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automated ellipsometer / spectroscopic
automated ellipsometer
UVISEL 2

UVISEL 2 is a fully automated and integrated spectroscopic ellipsometer enabling accurate thin film thickness and optical constants characterization over the wavelength range 190 - 2100 nm. Sample alignment, ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
UVISEL PLUS

NEW UVISEL PLUS: THE REFERENCE ELLIPSOMETER FOR THIN FILM MEASUREMENTS The new UVISEL PLUS spectroscopic ellipsometer includes the newest acquisition technology designed to measure thin ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
UVISEL 2 VUV

The UVISEL 2 VUV is a ne generation of phase modulation ellipsometer for VUV measurement. It is the main spectroscopic ellipsometer available, intended to convey the quickest thin film ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
Auto SE

The Auto SE is a spectroscopic ellipsometer, manufactured by HORIBA Scientific. It enables automatic analysis of thin film samples with simple push button operation. In a few seconds, a complete analysis ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer
Smart SE

The instrument Smart SE is spectroscopic ellipsometer. Very fast and accurate thin film measurement can be done with the help of it. It has the ability to characterize the thin film thickness from minute ...

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HORIBA Scientific
spectroscopic ellipsometer
spectroscopic ellipsometer

... array of ellipsometer like in-situ and in-line are used in controlling processes in research and in industry. From thin film monitoring to large area mapping and in-line characterization of flexible devices. In-situ spectroscopic ...

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HORIBA Scientific
spectroscopic ellipsometer / automated
spectroscopic ellipsometer
250 - 1700 nm | PHE 102

The PHE-102 series is a variable angle spectroscopic ellipsometer operating in the spectral range 250-1,100 nm, 250-1,700 nm or 250-2,100 nm. In the PHE-102 ellipsometer, a broad band ...

spectroscopic ellipsometer
spectroscopic ellipsometer
250 - 2100 nm | PHE 103

The PHE spectroscopic ellipsometer software has a model and film library with predetermined measurement parameters, which allow the operator to select an application and quickly execute a measurement. ...

spectroscopic ellipsometer
spectroscopic ellipsometer
400 - 4000 cm-1 (2.5 - 25 um) | PhE104

The PhE104 Infrared Spectroscopic Ellipsometer is an instrument designed based on monochromator dispersion. It is manufactured with high precision that is more cost-effective than the FT-IR spectrometer. ...

spectroscopic ellipsometer
spectroscopic ellipsometer

Spectroscopic ellipsometry is a powerful tool for thin film metrology. omt implements this method in an easy-to-use system with an advanced modular optical and mechanical design mainly for industrial applications. ellipsometry ...

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spectroscopic-ellipsometer

A spectroscopic ellipsometer is an optical instrument used to measure precisely the thickness of coatings or determine the physical and optical properties of a surface.

Applications

Spectroscopic ellipsometers have undergone significant development thanks to computer technology for analysis of their measurements. They are used in the optical and microelectronic industries and in the manufacture of photovoltaic cells.

Technologies

The spectroscopic ellipsometer uses a polychromatic (UV, visible, IR) light source. Its polarized light beam is reflected from a plane-surface sample, changing its polarization. The reflected beam travels through a rotary analyzer and then to a spectrometer. Measuring a portion of the spectrum at varying angles of incidence yields a large number of measurements. These can be compared to a computer database to characterize the sample using a variety of parameters.