The SAXSess from Anton Paar is an instrument for structural characterization in the nanometer range.
Using the benefits of modern focusing multilayer optics (Max-Flux™ Optics from Osmic Inc.), the SAXSess reaches an intensity gain that is about 20 times larger compared to the traditional Kratky system. This makes Small-Angle X-ray Scattering (SAXS) measurements extremely fast.
