Field emission scanning electron microscope (FE-SEM) Carl Zeiss SMT
SUPRA

With the SUPRA%u2122 range ZEISS has brought the most versatile FESEM to the market for applications in R&D, failure analysis or quality assurance. Ultra high resolution with superb image quality, easy change of operating voltage, excellent probe current stability, fully analytical specimen chambers and easy operation through the Windows® XP based SmartSEM%u2122 control software are just a few of the out-standing features of this leading edge technology range of instruments. The SUPRA%u2122 FESEMs with the unique GEMINI® column provide quick, reproducible and reliable results. The proprietary VP technology with the enhanced VPSE detector enables superb imaging and analytical results for non-conducting specimens.

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