Variable pressure analytical field emission scanning electron microscope (VP FE-SEM)
ΣIGMA
Carl Zeiss Nano Technology Systems
The SIGMA, featuring GEMINI® technology provides outstanding imaging and analytical results from a field emission microscope.
The SIGMA is now available with variable pressure (VP) technology for exceptional imaging and analysis of non-conductive specimen. It is compatible with a wealth of accessories including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior materials contrast and SE imaging in VP.
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