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Gamma and X-ray HP(Ge) Spectrometer (Electrically cooled)
APPLICATION
The gamma%u2013ray Detection Device is based on a HPGe detector with Electric Machine Cooling which is intended for the conversion of Gamma-ray quantum energy using amplitude electric signals and their amplification for further registration with a nuclear physics apparatus. It was specifically developed for long, continuous operations.
FEATURES
- No liquid nitrogen necessary;
- Detection of radiation possible in any spatial orientation;
- Automatic restart after power supply switch-off;
- Long-duration continuous function;
- Coaxial or planar HP(Ge) detector can be used.
COMPLETE SET
- Detection device consisting of cryostat, HP(Ge) detector crystal, temperature sensor and heat exchanger;
- Gas compressor cooling system with built-in cryocontroller for the provision of automatic monitoring and control of operating modes for - HP(Ge) detector and cryosystem;
- High pressure gas pipes for connecting the cryosystem to the Detection Unit heat exchanger;
- Spectrometric device %u201CMultispectrum%u201D;
- Emulation and analysis Software.
For additional information, please contact us: sales@bruker-baltic.lv
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HP(Ge) Planar Detectors GPD (Liquid Nitrogen cooled)
APPLICATION
Gamma and X–ray HPGe detector is intended for the conversion of Gamma and X-ray quantum energy to proportional level. This is accomplished using amplitude electric signals and their amplification for further registration with a nuclear physics apparatus. It is also intended for use as the gamma and X-ray detection component of radiological monitoring for environmental objects in nuclear energetics, industrial production, agriculture, medicine, etc.
FEATURES
- Possibility of choosing a preamplifier type with a resistive or opto-electronic feedback high energy rate up to 15000 MeV/sec;
- Ability to increase the energy rate to 20000 MeV/sec radiation detection in any spatial orientation depending on cryostat modification manufacturing in a portable cryostat;
- Possibility of transportation and storage without cooling.
COMPLETE SET
- HP(Ge) coaxial detector (p-type);
- Preamplifier with cooling input stage;
- Cryostat;
- Spectrometric Device;
- Analysis Software;
- Dewar vessel.
For additional information, please contact us: sales@bruker-baltic.lv
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SiLi X-ray Spectrometers (SXRD)
APPLICATION
Detection of X-ray radiation in energy range from 1 keV to 60 keV.
FEATURES
- Possibility of choosing a preamplifier type with resistive or opto-electronic feedback;
- High energy resolution;
- High count rate - 500 MeV/sec and ability to increase it up to 1000 MeV/sec;
- Thin Be windows, possibility to install ultra-thin polyimide windows;
- Detection of radiation in any spatial orientation depending on cryostat modification;
- Manufacture in portable cryostat, cryostats for XRF analyzers and electron microscopes is possible.
COMPLETE SET
- X-Ray detection unit based on Si(Li) semiconductor detector (SXRD) designed for X-Ray detection;
- Preamplifier with cooling input stage;
- Cryostat;
- Dewar vessel.
COOLING
SiLi X-ray Spectrometers are available with liquid nitrogen cooling or with Peltier cooling when liquid nitrogen is inconvenient or impossible to use.
For additional information, please contact us: sales@bruker-baltic.lv
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- Electromechanical cooling
- Routine-maintenance free
- Small, lightweight, omnidirectional
cold head, may be positioned up to
50 ft from compressor.
- Transplantable "PopTop" capsule
technology allows user to "mix and
match" detectors and compressors.
- Operates 100/115/230 V ac at
50/60 Hz power
- Automatic restart after power failure
- CFC free
The EC-III Cryogenic Cooling option for HPGe detectors has been enhanced further. It now incorporates the
ORTEC patented1 "PopTop" transplantable detector capsule technology. This results in a highly flexible
solution to non-LN2 HPGe applications
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For x-ray spectroscopy with a nuclear accelerator, radioactive source, or x-ray tube
Premium performance spectroscopy from 1 keV to 30 keV
Superior resolution performance at low and high count rates
Multi-detector arrays available for use at fusion facilities
Thin Be window
High peak-to-background ratio
PopTop flexibility
Figure 25. Detection Efficiency vs. Be Window Thickness
on Low-Energy Curve and vs. Crystal Thickness on
High-Energy Curve
Figure 26. Array, Comprising Seven Tightly-Packed
6-mm-diam Si(Li) Detectors, Used at Synchrotron Light Source
Figure 27. Examples of Multiple Detector Arrays for Soft X-Ray
Spectroscopy. Note the three Be windows in each endcap.
Three Si(Li) detectors share a common cryostat in each of the
systems shown.
Figure 28. 6-mm Diameter SLP Detector Element
ORTEC SLP Series Lithium-Drifted Silicon X-Ray Detectors provide the spectroscopist with a highly sensitive, premium performance research tool for detecting x rays from a nuclear accelerator, radioactive source, or x-ray tube. The energy range of detection (Fig. 25) is from 30 keV down to 1 keV, depending on the thickness of the beryllium window.
The x-ray detector consists of a lithium-drifted silicon crystal and a cryogenically-cooled-FET, a high-gain, low-noise hybridized preamplifier in a PopTop capsule with a thin Be entrance window. The ORTEC Si(Li) detector crystal is manufactured under an exclusive process. Special techniques for lithium drifting result in a negligible detector element dead layer whose characteristics will not change even if the detector is stored at room temperature.
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Si(Li) detectors, which cover the energy range from a few hundred eV to 50 keV or so, are used in a wide variety of applications including x-ray fluorescence, x-ray microanalysis, PIXE, EXAFS, x-ray diffraction, and M%uFFFDssbauer.
The finest in semiconductor technology and cryogenics, combined with advanced signal processing electronics give CANBERRA Si(Li) detectors solid performance and reliability. Unlike early Si(Li) detectors and unlike those manufactured by some companies today, CANBERRA Si(Li) detectors are stable at room temperature so they can be shipped and stored without LN2.
CANBERRA Si(Li) detectors are available in two versions. The standard detector uses conventional geometry and a gold surface barrier entrance window. The Super Si(Li) uses a proprietary geometry and entrance window. This, along with a special shaping amplifier, improves resolution by at least 10 eV (FWHM) and increases the peak/background by about ten-fold to greater than 10,000:1.
CANBERRA offers a full complement of signal processing and data acquisition electronics. The detector includes a low-noise preamplifier of the pulsed-optical feedback type. This pre-amplifier employs a specially fabricated FET which is cooled along with the detector in a cryostat.
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Overview
The Quantera, PHI's second generation Scanning X-ray Microprobe provides the sensitivity and tools needed to apply XPS surface analysis to a broader range of current and future product development and failure analysis needs. High performance micro-area spectroscopy, XPS depth profiling, automated insulator analysis, and robotic sample handling define a new generation of XPS surface analysis equipment for today's laboratory.
Important features of the Quantera SXM include:
- Patented scanning x-ray microprobe design with <9um diameter minimum x-ray beam size
- Complete XPS capabilities (spectroscopy, depth profiling, mapping, etc.) at all x-ray beam sizes
- Highest performance XPS instrument for thin film depth profiling
- Optional C60 sputter ion gun for organic / polymer depth profiling
- Automated effortless analysis of electrically insulating samples
- Accurate quantitative analysis
- Robotic sample handling
- A completely automated, easy to use instrument platform
Micro area spectroscopy and high performance thin film analysis capabilities open new areas of application for XPS surface analysis in all environments. The complete automation of the system makes it easy to use and increases the reproducibility of routine measurements. Large sample platens make it possible to analyze “real world” large samples or multiple small samples automatically. A new generation of XPS surface analysis instruments are available today from PHI.
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Theta Probe - High Performance ARXPS Spectrometer
Thermo's Theta Probe combines advanced monochromator and lens and detector technology to provide rapid, precise analysis. With the revolutionary ARXPS capability to provide angular data simultaneously without tilting the sample
Product Detail
High-performance XPS, Small Area XPS (SAXPS) and Unique Angle Resolved XPS (ARXPS) capabilitySmall Area XPS with the Microfocus Monochromator for maximum sensitivity Sample Alignment is fast and accurate using the advanced optical system Elemental and chemical state mapping of surface features 70mm x 70mm sample stage for high throughput and sample thicknesses up to 25mm Automation for unattended operation Avantage Windows NT based data system
The Theta Probe instrument combine advanced monochromator, lens and detector technology with the Avantage data system (Windows NT) to provide rapid, precise analysis.
Developed from the highly successful Sigma Probe, Theta Probe's revolutionary ARXPS capability provides angular data simultaneously collected without tilting the sample.
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The JPS-9200 is a newly developed X-ray Photoelectron Spectrometer system used for micro-area surface analysis of a broad range of samples. The new hemispherical electron analyzer incorporates a combination of an electrostatic accelerating lens and magnetic field lens to improve sensitivity 20 times that of previous models. Both monochromatic and non-monochromatic x-ray sources are provided as standard. The minimum x-ray spot size is 30 microns. The ability to map very large areas (50mm x 18mm) is achieved with stage mapping. Using the Total Reflected XPS (TRXPS) mode backgrounds are significantly reduced thus improving the minimum detectability limit. The sample stage provides full automation for smooth and precise positioning.
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The NanoESCA offers up to 10 times better XPS image resolution, faster acquisition times, small spot spectroscopy with excellent energy resolution, and overview images with 100 times better resolution than presently commercially available instrumentation. For its revolutionary design the NanoESCA received the 2007 R&D 100 award (www.rdmag.com).
Significant technical development often requires thinking out of the box. Lateral resolution of conventional technologies for imaging XPS, be it scanning an x-ray beam or using magnetic lenses, has been stuck for many years at sub 10 µm. It was all too apparent that tweaking these technologies would not be sufficient to reach the resolution required for nanotechnology. This barrier is breached by the new, patent-protected (EP 1559126 US 7,250,599) NanoESCA. The design includes a non-magnetic, electrostatic PEEM lens and a double-pass hemispherical analyser. Rapid PEEM survey imaging (< 50 nm resolution) can be used to locate features, whilst its lateral resolution in imaging ESCA of 650 nm in the laboratory and 150 nm at the Synchrotron are simply unique.
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