Atomic force microscope (AFM)
MFP-3D™ Asylum Research

The MFP-3D™ Stand Alone (MFP-3D-SA) AFM allows scientists to choose a sensitive and precise AFM with the lowest noise performance that also includes a complete scientific software environment. Advanced imaging modes such as nanolithography and Dual AC Mode are built-in. The MFP-3D-SA™ is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements. The MFP-3D has the flexibility to acquire your data, analyze it, and even make publication-ready graphics. The MFP-3D's technical innovations include:
1. Sensored, closed loop positioning for high resolution imaging, accuracy, and reproducibility.
2. Pioneering all-digital controller for open software adaptability, power and flexibility.
3. Built-in advanced features such as real-time 3D rendering, nanolithography/nanomanipulation, and Dual AC™ Mode for dual-resonance and harmonic imaging.
4. Designed for flexibility and expandability, with a wide range of available system, environmental and application options to enhance capabilities, including nanoindentation and Piezoresponse Force Microscopy (PFM), and thermal analysis.

See http://www.asylumresearch.com/Products/Mfp3DSA/Mfp3DSA.shtml for more information