Industrial camera iKon-M SO

digitaldetectionX-ray

Andor’s USB 2.0 ikon-M SO series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface. • Open front end • Peak QE of 95% • 13 x 13 μm pixel size • TE cooling to -100°C • Ultra-low noise readout Andor’s iKon series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features high resolution 1 and 4.2 Megapixel large area sensor options (with 13 and 13.5 μm pixels respectively) for simultaneous high dynamic range and high spatial resolution imaging in the VUV and soft x-ray range. A convenient 16-point, knife-edge sealed 6” rotatable CF-152 flange provides a robust and highlyeffective seal to any compatible vacuum chamber interface. The iKon-M and -L also offer a USB2 interface and Labview or EPICS compatibility for seamless integration into complex setups. Overview Andor’s iKon series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features high resolution 1 and 4.2 Megapixel large area sensor options (with 13 and 13.5 μm pixels respectively) for simultaneous high dynamic range and high spatial resolution imaging in the VUV and soft x-ray range.