Field emission scanning electron microscope (FE-SEM) Carl Zeiss SMT Nano Technology Systems Division
ΣIGMA

SIGMA – Advanced Analytical Microscopy - Now available with VP Technology

The SIGMA, featuring GEMINI® technology provides outstanding imaging and analytical results from a field emission microscope.

The SIGMA is now available with variable pressure (VP) technology for exceptional imaging and analysis of non-conductive specimen. It is compatible with a wealth of accessories including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior materials contrast and SE imaging in VP.

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