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Wafer inspection machine
AltaSight 300 Altatech Semiconductor

  • wafer inspection machine AltaSight 300 Altatech Semiconductor
AltaSight 300 combines Altatech's inspection technologies in order to characterize the whole substrate surface, at 100 wafers per hour.

AltaSight 300 can also be configured according to specific applications.
Macro inspection

* Large defects 20 to 60µm range
* Frontside, backside, edge
* Fully automated
* ADC

Advanced macro inspection

* Resolution in 1 to 5µm range
* Frontside, backside, edge
* Fully automated
* ADC

More specifications...



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standListOtherProduct www di En 2012-05-20-19