Secondary ion mass spectrometer (SIMS)
IMS 1280
CAMECA
Ultra High Sensitivity Magnetic Sector SIMS
Used in geosciences, optimized for in-situ, localized trace element and isotope analysis of minerals with high sensitivity and sub-permil external repro-ducibility. The increased instrument size and optimized optics ensure full transmission at the high mass resolution required to remove the numerous mass interferences present in geologic materials. Five moveable detectors (Electron Multipliers or Faraday Cups) allow the instrument to perform fast, high precision isotope ratio analyses from lithium to uranium, in a multi-collection mode.
The IMS 1280 is the state-of-the-art instrument for stable isotope, U-Pb geochronology, trace element and nuclear particle analyses.
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