Piezo scanner for AFM, SPM microscopy, sub-nm linearity attocube systems AG

This piezo-electric scanner allows for high precision z-scanning over a large scan range, even at low temperatures.
- Environments:LT; UHV; magnetic field
- Motion:linear scanning
- Scan Range: 4.3 µm
- Resolution: sub nm
- Size: 15 x 15 x 6 mm
- Load: 50g

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