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High quality analogue instruments designed to measure an extensive range of electrical and electronic parameters. This comprehensive range offers DIN instruments, ANSI switchboard meters, panel indicators, sealed and ruggedised instruments, and complementary selector switches for line to line and line to neutral readings. Instruments are precision engineered and robust in design, ensuring accurate measurement and display in the most demanding of environments. All instruments are available in a range of styles, sizes and specifications to meet the exacting needs of industry.
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The 236, 237, and 238 Source-Measure Units (SMU) are fully programmable instruments, capable of sourcing and measuring voltage or current simultaneously. These systems are really four instruments in one: voltage source, current source, voltage measure, and current measure.
Related Applications:
- MOSFET measurements
- GaAs measurements
- Bipolar measurements
- Diode characterization
- Oxide characteristics
- Electromigration testing
- Research and electronic manufacturing applications
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E Probe now under development process
* Non contacting E field Measuring,
* Directional sensitivity
* Power supplies +/-12V
* Measuring range 1 milliVm-1 up to over 1000Vm-1
* Bandwidth : 10 mHz - 100 kHz
* White noise: μVm-1/√Hz experimentally shown
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Portable PD Analyzing System LDS-6/UHF
for PD measurements and monitoring on GIS or Cable Systems
The LDS-6/UHF is a state-of- the-art, portable digital measuring system for the UHF processing of partial discharges acquired from installed GIS sensors, or UHF sensors. It combines the features of a PD detector and spectrum analyzer.
PD quality tests on GIS using installed GIS sensors
PD testing on HV Apparatus, using UHF technology
Designed for on-site PD diagnosis tests as well as for manufacturing and research
Single channel or Dual channel
Available in 19" housing with external PC connected via Ethernet, or portable case with built in mini PC
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Digital Partial Discharge Measuring and Diagnostics System for industrial and general HV test floor environments.
The LDS-6 is a highly sophisticated digital measuring system for the PD detection according to the standard IEC 60270, VDE 0434 as well as various IEEE and other standards for the High Voltage Test and Measurement Technology. It meets also ICEA T-24-380 standard for Cable Industry.
PD quality tests on high voltage equipment
PD diagnosis on developing insulating materials
Designed for on-site PD diagnosis tests as well as for manufacturing and research
PD fault location for power cables
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Description
A Mastervolt battery monitoring panel brings an end to nasty surprises, like a sudden shortage of battery power. This sophisticated and popular panel provides broad information.
This information includes reading voltage, current, Ah, time remaining and remaining capacity in percentage terms for the main battery. The Masterlink BTM-III (12/24V DC) has LED indicators for remote monitoring of the battery level. A well-lit LCD screen also displays direct online data or historical information. In a single screen the state of charge and the voltage of three banks can be shown simultaneously.
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This is the key tool for all professionals in HVAC and industry fields.
AMI 300 can measure, store up to 12,000 values and restore on PC (wireless communication) up to 6 parameters alternately.
Pressure, temperature, humidity, air quality (CO/CO2), air velocity and airflow (vanes or hotwire), tachometry.
For visual comfort, AMI has a large colored display and easy browsing is done thanks to its joystick on keypad.
Innovative and evolutive :
- AMI can be equipped with wireless probes supplied with a multifunctional key allowing measurement and settings.
- It can be equipped with interchangeable measurement modules which are individually calibrated and are automatically recognized by the instrument thanks to the Smart-plus system.
- These measurement modules are available for pressure, thermocouple temperature (4 channels), climatic conditions (hygrometry, air pressure, temperature) and current/voltage parameters.
- For instance, AMI can be equipped with several pressure measurement modules with different measuring ranges. This new system allows evolution according to measurements that must be carried out…
- On the same principle, all probes have the Smart-plus system and are therefore automatically recognized by the instrument. Probes are available with adjusting/calibration certificate.
* exept thermocouple probes
- A large choice of probes allows a step-by-step evolution of the instrument according to your needs : vanes Ø 14 mm, 70 mm and 100 mm, high resistance gooseneck–shaped hotwire, CO/.CO2, multifunction, high temperature hygrometry, RTD probes, thermocouple...
Join our distribution network all over the word....Contact us !
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Kanomax anemometers can measure a wide variety of parameters to test ventilation rate. The parameters include air velocity, airflow, static pressure, temperature, and humidity of the indoor environment.
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Specially developed for the supervision of clean-rooms, the CPE 300 is dedicated to measures of low pressure andor depression of air or neutral gases from 0/+10 Pa to -1000 /+1000 Pa.
The CPE 300 presents the advantage to become integrated perfectly into walls and to answer to the standard of cleanliness thanks to its stainless case (brushed or with lacquered).
It is equipped with 2 visual and audible alarms, with 2 reversers relays, of a big electroluminescent display and a process of autocalibration which guarantees in the time an excellent stability and a reliability of the measure in low as in high scale.
Thanks to its digital communication (RS 232 and Protocol Modbus RS 485), it offers the possibility of showing alternately (in addition of the measure of pressure) two other parameters resulting from temperature, humidity, velocity or airflow external sensors (KIMO).
Two innovative systems to facilitate the maintenance on-site :
· Its measuring element benefits from the SMART PRO system. It is individually adjusted and is automatically recognized by the device. Thanks to this process, it is possible to replace the measuring element in a simple and fast way without return of the sensor to the factory.
· The calibration in front face : this system allows to proceed to the calibration of the device without un-mounting it.
The sensor CPE 300 is so always operational !
Join our distribution network all over the word....Contact us !
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The FRT measuring systems series MFE (metrology front end) is
particularly suited to manufacturers of structured wafers, masks,
MEMS and similar products. Because of the very high cleanliness,
process and yield requirements, all tools are especially designed
for use in cleanrooms.
MFE systems measure critical dimensions and overlays on the
one hand and 3D topography or film thickness on the other.
All tools are metrological and comply with the necessary industry
standards such as the SECS II / GEM software interface.
Furthermore, the system is fully automated and equipped
with wafer cassettes and part carriers.
An EFEM and mini-environment for class 1 cleanrooms
rounds off the upper segment of the MFE tool series.
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The Shallow Probe model LEXFAB-300 is a turnkey system designed to meet the needs for fully automated semiconductor fab application and currently used for the 90nm, 65nm and 45nm nodes.
The LEXFAB-300:
- gives Elemental Concentration AND Thickness of thin films, layers or ULE implants.
- is designed for Product Wafer analysis (measurement area from 10µm to 100µm) including enhanced Pattern recognition.
- is fully compatible with SMIF 200mm, Open Cassette 200mm and FOUP 300mm standards. SECS/GEM automation.
- meets factory-required host communication protocols. Fully compliant with SEMI standards.
- provides Full Wafer Analysis and Mapping (concentration and thickness uniformity).
- is based on a Non-destructive technique.
- allows a high throughput.
- guarantees a high uptime, reliability and stability, ensuring documented long term tool matching.
- has an easy-to-use User Interface with dedicated recipes.
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Corning is a leading, global supplier of optical materials, high performance precision optics, optical-based metrology instruments and technical microlithography solutions for the semiconductor industry. Its core technical expertise includes fused silica and fluoride crystals, materials and processing, optical-based metrology instrumentation and high performance optics through Corning Tropel®.
Recognized world-wide in precision optical subsystems and advanced form metrology instrumentation, Corning Tropel provides rapid, accurate full-form measurement of precision flat and cylindrical surfaces for the semiconductor, data storage, automotive and industrial markets. Custom-designed, high performance precision optic components enable applications for wafer, photomask and inspection equipment suppliers, and are designed for systems from ultra-violet (UV) to near infrared (IR).
Advanced Metrology Research and Testing Exceeds Customer Expectation
Our commitment to semiconductor metrology research and testing is significant and addresses an industry-wide need for precise performance and predictability over the lifetime of materials. Corning’s advanced interferometry equipment enables precision measurements and quality assessments that meet and/or exceed customer requirements for quality products and solutions. Our world-class manufacturing facilities, leading-edge metrology equipment and in-house lens-making capabilities, continues to be known for the exceptional quality, performance and reliability of its precision optics
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The MetaPULSE® System uses patented picosecond ultrasonic laser sonar (PULSE™) technology to provide the industry's first production-worthy opaque film metrology tool. Its small-spot, non-contact, non-destructive technology enables on-product thickness measurements of single or multi-layer opaque films for aluminum and copper processes. In addition to thickness, the MetaPULSE identifies missing layers or interfacial problems such as poor adhesion, and characterizes material properties such as density and roughness. MetaPULSE is used by all of the top ten semiconductor manufacturers, and nearly 200 tools are currently providing production monitoring in fabs around the world.
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Announces 0 to 10 Vdc Voltage, 0 to 20mA Current, and Type K Thermocouple Inputs in Engineering Units
Portable, Handheld High Performance Design
Built-In Speaker and Earphone Socket
Over 100 Built-In Engineering Units to Choose From
RS232 PC Interface Allows User to Configure the Unit
High and Low Alarm, Programming
Command/Continuous Speech Mode Selection
Verbalises Signals While Connected to Other Measurement and Control Devices
Front Keypad Provides Input Selection, Command Talk and Volume Control
Powers From 2 "AA" Size Batteries or DC Adaptor Input (Batteries and AC Adaptor are Included)
Decorative Table Top Stand included for ease of operation
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Programmable and recording measuring instrument for measuring and recording voltages, currents, power factors, frequencies, temperatures etc. in low–voltage power distribution grids.
Characteristics
- Inputs: 3 x voltage, 12 x current, 1 x temperature
- True root-mean-square (TRMS) measuring of voltage and current, real power factor (lambda) evaluation
- Current inputs for use of current probes and clamps with voltage output in 0,1 ÷ 3V AC range
- Supplied from the first phase measured
- Recording interval from 5 seconds up to 1 hour
- Recording capacity from days to months (according to record setting and memory size)
- Setting, data visualization and processing with Cetis32 program
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Ear Measuring Instrument, Model 126
Used to obtain a numerical value of the size of the ears resulting from anisotropy in the material of cylindrical deep-drawn cups (e. g. according to DIN 50 155). The average cup height, the height of the ears in percent and in mm can be read-off at a touch of a button and are shown on the digital display instrument. To enable additional data processing the test instrument can be equipped with interfaces, such as BCD or RS 232 C outputs and with a printer.
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Pressuremeter
Monitoring unit with plastic tubing and 3-cell probe enabling to make pressuremeter tests conform to the ASTM Standard Method for Pressuremeter testing in soils D-4719-00 and AFNOR standard NF P 94-110-1
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The 236, 237, and 238 Source-Measure Units (SMU) are fully programmable instruments, capable of sourcing and measuring voltage or current simultaneously. These systems are really four instruments in one: voltage source, current source, voltage measure, and current measure.
Related Applications:
- MOSFET measurements
- GaAs measurements
- Bipolar measurements
- Diode characterization
- Oxide characteristics
- Electromigration testing
- Research and electronic manufacturing applications
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High quality analogue instruments designed to measure an extensive range of electrical and electronic parameters. This comprehensive range offers DIN instruments, ANSI switchboard meters, panel indicators, sealed and ruggedised instruments, and complementary selector switches for line to line and line to neutral readings. Instruments are precision engineered and robust in design, ensuring accurate measurement and display in the most demanding of environments. All instruments are available in a range of styles, sizes and specifications to meet the exacting needs of industry.
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