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement4.length}}
{{#pushedProductsPlacement5.length}} {{#each pushedProductsPlacement5}}
{{product.productLabel}}

{{product.productLabel}} {{product.model}}

{{#if product.featureValues}}
{{#each product.featureValues}} {{content}} {{/each}}
{{/if}}
{{#if product.productPrice }} {{#if product.productPrice.price }}

{{product.productPrice.formattedPrice}} {{#if product.productPrice.priceType === "PRICE_RANGE" }} - {{product.productPrice.formattedPriceMax}} {{/if}}
{{/if}} {{/if}}
{{#if product.activeRequestButton}}
{{/if}}
{{product.productLabel}}
{{product.model}}

{{#each product.specData:i}} {{name}}: {{value}} {{#i!=(product.specData.length-1)}}
{{/end}} {{/each}}

{{{product.idpText}}}

{{productPushLabel}}
{{#if product.newProduct}}
{{/if}} {{#if product.hasVideo}}
{{/if}}
{{/each}} {{/pushedProductsPlacement5.length}}
optical microscope
optical microscope
MX63 series

Resolution: 1 µm

The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the ...

scanning transmission electron microscope
scanning transmission electron microscope
SU9000

Magnification: 3,000,000 unit
Resolution: 0.8, 0.4, 1.2 nm

The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...

See the other products
Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
SU series

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

Performance & Power in a Flexible Platform Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize ...

See the other products
Hitachi High-Tech Europe GmbH
STEM microscope
STEM microscope
HF5000

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

... electron gun (Cold FEG) • Ultra-stable column and power supplies for enhanced instrument performance • Simultaneous Cs-corrected SEM & STEM imaging capability with atomic resolution • New high-stability side-entry ...

See the other products
Hitachi High-Tech Europe GmbH
opto-digital microscope
opto-digital microscope
MVM

The new "Machine Vision Microscope" (MVM) is a purely digital microscope with all the features that make a microscope. It has an apochromatically highly corrected microscope ...

metallographic microscope
metallographic microscope
DS series

... analyzes. Entry-level inverted microscope for general purpose applications for hardness testing. Industrial and materials science inverted microscope especially designed for opaque specimens (including ...

optical microscope
optical microscope
ZTX-S series

ZTX-S series zoom microscope adopts optical imaging system,with high resolution,fine definition and strong sense of three-dimensional,easy operation.The microscope is Widely used in semiconductor ...

field emission scanning electron microscope
field emission scanning electron microscope
JSM-F100

Magnification: 10 unit - 2,740,000 unit
Resolution: 0.9, 1.3 nm

... integrates SEM imaging and EDS analysis. This powerful function provides next-generation operability and high resolution images obtained with FE-SEM. New "Zeromag" function "Zeromag", incorporated for seamless transition ...

scanning probe microscope
scanning probe microscope
Dimension XR

Resolution: 0 nm - 100 nm

Extreme research systems for nanomechanics, nanoelectrical and nanoelectrochemistry Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine ...

polarizing microscope
polarizing microscope
ECLIPSE LV100N POL

Weight: 17 kg
Length: 490 mm
Width: 251 mm

The ECLIPSE LV100N POL and Ci-POL series of polarising microscopes is used to study the birefringent properties of anisotropic specimens by observing image contrast and colour changes. Nikon offers systems for both quantitative ...

See the other products
Nikon Metrology
analysis microscope
analysis microscope
SAM 400

... new rf and transducer technologies of up to 400 MHz, controlled through a user friendly graphical interface. Built to semiconductor industry standards around a core platform that utilizes the latest production and research ...

See the other products
PVA TePla Analytical Systems GmbH
exhibit your products

& reach your clients in one place, all year round

Exhibit with us