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The transmission electron microscope (TEM) uses electron translucent specimens with images directly projected on a screen or camera. Resolution better than 0.1 nm are now achievable, delivering atomic scale resolution
The all new LIBRA® range of Energy Filtering Transmission Electron Microscopes (EFTEM) combine state of the art electron optics with unique Koehler illumination, OMEGA In-column energy filtering, extremely stable digital electronics and genuine ease of operation.
The systems are operated through a pair of dedicated control panels supported by the WinTEM™ GUI following the successful philosophy of ZEISS´ SEMs instruments for maximum convenience and consistent “look-and-feel” operation across the entire product range.
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Hitachi is proud to introduce the HD-2300, Hitachi´s newest high resolution, high throughput STEM designed for quick, comprehensive sample evaluation, with unmatched analytical capabilities and consistent high-end performance. This second-generation 200kV STEM from Hitachi, surpasses current instrumentation in nanotechnology research, emphasizing superoir performance and enhanced user-friendly features of the previous HD-2000 model. The HD-2300 is an essential instrument for the advancement of Nano-Technology in the 21st century.
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With 11 accessory ports and optional simultaneous WDX, EDX and XRF analysis, the S-3700N is a true analytical instrument for ultra-large samples up to 300 mm across.
The patented Quad bias electron gun gives high current for excellent imaging and analytical performance throughout the kV range, but particularly at low voltages.
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The Transmission Electron Microscope - TEM - has been used in all areas of biological and biomedical investigations because of its ability to view the finest cell structures. It is also used as a diagnostic tool in hospital pathology labs. For the crystallographer, metallurgist or semiconductor research scientist, current high voltage/high resolution TEMs, utilizing 200 keV to 1 MeV, have permitted the routine imaging of atoms, allowing materials researchers to monitor and design materials with custom-tailored properties. With the addition of energy dispersive X-ray analysis (EDXA) or energy loss spectrometry (EELS), the TEM can also be used as an elemental analysis tool, capable of identifying the elements in areas less than 0.5µm in diameter.
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