Reflectance and thickness measurement systems for laboratory applications
ETA-SST is a system for measurement of spectral reflectance and layer thickness. Its small size and easy-to-use operating software make this system an excellent choice for laboratory applications and small-scale quality control procedures.
Thickness ragnge:
model 380-1050: 0.1 - 20 µm
model 850-1700: 1 - 30 µm
