Magnetic force microscope attoMFM Ixs
attocube systems AG
The attoMFM Ixs is an ultra-compact magnetic force microscope designed particularly for applications at low and ultra low temperature. On the basis of a conventional atomic force microscope, the instrument works by scanning the sample below a fixed magnetic cantilever. The magnetic force gradient acting on the tip is then determined by measuring the change in resonance frequency (FM mode) or phase of the cantilever (AM mode) with highest precision using a fiber-based optical interferometer. Both measurement modes are applied at a certain tip-sample distance, typically around 10 - 100 nm. In FM mode, a phase-locked loop (PLL) is used to excite the cantilever at resonance.
