Memory device test system
T5385/T5385ES ADVANTEST Test and Measurement

ADVANTEST's new T5385 memory test system for DRAM wafer test delivers an unrivaled 768-DUT parallel test capacity and 533 Mbps capability for increased throughput and lowered cost of test. Ideal for high-volume wafer fabs, the new tester is equipped with a flexible pin configuration that supports diverse DRAM devices, allowing tester pin resources to be optimally allocated for efficiency, reduced touchdowns and improved throughput. Achieving improved efficiency per device while scaling even higher in parallelism, the T5385 also delivers Known Good Die (KGD) for consumer devices, to greatly improve yields for LPDDR2 and DDR3 multi-die and stacked devices.
High-Throughput and Low Test Costs Achieved
DRAM memory chips used in today's computers and other electronics deliver faster processing speeds, higher data storage volumes, and more efficient power consumption than previous generation devices. To enable these gains, the semiconductor industry is aggressively migrating to smaller process nodes that allow more chips and greater densities to be produced from each wafer. Throughput has therefore become a critical issue in DRAM wafer test, with chipmakers demanding significant gains to increase productivity. ADVANTEST's new T5385 delivers an unrivaled parallel test capability and flexible pin configurations that significantly improve throughput in the wafer test process.