Features: Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM; Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; SPM can be in liquid; Real-time temperature and humidity detecting; Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve; Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode; Fast automatically tip-engaging Simply change the tip holder to switch between STM and AFM; Full digital control, auto system status recognition; Adjustable lightening inside With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved; Controller and Computer connected through a 10M/100M Fast Ethernet; Large sample size: up to diameter 45mm, 30mm thick; Online Control Software and offline Image Processing Software for Windows; Trace-Retrace scan, Back-Forward scan; Online real-time 3D image; Automatically Brightness and Contrast refresh; Data can be loaded out for further analysis; Nano-Movie function: Continuous data collection, storage and replay; Multi-Analysis: Granularity and Roughness; Tip Estimation and Image Re-construction; Modularized design for convenience of maintenance and future upgrade; Second display monitor and optical microscope system attachable;