Attocube systems AG

Piezo scanner for AFM, SPM microscopy, sub-nm linearity
Scan Range: 4.3 µm | ANSz50 attocube systems AG

  • piezo scanner for AFM, SPM microscopy, sub-nm linearity Scan Range: 4.3 µm | ANSz50 attocube systems AG
This piezo-electric scanner allows for high precision z-scanning over a large scan range, even at low temperatures.
- Environments:LT; UHV; magnetic field
- Motion:linear scanning
- Scan Range: 4.3 µm
- Resolution: sub nm
- Size: 15 x 15 x 6 mm
- Load: 50g



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