scanning probe microscope / for research / multipurpose / 3D
AA5000 - AFM, MFM, EFM Angstrom Advanced

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Characteristics

  • Type:

    scanning probe

  • Technical applications:

    for research

  • Other characteristics:

    multipurpose, 3D, real-time

  • Resolution:

    0.26, 0.13

Description

Angstrom's AA5000 scanning probe microscope provides images of an atomic scale going up to 100 micrometer. It has STM, AFM, LFM conductive AFM, MFM, EFM, environmental control SPM and nano-processing techniques. With its digital signal processor TMS320C642, AA5000 it is also able to handle multi-functional and complicated tasks with ease and efficiently. SPM/DNA's real-time operating system has been embedded in the AA5000 SPM system. It can be in a contacting mode, tapping mode, phase imaging or even lifting mode. The SPM can be in liquid. A force analysis can be done just by studying I-V curve, I-Z curve, force curve and amplitude curve. A simple change of the tip holder can help switch between STM and AFM. The other features include complete digital control and also an automatic system status recognition.