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FISCHERSCOPE X-RAY XDLM and XDAL series
The XDLM spectrometers with micro focus tube and proportional counter tube are ideally suited for the inspection of parts where small structures are measured. Typical applications are measurements on pc-boards, plug contacts and electronic components. XDLM spectrometers are equipped with four exchangeable apertures and a programmable XY(Z) measuring stage. This makes them ideally suited for testing mass-produced parts.
The XDAL spectrometers with silicon PIN detectors provide reliable analysis results and coating thickness readings even with small concentration and very thin coatings. With their fast and highly precise XY(Z) measuring stage, they are ideally suited for automated sample measurements.
The XDAL and XDLM spectrometers have an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things.
Using the FISCHER fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free.
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FISCHERSCOPE X-RAY XUL series
The models of the XUL series are compact x-ray fluorescence spectrometers for coating thickness measurements and material analyses. They are well suited for the electroplating industries to measure small parts with different shapes, such as screws, bolts or nuts, for contacts and other electronic components. Also the metal content of electroplating baths can be analyzed quickly and easily.
The XULM model with its micro focus x-ray tube is designed for measurements on very small parts, plug contacts and wires. It is particularly well suited for the jewelry and watch industries but also for manual measurements on pc-boards.
The x-ray source and the detector are located underneath the measurement chamber. This allows for simple and precise positioning of the specimens. An integrated high-resolution video camera supports the precise positioning.
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The FISCHERSCOPE®-X-RAY XDV®-SDD is a universally applicable energy dispersive x-ray spectrometer. It is particularly well suited for the non-destructive analysis of very thin coatings, for small concentrations trace analysis and for automated measurements.
Typical areas of application are:
- Analysis of thin or very thin coatings,e.g., gold/palladium coatings of ≤0.1 μm
- Trace analysis on pc boards according to RoHS and WEEE requirements
- Gold and precious metals analysis
- Measurement of functional coatings in the electronics and semiconductor industries
- Determination of complex multi-coating systems
- Automated measurements, e.g., in quality control
To create ideal excitation conditions for every measurement, the XDV-SDD features electrically changeable apertures and primary filters. The modern silicon drift detector achieves high analysis accuracy and good detection sensitivity. Due to large apertures (collimators) and a very fast pulse processor, it is ideally suited for capturing high count rates.
The XDV-SDD x-ray spectrometer has an excellent long-term stability, which is reflected in a significantly reduced calibration effort, among other things. Using the fundamental parameter method, coating systems as well as solid and liquid samples can be analyzed standard-free. It is possible to detect up to 24 elements in a range from aluminum (13) to uranium (92) simultaneously.
With its fast, programmable X/Y-stage, it is the fitting measuring instrument for automated sample measurements.
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Oxford Instruments’ launches a powerful, new, easy-to-use EDXRF spectrometer – designed for operation by anyone!
The innovative, high performance X-Supreme8000, is a compact, energy-dispersive
X-ray fluorescence (EDXRF) spectrometer for quality assurance and process control requirements across a diverse range of industries.
Customized applications include:
• Minerals and mining
• Petrochemicals – fuels/lubricating oils
• Wood pressure treatments
• Cement
• Food and cosmetics
• Plastics and polymers
• Education
Meeting the ever increasing requirement for minimal or no sample preparation and unattended operation, the highly flexible X-Supreme8000, with its unique Oxford Instruments’ Silicon Drift Detector (SDD) and powerful X-ray tube technologies, can perform multi-element analysis on a wide range of sample types. These include: solids, liquids, powders, pastes and films at concentrations from high percentage down to ppm levels of detection, covering elements Na11 to U92 in the periodic table.
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Analysis using X-rays
Energy Dispersive X-ray fluorescence spectrometer (EDX) is the instrument to perform qualitative and quantitative element analysis in the range from 6C/11Na to 92U and is the ideal tools for non-destructive applications. EDX is used in many different applications areas in the chemical, electronic and food industries as well as refineries. It can be used with solid, powder and liquid samples. This is achieved by applying X-ray to the sample and then analysing the re-emitted element characteristic fluorescent X-ray. Security functions effectively prevent exposure to X-rays at all times.
Easy handling and improved detection limits
With a simple push of a button, elements ranging from sodium to uranium can be analysed quickly and easily. In addition, the software enables measuring conditions to be adapted to the sample characteristic. For precise analysis of lighter elements the systems can be operated optionally under vacuum or under a helium atmosphere. The built-in five-filter assembly (zirconium, aluminium, titanium, nickel and molybdenum) effectively reduces interferences and increases the signal quality. This way, the limits are markedly improved for detection of e.g. lead, cadmium, chlorine or chromium.
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Features:
EDX 2800 is specially designed for RoHS substance detection (Cd, Pb, Cr, Hg, Br) and full elements analysis, jewelry analysis and plating thickness measurement.
Specifications:
Content ration range: 0.01%---99.99%
Measurement time: 60---300 seconds
Accuracy: 1ppm for RoHS directive test. (for samples whose contents are more than 96%)
Energy revolution: 165+-5eV
Measurement substance: solid, powder and liquid
Test Range: 75 elements from sulfur to uranium
Detect source: Electro-refrigeration SI-PIN semiconductor detector
Power supply: AC 110/220V+-5V
Relative humidity: ¡Ü 70£¥
Weight: 130lb
Configuration:
Single sample chamber: 24*16*4In
Signal-to-Noise Enhancer (SNE) provides powerful assurance for measurement accuracy
Electro-refrigeration SI-PIN semiconductor detector is more convenient than liquid nitrogen refrigeration.
Switch collimators and filters automatically for different samples
High voltage power supply: Tube voltage (Max): 50kV; Tube current (Max): 1mA
X-ray tube: Tungsten target material
X-ray Optical System: Bottom Optical system
CCD Camera: 1.4 million pixels CCD camera
Applicable software: RoHS analysis software
(applicable to Windows 2000 and Windows XP operation systems)
Collimator: ¦µ8, ¦µ6, ¦µ4, ¦µ3, ¦µ2, ¦µ1, ¦µ0.5, ¦µ0.1mm
Safety
The instrument has double shield covers and the outer cover has lead sheet which can prevent Xray from leaking
The shield cover of the instrument has interlocks with high voltage of X-tube. When the cover is open, the X-ray tube is shut down automatically to prevent X ray from leaking.
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Features:
EDX 600 is specially designed for Jewelry analysis, such as Au Ag Cu. It can also measure plating thickness.
Specifications:
Content ration range: 0.1%---99.99%
Measurement time: 60---300 seconds
Accuracy: 0.1% ( for samples whose contents are more than 96%)
Precision of plating thickness: 10-50nm
Measurement substance: solid, powder and liquid
Metals Range: Au Ag Cu
Weight: 70lb
Detect source: proportional counter
Power: 50W
Relative humidity: ¡Ü70£¥
Configurations:
Single sample chamber: 12X12X8In
Adopt closed proportional counter as detector
Preamplifier and main amplifier circuits
High voltage power supply: Tube voltage (Max): 50kV; Tube current (Max): 1mA
X-ray tube: Tungsten target material
X-ray Optical System: Bottom Optical system
CCD Camera: 1.4 million pixels CCD camera
Applicable software: Precious metal analysis software
Collimator: ¦µ3mm
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Features:
EDX 3600B is the most powerful EDX XRF for testing precious metals such as precious metal (Au, Ag Pt, Pd, etc), steel, alloy, mining and cement analysis, and also for plating thickness analysis and full element analysis and RoHS testing.
Specification:
Metals Range: from sodium (Na) to Uranium (U)
Content ration range: 0.1%---99.99%
Accuracy: 0.05% (for samples whose contents are more than 96%)
Rohs testing: can reach 1ppm for harzardous substances (Cd/ Pb/ Cr/ Hg/ Br/) restricted in RoHS directive.
Plating thickness measurement: plating thickness can be as thin as 10nm and multi-layer can be of more than 5 layers.
Precision of plating thickness: 10nm
Measurement substance: solid, powder and liquid
Measurement time: 60---300 seconds
Detect source: X-ray tube
Working voltage: AC 110/ 220 V
Voltage generator: 5-50 kV
Tube current: (50-1000) µA
Relative humidity: ≤70％
Power: 200W
Configuration:
3-D super-large sample chamber: 160X160mmX180mm
Amplifier circuits
Si PIN semiconductor detector
X-ray tube: Tungsten target material
High and low voltage power supplies
Automatic filter switching system
Automatic collimator switching system
Triple safety protection mode
Arbitrary optional analysis and identification models
CCD Camera: 1.4 million pixels CCD camera
Unique light path enhancement system
Applicable software: Precious metal analysis software, full element analysis software and plating thickness software, RoHS software.
Collimator:Φ8, 6, 4, 3, 2, 1, 0.5, 0.1(mm)
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In-line analysis for the photovoltaic industry
The FISCHERSCOPE® X-RAY Conti 5000 instruments are innovative energy dispersive x-ray fluorescence spectrometers (EDXRF) for in-line applications in industrial production sites. They fulfill DIN ISO 3497 and ASTM B 568.
These instruments are specially designed for continuous non-destructive analysis and measurement of thin layers and layer systems in production processes. For industrial demands and maintenance free continuous operation, the design is robust and without any moving parts.
The Conti 5000 series measures and analyzes layers and layer systems
- in the photo voltaic industry, i.e. CIGS, CIS, CdTe
- foils and belts
- alloys and coatings
- under ambient temperature or on very hot surfaces (up to 500°C / 932 F)
- in continuous operation and under industrial conditions
The Conti 5000 series measures in a vacuum or ambient air. With its powerful semiconductor detectors, it can determine elements in the range of sodium to uranium.
For easy integration into production lines they come with a standardized mounting flange. Various modular build versions are available.
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XAN spectrometers for Gold, jewelry and precious metals analysis
The new FISCHERSCOPE X-RAY spectrometers from the proven XAN series are best suited for the gold- and jewelry industry as well as for pawn shops and precious metals recycling. They are optimized for fast, non-destructive analysis of jewelry, precious metals in general, yellow and white gold, platinum and silver, rhodium, coins and all jewelry alloys and coatings.
Measured results are displayed in karat, per mill or weight-%, and easily printed out as customized reports.
They are accurate, safe and easy to use, robust and maintenance free. In addition, they meet the requirements of DIN ISO 3497 and ASTM B 568.
Long-term stability and outstanding precision – better than 1‰ for gold – are benefits of these instruments. In addition, the necessity for re-calibration is significantly reduced thus saving time, effort and cost of ownership.
Excellent ergonomics, easy operation and fast calculation of the measurement best describe the XAN spectrometers. Usage is safe and easy – for experienced staff as well as for employees with little training. There is no need for a special laboratory room.
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Lab-X3500 is a compact, reliable, affordable and easy to use XRF analyser. For those in the Petroleum sector the Lab-X3500 conforms to ASTM D4294, ISO20847, ISO8754 and IP336. In addition Oxford Instruments’ offers the
Lab-X3500S/Cl model using air path thereby avoiding the requirement for helium purge. For wood treatment, liquids and powders are measured with equal ease for Copper Chrome Arsenic (CCA), Copper and many others.
Our customers in the cement, minerals, mining and plastics industries all appreciate and benefit from XRF analysis delivered by such a small, compact package providing 24/7 peace of mind and ease of use by production staff.
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Feature:
WDX200 is a Wave Length Dispersive X-Ray Fluorescence Spectrometer widely used in Cement, Steel, and Mine production Quality control. It is optional for testing 10 elements from Na-U, it is said a Cement testing tool since the excellent performance for light elements as Na, Al, K, Ca, Mg, Fe, Si, P.
Specification:
The highest vacuum: < 5 Pa.
Stability: ¡¾ 0.003 KPa
Voltage & tube current stability: better than 0.05 % in12-hour
Measurable elements: 10 arbitrary elements from Na to U.
AC110/220V power supply: 1KVA AC purified stabilized voltage power supply
Analysis accuracy: (24 hours, per cent) ¡Â0.05 £¥.
Test time of single sample: ¡Â3 £ 5 minutes £¨including the time of changing the sample and pumping the vacuum£©
Temperature control accuracy of constant temperature chamber: setting value ¡¾0.1¨¬C.
Configuration
X-ray tube: 200W thin Be end window X-ray tube made by Varian company. Rh anode (optional). 400W(optional).
High voltage supply: 200W (50KV4mA)
Detector: gas proportional detector plus sealed proportional detector; 10 paths of 1024-channel independent pulse height analyzer
Vacuum system: independent pumping station is easy for maintenance.
Analysis software:
Empirical coefficient and theoretical a-coefficient method
TCP / IP protocol (Socket based S/ C) and OPC protocol (OPC server) enable data sharing with DCS or QCS system. RS-232 serial communication protocol
All-spectrum detection technique, all-round self-diagnosis measures
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The SPECTRO XEPOS can be delivered with pre-installed application packages. The application packages are a combination of hardware and analytical methods; installed in the factory and individually tuned.
The range of applications includes, among others: The analysis of waste, soils, sewage sludge, additives in oil, cement, slag, refractories and electronic components and parts in compliance with RoHS, making the SPECTRO XEPOS a true multi-talent.
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The sensitivity, precision and speed of an analytical instrument are of particular importance for industrial process control applications. The SPECTRO iQ already set standards in this respect. The new SPECTRO iQ II maintains this course with further improved technologies and a consequent alignment towards simplicity and dependability of operation.
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SPECTRO MIDEX is a Benchtop XRF system that provides quick, non-destructive determination of the elemental composition for Jewelry and Dental alloys. The analyzer is also well suited for forensic science applications. It uses state-of-the-art XRF technology and proprietary beam collimation techniques to ensure the easiest, most accurate measurement results possible within a typical 2-3-minute response time.
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ARL OPTIM'X XRF spectrometer
Flexibility, simplicity, reliability, and accuracy are traits of the ARL OPTIM'X: compact, optimized for specific applications, its features are:
* Unique WDXRF platform with sequential and/or simultaneous capabilities
* Fast analysis of solids, liquids and loose powders with superior spectral resolution
* Wider XRF elemental coverage thanks to the instrument's innovative goniometer - the SmartGonio™ - which can now be configured to cover all elements from fluorine (F) to uranium (U) in sequential mode
* No water cooling or gas supply (depending on configuration) required
* Closely coupled optics for increased intensity (50% higher than conventional geometry)
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S2 PICOFOX - The world's most compact TXRF analyzer
S2 PICOFOX TXRF spectrometer
S2 PICOFOX is the world's first and only portable benchtop instrument for fast quantitative and semi-quantitative multi-element microanalysis of liquids, solids, and contaminations using the principle of total reflection X-ray fluorescence spectroscopy.
Reaching detection limits in the ppb and ppm range the S2 PICOFOX is optimally suited for trace element analysis. The advantages are evident in case of small sample amounts, liquid samples with high matrix content and frequently changing sample types.
Due to its complete independence of any cooling medium, the analyzer can be used not only in the laboratory but also for on-site analyses in the field.
For many applications the S2 PICOFOX will be an important enhancement to an existing AAS or ICP-OES system.
Advantages:
- Simultaneous multi-element trace analysis incl. halogenides
- Analysis of smallest sample amounts in the nanogram or microgram range
- Simple quantification using an internal standard
- Suitable for various sample types and applications
- Portable system for fast in-field analyses
- No matrix or memory effects
- Low operating cost
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With the unique X-ray Guide Tube the bench top XGT-5000 systems allow convenient access to X-ray fluorescence analysis with high spatial resolution – from 1.2 mm down to 10 µm. There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure. Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.
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Liquid nitrogen free energy dispersive X-ray fluorescence spectrometer :
- For RoHS compliance screening
- High resolution liquid nitrogen free Si (Li) semiconductor detector
- For regular X-ray fluorescence analysis of metals, rocks, soil, food, and plating thickness
- Speedy high sensitivity analysis
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The S4 PIONEER - the most compact wavelength dispersive X-ray fluorescence spectrometer (WDXRF) is dedicated to serve all applications with need for high performance and high sample throughput: Whenever reliable trace analysis, high analyzing speed for accurate process control or robustness for industrial use is demanded - the S4 PIONEER is the right choice for industry as well as for research and development.
Accuracy and Precision: The S4 PIONEER with advanced excitation technology provides highest sensitivity esp. for light elements and traces due to optimized beam geometry. Improved analytical performance for light elements is guaranteed with the very thin Beryllium tube window in combination with optimized excitation parameters. Up to 10 primary beam filters, up to 4 collimators, up to 8 crystals, there is no limitation in analytical flexibility; there is no compromise in analytical performance: Real high end wavelength dispersive X-ray fluorescence spectrometry (WDXRF).
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